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Speckle pattern interferometer

  • US 4,018,531 A
  • Filed: 03/03/1975
  • Issued: 04/19/1977
  • Est. Priority Date: 03/05/1974
  • Status: Expired due to Term
First Claim
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1. An interferometer comprising:

  • a planar mirror having a small aperture formed therein;

    an optical imaging system disposed optically between an object location and an image location with said mirror disposed in the optical path between said imaging system and said image location, whereby light scattered from a surface disposed at said object location will be imaged by said imaging system at said image location after reflection at said mirror;

    means for producing from a beam of coherent light directed into the interferometer separate object and reference beams;

    means for directing said object beam to said object location to illuminate any surface disposed at said object location; and

    means for directing said reference beam to said image location, including means for shaping said reference beam so that it will diverge to said image location through said small aperture from an effective point source located behind said mirror at a position such that at any point of said image location the maximum angle between a ray of said reference beam and a ray of said imaged scattered light will be not greater than the maximum angle between different rays of said imaged scattered light.

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