Impact impulse measuring device

• US 4,023,396 A
• Filed: 12/15/1975
• Issued: 05/17/1977
• Est. Priority Date: 12/19/1974
• Status: Expired due to Term

• Current Assignee: Alexandr Sergeevich Yakshin, Dmitry Alexeevich Grechinsky, Oleg Nikolaevich Novikov, Viktor Alexandrovich Klochko, Viktor Georgievich Rygalin
• Original Assignee: Alexandr Sergeevich Yakshin, Dmitry Alexeevich Grechinsky, Oleg Nikolaevich Novikov, Viktor Alexandrovich Klochko, Viktor Georgievich Rygalin
• Inventors: Yakshin, Alexandr Sergeevich, Novikov, Oleg Nikolaevich, Klochko, Viktor Alexandrovich, Grechinsky, Dmitry Alexeevich, Rygalin, Viktor Georgievich
• Primary Examiner(s): Gill, James J.
• Application Number:
  US05/640,451
• Time in Patent Office: 519 Days
• Field of Search: 73/12, 73/71.2, 73/71.4, 73/492, 324/99 D, 324/103 P, 235/151.3, 235/15.31
• US Class Current: 73/12.01
• CPC Class Codes: G01P 15/00 Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
• CPC Class Codes: G01R 19/04 Measuring peak values or amplitude or envelope of ac or of pulses
• CPC Class Codes: G01R 29/02 Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration

Abstract

An impact impulse measuring device comprises, in accordance with the invention, an acceleration pick-up which transforms a mechanical shock into electric signals and is connected via an amplification unit to a unit for measuring the peak value of an impact impulse. The impact impulse measuring device also includes a noise rejector comprising a counting decade connected to the output of the unit for measuring the peak value of an impact impulse, a commutator coupled to outputs of the decade, an AND NOT gate, a flip-flop and an AND gate. The outputs of the commutator are connected via the AND NOT gate to an adjusting input of the flip-flop and its output is coupled with the AND gate. Eight levels of noise protection can be set with the help of commutator contacts. The proposed impact impulse measuring device increases the accuracy of measuring the peak value of the impact impulse by eliminating noise pulses from the measuring process, increases the quality of results obtained in shock tests and reduces the expenses of such tests.

Claims

1. An impact impulse measuring device comprising:

a. an acceleration pick-up for transforming a mechanical shock into electrical signals having an output;

b. an amplification unit having an input and an output, said input of said amplification unit being connected to said output of said acceleration pick-up;

c. a unit for measuring the peak value of an impact impulse having an input and outputs, said input of said unit for measuring the peak value of an impact impulse being connected to the output of the amplification unit;

d. a noise rejector electrically connected to said unit for measuring the peak value of an impact impulse and having information inputs and an adjustment input;

e. a counting decade of said noise rejector having an input and outputs, said input of said counting decade is said adjustment input of said noise rejector and is connected to one of said outputs of said unit for measuring the peak value of an impact impulse;

f. a commutator of said noise rejector having inputs and outputs, said inputs of said commutator are connected to said outputs of said counting decade;

g. an AND NOT gate of said noise rejector having inputs and outputs, said inputs of said AND NOT gate are connected to said outputs of said commutator;

h. a flip-flop of said noise rejector having an adjustment input and an output, said adjustment input of said flip-flop being connected to said output of said AND NOT gate;

i. an AND gate of said noise rejector having inputs and an output, one of said inputs of said AND gate being connected to said output of said flip-flop;

j. a transcription line of said noise rejector, another of said inputs of said AND gate being connected to said transcription line;

k. memory registers of said noise rejector having information inputs, an adjustment input and outputs, said adjustment input of said memory registers being connected to said output of said AND element, said information inputs of said memory registers being connected to said outputs of the unit for measuring the peak value of an input impulse which are not connected to said counting decade; and

l. an indicator connected to said outputs of said memory registers.

2. The impact impulse measuring device according to claim 1, wherein said unit for measuring the peak value of an impact impulse includes a fine comparator having an input connected to said output of said amplification unit;

a coarse comparator having an input connected to said output of said amplification unit;

said input of said fine comparator and of said coarse comparator is said input of said unit for measuring the peak value of an impact impulse;

a count pulse having inputs connected to an output of said fine comparator and of said coarse comparator;

a low order decade counter having its input connected to an output of said count pulse shaper;

a high order decade counter having its input connected to an OR gate, said OR gate having its inputs connected to an output of said low order decade counter and to another output of said count pulse shaper, said input of said high order decade counter is said output of said unit for measuring the peak value of an impact impulse which is connected to said input of said counting decade of said noise rejector;

outputs of said high order decade counter and of said low order decade counter are said outputs of said unit for measuring the peak value of an impact impulse which are connected to said information inputs of said memory registers of said noise rejector;

a decoder having its inputs connected to another output of said high order decade counter and of said low order decade counter and having its output connected to another input of said fine comparator and of said coarse comparator.

3. The impact impulse measuring device according to claim 1, wherein said counting decade of said noise rejector includes a plurality of flip-flops and a plurality of AND gates.

4. The impact impulse measuring device according to claim 1, wherein said memory registers of said noise rejector include flip-flops.

5. The impact impulse measuring device according to claim 4, wherein said indicator includes a high or a low order for each of said memory registers, each of said high or low orders having a plurality of AND NOT gates, a plurality of transistors, a resistor and an indicator lamp with load resistors.