Automated integrated circuit manufacturing system

• US 4,027,246 A
• Filed: 03/26/1976
• Issued: 05/31/1977
• Est. Priority Date: 03/26/1976
• Status: Expired due to Term

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Druschel, William Otto, Castrucci, Paul Philip, Caccoma, George Anthony
• Primary Examiner(s): Gruber, Felix D.
• Application Number:
  US05/670,596
• Time in Patent Office: 431 Days
• Field of Search: 235/151, 235/151.1, 444/1, 340/172.5, 29/430, 29/208 C, 29/569, 29/563, 198/19, 302/2 R
• US Class Current: 700/121
• CPC Class Codes: G05B 19/4183 characterised by data acquisition, e.g. workpiece identification
• CPC Class Codes: G05B 2219/31268 Central workpiece storage, convey workpiece, work pallet, holder to workcell
• CPC Class Codes: G05B 2219/36523 Select with code on workpiece, fixture, clamp, object
• CPC Class Codes: G05B 2219/45026 Circuit board, pcb
• CPC Class Codes: G05B 2219/49302 Part, workpiece, code, tool identification
• CPC Class Codes: Y02P 90/02 Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
• CPC Class Codes: Y10T 29/49829 Advancing work to successive stations [i.e., assembly line]
• CPC Class Codes: Y10T 29/5124 with means to feed work intermittently from one tool station to another

Abstract

A computer controlled manufacturing system employing random access semiconductor wafer storage in the fabrication of integrated circuit devices.

A computer controlled manufacturing system for fabricating semiconductor wafers into large scale integrated circuit devices and wherein each semiconductor wafer has scored, or recorded thereon, distinct identifying indicia, such as a machine readable serial number. A plurality of concurrently operable semiconductor wafer processing stations are independently computer controlled. Each of the stations performing at least one discrete fabrication step. The manufacturing system including random access wafer storage means having n storage cells, each of said storage cells being adapted to store at least one semiconductor wafer, each of said n storage cells of said random access storage means being individually and randomly addressable under computer control to receive for storage in any predetermined one of said n storage cells a semiconductor wafer, or to provide from storage in any predetermined one of said n storage cells a semiconductor wafer. Reading means for reading the identifying indicia on said semiconductor wafers. Conveying means operative under computer control, said conveying means interconnecting said plurality of computer controlled concurrently operable semiconductor wafer processing stations, and said random access storage means, said conveying means being adapted to convey predetermined wafers to and from said random access storage means and selected ones of said processing stations. A digital computer system operable under stored program control means, said computer system being interconnected with and controlling said processing stations, said random access storage means, said reading means and said conveying means, whereby under computer control selected ones of said semiconductor wafers randomly stored in said random access storage means may be selected and fabricated into first part number large scale integrated circuit devices, and selected second ones of said semiconductor wafers randomly stored in said random access storage means may be selected and fabricated into second part number large scale integrated circuit devices, where said first and second part number devices are not identical.

Claims

1. A computer controlled manufacturing system for fabricating semiconductor wafers into large scale integrated circuit devices and wherein each semiconductor wafer has stored, or recorded thereon, distinct identifying indicia, such as a machine readable serial number, said system comprising:

a plurality of computer controlled concurrently operable semiconductor wafer processing stations, each of said stations being adapted to perform under computer control at least one discrete fabrication step;

random access storage means having n storage cells, each of said storage cells being adapted to store at least one semiconductor wafer, each of said n storage cells of said random access storage means being individually and randomly addressable under computer control to receive for storage in any predetermined one of said n storage cells a semiconductor wafer, or to provide from storage in any predetermined one of said n storage cells a semiconductor wafer;

reading means for reading the identifying indicia on said semiconductor wafers;

conveying means operative under computer control, said conveying means interconnecting said plurality of computer controlled concurrently operable semiconductor wafer processing stations, and said random access storage means, said conveying means being adapted to convey predetermined wafers to and from said random access storage means and selected ones of said processing stations;

and a digital computer system operable under stored program control means, said computer system being interconnected with and controlling said processing stations, said random access storage means, said reading means and said conveying means,

whereby under computer control selected ones of said semiconductor wafers randomly stored in said random access storage means may be selected and fabricated into first part number large scale integrated circuit devices, and selected second ones of said semiconductor wafers randomly stored in said random access storage means may be selected and fabricated into second part number large scale integrated circuit devices, where said first and second part number devices are not identical.

2. In a computer controlled manufacturing system for fabricating semiconductor wafers into large scale integrated circuit devices and wherein each semiconductor wafer has stored, or recorded thereon, distinct identifying indicia, such as a machine readable serial number, said system comprising:

a plurality of computer controlled concurrently independently operable semiconductor wafer processing sectors, each of said sectors being adapted to perform under computer control at least one discrete processing step;

Wafer Orderbook Mix buffer means for storing m semiconductor wafers where m is a positive integer greater than 10, said wafer orderbook mix buffer being addressable under computer control to provide from storage any predetermined one of said m semiconductor wafers,

whereby under computer control selected ones of said m semiconductor wafers stored in said wafer orderbook mix buffer means may be selected and fabricated into first part number large scale integrated circuit devices, and selected second ones of said semiconductor wafers stored in said wafer orderbook means may be selected and fabricated into second part number large scale integrated circuit devices, where said first and second part number devices are not identical.

3. A computer controlled Wafer Orderbook Mix buffer, said buffer comprising:

m storage cells, each of said m storage cells being adapted to store a single semiconductor wafer;

first means operable under computer control for conveying a semiconductor wafer from an input station to any predetermined one of said m storage cells;

and second means operable under computer control for conveying a semiconductor wafer from any predetermined one of said m storage cells to any other unoccupied one of said m storage cells, or to an output station, whereby said wafer orderbook mix buffer may be directed under computer program control to sort semiconductor wafers in accordance with one or more sort criteria, such as individual wafer test data.

4. A computer controlled wafer orderbook mix buffer as recited in claim 3, and wherein said buffer constitutes a real time operable sector in a multi-sectored computer controlled automated wafer fabricating system.

5. A computer controlled Wafer Orderbook Mix buffer as recited in claim 4 wherein said buffer includes at least one detachable portable multi-position wafer cartridge.

6. In a computer controlled manufacturing system for fabricating semiconductor wafers into large scale integrated circuit devices said system including:

random access storage means having n storage cells, each of said storage cells being adapted to store at least one semiconductor wafer, each of said n storage cells of said random access storage means being individually and randomly addressable under computer control to receive for storage in any predetermined one of said n storage cells a semiconductor wafer, or to provide from storage in any predetermined one of said n storage cells a semiconductor wafer,

whereby under computer control selected ones of said semiconductor wafers randomly stored in said random access storage means may be selected and fabricated into large scale integrated circuit devices of a first type and selected second ones of said semiconductor wafers randomly stored in said random access storage means may be selected and fabricated into large scale integrated circuit devices of a second type.

7. In a computer controlled manufacturing system for fabricating semiconductor wafers into large scale integrated circuit devices as recited in claim 6, wherein said random access storage means includes at least one detachable portable semiconductor wafer multi-position wafer cartridge.

8. In a computer controlled manufacturing system for fabricating semiconductor wafers into large scale integrated circuit devices as recited in claim 6 wherein under program control of said computer system said random access storage means may be employed to sort into two or more lots a plurality of semiconductor wafers.