Fault-tolerant cell addressable array

• US 4,047,163 A
• Filed: 07/03/1975
• Issued: 09/06/1977
• Est. Priority Date: 07/03/1975
• Status: Expired due to Term

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Choate, William Clay, Bhandarkar, Dileep P.
• Primary Examiner(s): Fears, Terrell W.
• Application Number:
  US05/592,979
• Time in Patent Office: 796 Days
• Field of Search: 340/173 R, 340/173 BB, 340/172.5
• US Class Current: 365/96
• CPC Class Codes: G11C 29/78 using programmable devices
• CPC Class Codes: H03K 19/003 Modifications for increasing the reliability for protection
• CPC Class Codes: H03K 19/17704 the logic functions being realised by the interconnection of rows and columns
• CPC Class Codes: H03K 19/17728 Reconfigurable logic blocks, e.g. lookup tables
• CPC Class Codes: H03K 19/1776 for memories
• CPC Class Codes: H03K 19/17764 for reliability
• CPC Class Codes: H03K 19/1778 Structural details for adapting physical parameters

Abstract

A small programmable memory means such as an electrically programmable logic array is incorporated on the chip of a conventional bit addressable random access memory or other cell addressable array circuit. The array has one or more superfluous rows and/or columns of cells held in reserve. Processing and testing of the chip is conducted in a conventional manner. Chips with faulty cells are corrected by programming the memory means with the cell addresses of the faulty cell locations. Subsequently, the memory means will respond to any of these addresses and, through interaction with input/output logic, cause the data input and/or output to be steered to or from a reserve cell instead of the addressed faulty cell.

Claims

1. A defect-tolerant cell addressable array comprising:

a. an array of functional cells arranged in rows and columns;

b. a plurality of redundant functional cells;

c. cell selection means responsive to cell address code signals for selectively addressing an individual functional cell in a respective row and column and simultaneously addressing a corresponding redundant cell;

d. memory means in which address codes of the row and column addresses of defective functional cells are selectively storable, said memory means being responsive to said cell address code signals for detecting when the cell address code signals correspond to the address codes of defective ones of said functional cells and for generating a signal indicative thereof; and

e. logic means responsive to the signal generated by said memory means for directing data into and/or out of the respectively addressed redundant cell instead of an addressed defective cell.

2. The defect-tolerant cell addressable array according to claim 1 wherein a redundant row and/or column of functional cells is provided.

3. The defect-tolerant cell addressable array according to claim 1 wherein said cell selection means selectively enables the addressed cells.

4. The defect-tolerant cell addressable array according to claim 1 wherein said cell selection means includes a row address decoder and a column address decoder.

5. The defect-tolerant cell addressable array according to claim 1 wherein said array, cell selection means, redundant functional cells, memory means and logic means are integrated as a monolithic semiconductor structure.

6. The defect-tolerant cell addressable array according to claim 5 wherein said memory means is programmable after said integrated monolithic semiconductor structure is fabricated.

7. The defect-tolerant cell addressable array according to claim 6 wherein said memory means is a field programmable logic array or read-only memory array.

8. The defect-tolerant cell addressable array according to claim 7 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.

9. The defect-tolerant cell addressable array according to claim 7 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.

10. The defect-tolerant cell addressable array according to claim 1 wherein said memory means is a field programmable memory means.

11. The defect-tolerant cell addressable array according to claim 10 wherein said memory means is electrically programmable.

12. The defect-tolerant cell addressable array according to claim 11 wherein said memory means is a field programmable logic array or read-only memory array.

13. The defect-tolerant cell addressable array according to claim 12 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.

14. The defect-tolerant cell addressable array according to claim 12 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.

15. The defect-tolerant cell addressable array according to claim 12 wherein said field programmable memory means is comprised of MNOS or FAMOS devices.

16. The defect-tolerant cell addressable array according to claim 10 wherein said memory means is mechanically programmable.

17. The defect-tolerant cell addressable array according to claim 16 wherein said memory means is programmable by the mechanical open-circuiting of selected bonded wires.

18. The defect-tolerant cell addressable array according to claim 16 wherein said memory means is programmed by the bonding of wires to selected terminals of said memory means.

19. The defect-tolerant cell addressable array according to claim 1 wherein said memory means is a content addressable memory.

20. The defect-tolerant cell addressable array according to claim 1 wherein said array is a random access memory array.

21. A defect-tolerant cell addressable array comprising:

a. an array of functional cells arranged in rows and columns;

b. at least one redundant row or column of functional cells;

c. cell selection means responsive to row and column address code signals for selectively addressing an individual cell in a respective row and column and for simultaneously addressing a corresponding cell in said at least one redundant row or column;

d. programmable or programmed memory means coupled to receive said row and column address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row and column address codes of one or more defective cells of said array of functional cells; and

e. logic means coupled to said memory means and responsive to the generated signal for selectively transferring data into and/or out of the addressed cell in said redundant row or column each time a defective cell is detected by said memory means and for otherwise selectively transferring data into and/or out of the addressed cell of said array.

22. The defect-tolerant cell addressable array according to claim 21 wherein said logic means includes means for inhibiting the transfer of data into or out of the addressed cell of said array each time a defective cell is detected by said memory means and for otherwise inhibiting data transfer into and/or out of the addressed cell in said redundant row or column.

23. The defect-tolerant cell addressable array according to claim 21 wherein a redundant row of cells is provided and wherein data is input to or output from the functional cell in such redundant row in the same column as the addressed defective cell which is selected by said cell selection means.

24. The defect-tolerant cell addressable array according to claim 21 wherein a redundant column of cells is provided and wherein data is input to or output from the functional cell in such redundant column in the same row as the addressed defective cell which is selected by said cell selection means.

25. The defect-tolerant cell addressable array according to claim 21 wherein a plurality of redundant rows or columns of cells are provided and wherein said memory means generates a signal for selecting one of said redundant rows or columns to or from which data is to be transferred instead of a defective cell.

26. The defect-tolerant cell addressable array according to claim 25 wherein a plurality of redundant rows of cells is provided and wherein data is input to or output from the functional cell in a selected redundant row in the same column as the addressed defective cell which is selected by said cell selection means.

27. The defect-tolerant cell addressable array according to claim 25 wherein a plurality of redundant columns of cells is provided and wherein data is input to or output from the functional cell in a selected redundant column in the same row as the addressed defective cell which is selected by said cell selection means.

28. The defect-tolerant cell addressable array according to claim 21 wherein said cell selection means selectively enables the addressed cells.

29. The defect-tolerant cell addressable array according to claim 21 wherein said cell selection means includes a row address decoder and a column address decoder.

30. The defect-tolerant cell addressable array according to claim 21 wherein said array, cell selection means, redundant functional cells, memory means and logic means are integrated as a monolithic semiconductor structure.

31. The defect-tolerant cell addressable array according to claim 30 wherein said memory means is programmable after said integrated monolithic semiconductor structure is fabricated.

32. The defect-tolerant cell addressable array according to claim 31 wherein said memory means is a field programmable logic array or read-only memory array.

33. The defect-tolerant cell addressable array according to claim 32 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.

34. The defect-tolerant cell addressable array according to claim 32 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.

35. The defect-tolerant cell addressable array according to claim 21 wherein said memory means is a field programmable memory means.

36. The defect-tolerant cell addressable array according to claim 35 wherein said memory means is electrically programmable.

37. The defect-tolerant cell addressable array according to claim 36 wherein said memory means is a field programmable logic array or read-only memory array.

38. The defect-tolerant cell addressable array according to claim 37 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.

39. The defect-tolerant cell addressable array according to claim 37 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.

40. The defect-tolerant cell addressable array according to claim 37 wherein said field programmable memory means is comprised of MNOS or FAMOS devices.

41. The defect-tolerant cell addressable array according to claim 35 wherein said memory means is mechanically programmable.

42. The defect-tolerant cell addressable array according to claim 41 wherein said memory means is programmable by the mechanical open-circuiting of selected bonded wires.

43. The defect-tolerant cell addressable array according to claim 41 wherein said memory means is programmed by the bonding of wires to selected terminals of said memory means.

44. The defect-tolerant cell addressable array according to claim 21 wherein said memory means is a content addressable memory.

45. The defect-tolerant cell addressable array according to claim 21 wherein said array is a random access memory array.

46. A system of defect-tolerant cell addressable arrays comprising:

a. a plurality of arrays of functional cells each being arranged in rows and columns;

b. at least one redundant row or column of functional cells associated with each of said arrays;

c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array and for simultaneously addressing a corresponding cell in the redundant row or column of such array;

d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and for generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and

e. logic means coupled to said memory means and responsive to the generated signal for selectively directing data into and/or out of the addressed cell of said arrays or said redundant row or column in dependence upon the signal generated by said memory means.

47. The system according to claim 46 wherein each of said arrays are integrated circuit modules.

48. The system according to claim 46 wherein said plurality of arrays are integrated as a monolithic semiconductor structure.

49. The system according to claim 48 wherein said cell selection means, memory means and logic means are integrated on the same structure.

50. A system of defect-tolerant cell addressable arrays comprising:

a. a plurality of arrays, including at least one redundant array, of functional cells each being arranged in rows and columns;

b. at least one redundant row or column of functional cells associated with each of said arrays;

c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array;

d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and for generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and

e. logic means coupled to said memory means and responsive to said generated signal for directing data into and/or out of a functional cell in said redundant array instead of the defective cell in the addressed array.

51. The system according to claim 50 wherein each of said arrays are integrated circuit modules.

52. The system according to claim 59 wherein said plurality of arrays are integrated as a monolithic semiconductor structure.

53. The system according to claim 52 wherein said cell selection means, memory means and logic means are integrated on the same structure.