Fault-tolerant cell addressable array

• US 4,051,354 A
• Filed: 07/03/1975
• Issued: 09/27/1977
• Est. Priority Date: 07/03/1975
• Status: Expired due to Term

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Choate, William Clay
• Primary Examiner(s): Atkinson, Charles E.
• Application Number:
  US05/593,090
• Time in Patent Office: 817 Days
• Field of Search: 235/153 AM, 340/173 BB, 340/173 R, 364/200, 364/900
• US Class Current: 714/711
• CPC Class Codes: G11C 29/808 using a flexible replacement scheme
• CPC Class Codes: H03K 19/003 Modifications for increasing the reliability for protection
• CPC Class Codes: H03K 19/17704 the logic functions being realised by the interconnection of rows and columns
• CPC Class Codes: H03K 19/17728 Reconfigurable logic blocks, e.g. lookup tables
• CPC Class Codes: H03K 19/17764 for reliability
• CPC Class Codes: H03K 19/1778 Structural details for adapting physical parameters

Abstract

A small programmable memory means such as an electrically programmable logic array is incorporated on the chip of a conventional bit addressable random access memory or other cell addressable array circuit. The array has one or more superfluous rows and/or columns of cells held in reserve. Processing and testing of the chip is conducted in a conventional manner. Chips with faulty cells are corrected by programming the memory means with the cell addresses of the faulty cell locations. Subsequently, the memory means will respond to any of these addresses and, through interaction with either the address decoding logic or input/output logic, cause a reserve cell or the contents thereof to be selected instead of the faulty cell.

Claims

1. A defect-tolerant cell addressable array comprising:

a. an array of functional cells arranged in rows and columns;

b. cell selection means responsive to cell address code signals for selectively addressing an individual functional cell in a respective row and column;

c. a plurality of redundant functional cells;

d. memory means in which cell address codes of defective functional cells indicative of row and column locations are selectively storable, said memory means being responsive to said cell address code signals for detecting when the cell address code signals correspond to the address codes of defective ones of said functional cells and for generating a signal indicative thereof; and

e. logic means responsive to the signal generated by said memory means for selecting a corresponding one of said redundant functional cells and for inhibiting the selection of the respective defective cell of said array.

2. The defect-tolerant cell addressable array according to claim 1 wherein a redundant row and/or column of functional cells is provided.

3. The defect-tolerant cell addressable array according to claim 1 wherein said cell selection means selectively enables addressed cells.

4. The defect-tolerant cell addressable array according to claim 1 wherein said cell selection means includes a row address decoder and a column address decoder.

5. The defect-tolerant cell addressable array according to claim 1 wherein said array, cell selection means, redundant functional cells, memory means and logic means are integrated as a monolithic semiconductor structure.

6. The defect-tolerant cell addressable array according to claim 5 wherein said memory means is programmable after said integrated monolithic semiconductor structure is fabricated.

7. The defect-tolerant cell addressable array according to claim 6 wherein said memory means is a field programmable logic array or read-only memory array.

8. The defect-tolerant cell addressable array according to claim 7 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.

10. The defect-tolerant cell addressable array according to claim 1 wherein said memory means is a field programmable memory means.

11. The defect-tolerant cell addressable array according to claim 10 wherein said memory means is electrically programmable.

12. The defect-tolerant cell addressable array according to claim 11 wherein said memory means is a field programmable logic array or read-only memory array.

13. The defect-tolerant cell addressable array according to claim 12 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.

14. The defect-tolerant cell addressable array according to claim 12 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.

15. The defect-tolerant cell addressable array according to claim 12 wherein said field programmable memory means is comprised of MNOS or FAMOS devices.

16. The defect-tolerant cell addressable array according to claim 10 wherein said memory means is mechanically programmable.

17. The defect-tolerant cell addressable array according to claim 16 wherein said memory means is programmable by the mechanical open-circuiting of selected bonded wires.

18. The defect-tolerant cell addressable array according to claim 16 wherein said memory means is programmed by the bonding of wires to selected terminals of said memory means.

19. The defect-tolerant cell addressable array according to claim 1 wherein said memory means is a constant addressable memory.

20. The defect-tolerant cell addressable array according to claim 1 wherein said array is a random access memory array.

9. The defect-tolerant cell addressable array according to claim 67 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.

21. A defect-tolerant cell addressable array comprising:

a. an array of functional cells arranged in rows and columns;

b. cell selection means responsive to row and column address code signals for selectively addressing an individual functional cell in a respective row and column;

c. at least one redundant row or column of functional cells;

d. programmable or programmed memory means coupled to receive said row and column address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row and column address codes of one or more defective cells of said array of functional cells; and

e. logic means coupled to said memory means and responsive to the generated signal for selecting a corresponding functional cell in said redundant row or column each time a defective cell is detected by said memory means and for inhibiting the selection of the addressed defective cell.

22. The defective-tolerant cell addressable array according to claim 21 wherein a redundant row of cells is provided and wherein the functional cell in such redundant row in the same column as the addressed defective cell is selected by said cell selection means.

23. The defect-tolerant cell addressable array according to claim 21 wherein a redundant column of cells is provided and wherein the functional cell in such redundant column in the same row as the addressed defective cell is selected by said cell selection means.

24. The defect-tolerant cell addressable array according to claim 21 wherein a plurality of redundant rows or columns of cells are provided and wherein said memory means generates a signal for selecting one of said redundant rows or columns from which a corresponding redundant functional cell is to replace said defective cell.

25. The defect-tolerant cell addressable array according to claim 24 wherein a plurality of redundant rows of cells is provided and wherein the functional cell in a selected redundant row in the same column as the addressed defective cell is selected by said cell selection means.

26. The defect-tolerant cell addressable array according to claim 24 wherein a plurality of redundant columns of cells is provided and wherein the functional cell in a selected redundant column in the same row as the addressed defective cell is selected by said cell selection means.

27. The defect-tolerant cell addressable array according to claim 21 wherein at least one redundant row and one redundant column of cells are provided and wherein said memory means generates a signal for selecting the one of said redundant rows or said redundant columns from which a corresponding redundant functional cell is to replace said defective cell.

28. The defect-tolerant cell addressable array according to claim 27 wherein said memory means generates a signal for selecting a cell that is both in a redundant row and a redundant column to replace a defective cell in said array or a defective cell in one of said redundant rows or columns.

29. The defect-tolerant cell addressable array according to claim 27 wherein the functional cell in said at least one redundant row in the same column as an addressed defective cell is selected by said cell selection means when said at least one redundant row is selected by said memory means and wherein said at least one redundant column in the same row as an addressed defective cell is selected by said cell selection means when said at least one redundant column is selected by said memory means.

30. The defect-tolerant cell addressable array according to claim 21 wherein a plurality of redundant rows and at least one redundant column or a plurality of redundant columns and at least one redundant row are provided and wherein said memory means generates a signal for selecting the one of said redundant columns or rows from which a corresponding redundant cell is to replace a defective cell.

31. The defect-tolerant cell addressable array according to claim 30 wherein said memory means generates a signal which selects a cell that is both in a redundant row and a redundant column to replace a defective cell in said array or in one of said redundant rows or columns.

32. The defect-tolerant cell addressable array according to claim 21 wherein said cell selection means selectively enables addressed cells.

33. The defect-tolerant cell addressable array according to claim 21 wherein said cell selection means includes a row address decoder and a column address decoder.

34. The defect-tolerant cell addressable array according to claim 21 wherein said array, cell selection means, redundant functional cells, memory means and logic means are integrated as a monolithic semiconductor structure.

35. The defect-tolerant cell addressable array according to claim 34 wherein said memory means is programmable after said integrated monolithic semiconductor structure is fabricated.

36. The defect-tolerant cell addressable array according to claim 35 wherein said memory means is a field programmable logic array or read-only memory array.

37. The defect-tolerant cell addressable array according to claim 36 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.

38. The defect-tolerant cell addressable array according to claim 36 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.

39. The defect-tolerant cell addressable array according to claim 21 wherein said memory means is a field programmable memory means.

40. The defect-tolerant cell addressable array according to claim 39 wherein said memory means is electrically programmable.

41. The defect-tolerant cell addressable array according to claim 40 wherein said memory means is a field programmable logic array or read-only memory array.

42. The defect-tolerant cell addressable array according to claim 41 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.

43. The defect-tolerant cell addressable array according to claim 41 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.

44. The defect-tolerant cell addressable array according to claim 41 wherein said field programmable memory means is comprised of MNOS or FAMOS devices.

45. The defect-tolerant cell addressable array according to claim 39 wherein said memory means is mechanically programmable.

46. The defect-tolerant cell addressable array according to claim 45 wherein said memory means if programmable by the mechanical open-circuiting of selected bonded wires.

47. The defect-tolerant cell addressable array according to claim 45 wherein said memory means is programmed by the bonding of wires to selected terminals of said memory means.

48. The detect-tolerant cell addressable array according to claim 21 wherein said memory means is a content addressable memory.

49. The defect-tolerant cell addressable array according to claim 21 wherein said array is a random access memory array.

50. A system of defect-tolerant cell addressable arrays comprising:

a. a plurality of arrays of functional cells each being arranged in rows and columns;

b. at least one redundant row or column of functional cells associated with each of said arrays;

c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array;

d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and

e. logic means coupled to said memory means and responsive to the generated signal for selecting a corresponding functional cell in the redundant row or column of said addressed array each time a defective cell is detected by said memory means and for inhibiting the selection of the addressed defective cell.

51. The system according to claim 50 including a redundant array of cells within said logic means selects a functional cell in said redundant array instead of the redundant row or column of the addressed array according to the signal generated by said memory means.

52. The system according to claim 50 wherein each of said arrays are integrated circuit modules.

53. The system according to claim 50 wherein said plurality of arrays are integrated as a monolithic semiconductor structure.

54. The system according to claim 53 wherein said cell selection means, memory means and logic means are integrated on the same structure.