Thickness measurement

• US 4,053,234 A
• Filed: 02/18/1975
• Issued: 10/11/1977
• Est. Priority Date: 02/18/1975
• Status: Expired due to Term

• Current Assignee: United Biscuits US Incorporated (Kellogg Company)
• Original Assignee: United Biscuits Limited (United Biscuits (Holdings) Ltd.)
• Inventors: McFarlane, Ian Duncan
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US05/550,170
• Time in Patent Office: 966 Days
• Field of Search: 356/156, 356/157, 356/199, 356/200, 356/209, 250/577, 250/561
• US Class Current: 356/631
• CPC Class Codes: B65H 2553/414 involving receptor receiving light reflected by a reflecting surface and emitted by a separate emitter
• CPC Class Codes: G01B 11/0608 Height gauges

Abstract

For detecting changes of level of a moving surface, a sharply defined light pattern is directed on to the surface and an image of the pattern is formed on a multiple photodiode strip so that a predetermined point of reference of the image is variably located on the strip depending on variation in level of the surface, the photodiode strip is repetitively scanned to create a voltage waveform repetitively defining the variable position of the point of reference on the image in relation to the fixed position of a point of reference on the photodiode strip, and the waveform is analysed to determine the variations in level of the moving surface.

Claims

1. In an apparatus for use in measuring the position of a surface in a direction normal to said surface, as said position is related to a datum, wherein a beam of light is projected onto said surface along a first axis with the light reflecting from said surface along a second axis, said axes being in a common plane, the improvement comprising:

a photodiode strip comprising a plurality of photodiodes positioned sequentially along a line, said strip being positioned transverse to said second axis with said line in said plane, whereby a change in the position of said surface in said direction will cause said second axis to move along said line with the result of a change in which of the photodiodes are illuminated by the reflected light; and

means connected to said photodiode strip for determining which photodiodes are illuminated to a predetermined degree, said means being arranged to repetitively scan the strip in a given direction to determine the voltage output of each diode in sequence along said line to thereby create a composite voltage signal which is a composite, as related to time, of the voltage output of each photodiode, as related to the direction of scan said beam having a leading edge and a trailing edge, said means connected to said photodiode strip producing a square wave initiated by that part (TA) of the composite voltage signal corresponding to the voltage output of the first diode to be illuminated to said degree and terminated (at TS) by the termination of said scan, the width of said beam between said leading edge and said trailing edge being sufficient to simultaneously illuminate a plurality of said diodes, said means determining which of the diodes, with respect to the direction of scan, is the first to be illuminated to said predetermined degree thereby determining the position of the reflected beam along said line, said means producing a sensible indication of the position of the reflected beam along said line calibrated in terms of the dimension between the part of said one surface at which the axes converge and said datum, said sensible indication being related to the time difference between said signals TA and TS.

2. In an apparatus as set forth in claim 1 and used for measuring the dimension between two surfaces of an object, one of which surfaces is the surface previously referred to, the further improvement comprising:

means for engaging and positioning the other of said surfaces at a given location thereby establishing said datum.

3. In an apparatus as set forth in claim 1, wherein said width is of such a magnitude that said trailing edge is always on said strip.

4. In an apparatus as set forth in claim 1, wherein said width is of such a magnitude that with some positions of the surface said beam is wholly on said strip.

5. In an apparatus as set forth in claim 4, including a second beam also having a leading edge and a trailing edge positioned in said given direction from said strip and with some positions of the surface being wholly on said strip, said means connected to said strip producing, in addition to said first mentioned square wave, three additional square waves each being initiated by a part of said magnitude of said voltage signal occurring by reason of a respective edge subsequent to the first mentioned leading edge and terminated (at TS) by the termination of said scan, said subsequent square wave initiation points being

Tb -- the trailing edge of the first beam

Tc -- the leading edge of the second beam

Td -- the trailing edge of the second beam

said means having an output corresponding to the time differences in accordance with

6. In an apparatus as set forth in claim 1, wherein the beam has a length transverse to said width greater than the dimension in the corresponding direction of the photodiodes of said strip and is positioned so that the photodiodes are intermediate the ends of said length whereby irregularities in said surface will not result in the beam moving transversely even partially off the photodiodes in a direction transverse to said line.

7. In an apparatus for use in measuring the position of a surface in a direction normal to said surface, as said position is related to a datum, wherein a beam of light is projected onto said surface along a first axis with the light reflecting from said surface along a second axis, said axes being in a common plane, said apparatus utilizing a device for forming said beam of light, the improvement comprising:

a photodiode strip comprising a plurality of photodiodes positioned sequentially along a line, said strip being positioned transverse to said second axis with said line in said plane, whereby a change in the position of said surface in said direction will cause said second axis to move along said line with the result of a change in which of the photodiodes are illuminated by the reflected light;

said device being constructed and arranged so that during the course of measuring said surface position the beam of light is wholly within the limits of the length of said strip; and

means connected to said photodiode strip for determining which diodes are illuminated to a predetermined degree, thereby indicating the position of said surface with respect to said datum, said means repetitively scanning the strip in a given direction to determine the voltage output of each diode in sequence along said line to thereby create a composite voltage signal which is a composite, as related to time, of the voltage output of each photodiode, as related to the direction of scan said beam having a leading edge and a trailing edge falling within said limits of length, the width of said beam between said leading edge and said trailing edge being sufficient to simultaneously illuminate a plurality of said diodes, said means determining which of the diodes are illuminated to said predetermined degree, determining the median of the diodes illuminated to said degree, and relating said median to a point of reference along the length of the line thereby determining the position of the reflected beam along said line, said means producing a sensible indication of the position of the reflected beam along said line calibrated in terms of the dimension between the part of said one surface at which the axes converge and said datum.