Gamma camera system with composite solid state detector

• US 4,055,765 A
• Filed: 04/27/1976
• Issued: 10/25/1977
• Est. Priority Date: 04/27/1976
• Status: Expired due to Term

• Current Assignee: Ohio State University
• Original Assignee: Ohio State University
• Inventors: Miller, Don W., Gerber, Mark S.
• Primary Examiner(s): Willis, Davis L.
• Application Number:
  US05/680,755
• Time in Patent Office: 546 Days
• Field of Search: 250/363 S, 250/370, 250/385
• US Class Current: 250/370.09
• CPC Class Codes: A61B 6/4258 for detecting non x-ray radiation, e.g. gamma radiation A61B6/037 takes precedence
• CPC Class Codes: G01T 1/1642 using a scintillation crystal and position sensing photodetector arrays, e.g. ANGER cameras
• CPC Class Codes: G01T 1/2928 using solid state detectors

Abstract

A composite solid-state detector for utilization within gamma cameras and the like. The detector'"'"'s formed of an array of detector crystals, the opposed surfaces of each of which are formed incorporating an impedance-derived configuration for determining one coordinate of the location of discrete impinging photons upon the detector. A combined read-out for all detectors within the composite array thereof is achieved through a row and column interconnection of the impedance configurations. Utilizing the noted read-outs for respective sides of the discrete crystals, a resultant time-constant characteristic for the composite detector crystal array remains essentially that of individual crystal detectors.

Claims

1. A composite solid state detector for use in deriving a display, by spatial coordinate information, of the distribution or radiation emanating from a source thereof situate within a region of interest, comprising:

a plurality of solid state detector components, each having a given surface arranged for exposure to impinging radiation and exhibiting discrete interactions therewith at given spatially definable locations;

said given surface of each said detector component and the surface disposed opposite and substantially parallel thereto, respectively, being associated with impedance means configured to provide, for each of said opposed surfaces, outputs for impedance defined signals relating the said given location of said interactions with one spatial coordinate parameter of one select directional sense;

said detector components being arranged to provide groupings of adjacently disposed ones of said given surfaces mutually linearly oriented to exhibit a common said directional sense of said spatial coordinate parameter; and

means interconnecting at least two of said outputs associated with each of said surfaces within a given said grouping thereof for collecting said impedance defined signals deriving therefrom.

2. The composite solid state detector of claim 1 wherein said impedance means for each said detector component opposed surface is configured for providing said signals as charges of values corresponding with the said location of a said interaction along the said select directional sense of a said coordinate parameter associated with said surface.

3. The composite solid state detector of claim 1, wherein:

the said opposed surfaces of a said detector component are configured to define arrays of mutually parallel strips, each said strip having a discrete area influenced by the occurrence of said interaction thereunder;

said impedance means for each said surface being present as a resistor network having opposed output terminals, the resistor components of a said network being arranged in correspondence with an associated said strip array to provide said impedance defined signals as charges at said opposed output terminals having values corresponding with the location of the strip influenced by a corresponding said interaction; and

said interconnecting means is configured to associate, in parallel circuit relationship, the said output terminals of said resistor networks associated with a given said grouping of said surfaces having spatial coordinate parameters of mutually linear orientation.

4. The composite solid state detector of claim 3, in which the said array of strips of one said surface of a said detector component are orthogonally disposed with respect to the said array of strips of the said opposed surface oppositely disposed with respect thereto.

5. The composite solid state detector of claim 1, in which:

said impedance means is present as a surface-disposed region of predetermined resistance situate at a said detector component opposed surface and electrically coupled with a conductor means arranged upon said surface substantially at the edges of said component and in a direction transverse to said directional sense of said spatial coordinate parameters associated with said surface; and

said interconnecting means is configured to associate, in series circuit relationship, the adjoining said conductor means situate at the associated surfaces of said adjacently disposed solid state detector components.

6. The composite solid state detector of claim 1, wherein:

said solid state detector components are disposed in substantial mutual adjacency; and

said interconnecting means is configured to directly electrically connect the said impedance means outputs of said groupings of surfaces.

7. The composite solid state detector of claim 1, wherein:

said solid state detector components are disposed in substantial mutual adjacency; and

any two adjacent said surfaces of each of any two said adjacent detector components exhibit spatial coordinate parameters of a common directional sense.

8. The composite solid state detector of claim 1, wherein:

said solid state detector components are disposed in substantial mutual adjacency;

said given surfaces of said detector components are disposed in substantially coplanar relationship; and

two adjacent said coplanar surfaces of any two said adjacent detector components are disposed within a said linearly oriented grouping thereof.

9. The composite solid state detector of claim 8, wherein:

said impedance means for each said detector component opposed surface is configured for providing said signals as charges of values corresponding with the said location of a said interaction along the said select directional sense of a said coordinate parameter associated with said surface.

10. The composite solid state detector of claim 8, in which:

said impedance means is present as a surface-disposed region of predetermined resistance situate at a said detector component opposed surface and electrically coupled with conductor means arranged upon said surface substantially at the edges of said component and in a direction transverse to said directional sense of said spatial coordinate parameters associated with said surface; and

said interconnecting means is configured to associate, in series circuit relationship, the adjoining said conductor means situate within the associated surfaces of said adjacently disposed solid state detector components.

11. The composite solid state detector of claim 8, wherein:

said solid state detector components are disposed in substantial mutual adjacency; and

said interconnecting means is configured to directly electrically connect the said impedance outputs of said groupings of surfaces.

12. The composite solid state detector of claim 8, wherein:

said solid state detector components are formed of germanium.

13. A camera system for imaging the distribution of a source of gamma radiation situate within a region of interest, comprising:

a housing positionable a select distance from said region of interest at a location for receiving said radiation;

means collimating said received radiation;

a composite, solid state detector mounted within said housing in an orientation for receiving said collimated radiation, said detector including;

an array of solid state detector components, having given surfaces arranged in mutual, close adjacency to define a composite detector radiation acceptance plane exposable to incoming collimated radiation, said detector components exhibiting discrete interactions, at given spatial locations, with radiation impinging thereupon at said acceptance plane,

said given surface of each said detector component and the surface thereof disposed opposite thereto, respectively, being operationally associated with impedance means,

said impedance means being configured in correspondence with the extent of an associated said detector component surface and having outputs situate at two opposed peripheries of said associated surface for providing signals relating the location of a said interaction within said component to the respective locations of said outputs;

said detector components being arranged within said array to define spatially aligned discrete rows and orthogonally disposed columns of said surfaces and the said impedance means outputs associated therewith;

means interconnecting said impedance means outputs within each said discrete row in parallel circuit relationship to provide a signal collection output,

means interconneting said impedance means outputs within each said discrete column in parallel circuit relationship to provide a column signal collection output; and

means responsive to signals received from said row signal collection outputs and said column signal collection outputs for deriving an image corresponding with said interactions.

14. The camera system of claim 13, wherein

said impedance means for each said detector component surface is configured for providing said signals as charges of values corresponding with the location of a said interaction with respect to said outputs.

15. The camera system of claim 13, in which the areas of each said detector component surface defining said acceptance plane are substantially mutually equivalent.

16. The camera system of claim 15, in which detector component surfaces defining said acceptance plane have substantially the same peripheral shape.

17. The camera system of claim 13, in which:

said given surface and said opposite surface of said detector components are configured having arrays of parallel strips, the detector regions encompassed thereby being responsive to a said interaction to derive a spatially defined charge; and

said impedance means associated with each said surface is present as a charge splitting resistor network coupled between the said outputs thereof.

18. The camera system of claim 17, in which

the said array of parallel strips at a said given surface of a said detector component are arranged orthogonally to the array of parallel strips at said surface opposite said given surface.

19. The camera system of claim 18, in which

said detector components are formed of germanium and said strips are defined by grooves formed within said detector component surfaces.

20. The camera system of claim 13, in which

said impedance means for each said detector component surface is present as a surface-disposed region of predetermined resistance, and

said outputs associated therewith are present as conductive layers disposed at said opposed peripheries.

21. The camera system of claim 13, wherein:

said responsive means includes a preamplification stage coupled with each said row signal collection output and said column signal collection output.

22. The camera system of claim 21, wherein:

said detector components, said impedance means, and said preamplification stages are mounted within said housing within an environment adapted to achieve temperatures in the cryogenic region.