Automatic electronic test equipment and method

• US 4,055,801 A
• Filed: 08/18/1970
• Issued: 10/25/1977
• Est. Priority Date: 08/18/1970
• Status: Expired due to Term

• Current Assignee: Harold L. Pike, John F. Evans, Ronald L. Ketchum, Thomas G. Lamar
• Original Assignee: Harold L. Pike, John F. Evans, Ronald L. Ketchum, Thomas G. Lamar
• Inventors: Ketchum, Ronald L., Evans, John F., Pike, Harold L., Thomas, G. Lamar
• Primary Examiner(s): Rolinec, Rudolph V.
• Assistant Examiner(s): Sunderdick, Vincent J.
• Application Number:
  US05/064,703
• Time in Patent Office: 2,625 Days
• Field of Search: 324/73 R, 324/73 AT
• US Class Current: 714/736
• CPC Class Codes: G01R 31/31917 Stimuli generation or application of test patterns to the device under test [DUT]
• CPC Class Codes: H03M 1/665 with intermediate conversion to phase of sinusoidal or similar periodical signals

Abstract

A method and apparatus for the automatic testing of electronic equipment in which a general purpose digital computer is programmed for the equipment to be tested to generate appropriate stimulus waveforms for application to the equipment to be tested and for the measurement and evaluation of the waveforms responsively generated by the equipment tested. The computer directly controls the point-by-point generation of the analog stimulus waveforms by a plurality of analog to digital and analog to synchro converters, the application of the stimulus waveforms to selected leads of the unit to be tested, and the application of the response waveforms to a selected measurement circuit for conversion to digital form for subsequent evaluation by the computer against programmed standards.

Claims

1. Apparatus for testing electronic equipment comprising:

a general purpose digital computer;

a stimulus unit including;

a plurality of digital to analog and a plurality of digital to synchro converters, each of said converters being electrically connected to said computer by a common output bus;

a multiple lead test terminal adapted to be electrically connected to the electronic equipment to be tested;

a measurement unit including an analog to digital converter and a synchro to digital converter, said measurement unit converters being electrically connected to said computer by a common input bus;

a display unit electrically connected to said computer; and

switching means responsive to said computer for selectively connecting the converters of said stimulus unit to the leads of said output terminal, and for selectively connecting the leads of said output terminal to the converters of said measurement unit.

2. The apparatus of claim 1 wherein each of the converters of said stimulus unit includes a controller responsive to said computer and

wherein said stimulus unit further includes:

a direct current generator and an alternating current generator electrically connected to said output bus, and a multiple winding transformer electrically connected to receive the output signal from said alternating current generator.

3. The apparatus of claim 2 wherein at least one of said controllers is isolated from said computer by a bi-phase transmitter and receiver.

4. The apparatus of claim 1 wherein said controllers include:

a storage register for receiving a digital value word from said computer;

an address logic circuit for enabling said storage register responsively to an address word from said computer;

a reference voltage source;

means responsive for selectively modifying the voltage of said source; and

means for controlling the polarity of said modified voltage,

said voltage modifying and polarity controlling means being responsive to said digital value word.

5. The apparatus of claim 1 wherein at least one of the digital to analog converters includes:

a source of reference potential;

a comparator;

a switch logic circuit responsive to said computer;

means responsive to said switch logic circuit for controlling the application of said reference potential to said comparator;

a source of direct current;

a capacitor;

switch means responsive to said comparator for selectively connecting said source to said capacitor;

means for applying a potential to said comparator related to the charge on said capacitor; and

an output terminal for providing an output potential related to the charge on said capacitor.

6. The apparatus of claim 5 wherein said one digital to analog converter further includes means responsive to the associated controller for selectively inverting the polarity of the potential on said output terminal.

7. The apparatus of claim 1 wherein each of said plurality of digital to synchro converters comprise:

a variable gain amplifier;

a plurality of input elements each having a different impedance value;

a plurality of output elements each having a different impedance value differing from the impedance values of said input elements by an order of magnitude; and

means for selectively connecting one of said input elements and at least one of said output elements to said amplifier to control the gain thereof.

8. The apparatus of claim 5 wherein each of said plurality of digital to synchro converters comprise:

a variable gain amplifier;

a plurality of input elements each having a different impedance value;

a plurality of output elements each having a different impedance value differing from the impedance values of said input elements by an order of magnitude;

means for selectively connecting one of said input elements and at least one of said output elements to said amplifier to control the gain thereof; and

wherein said controllers include;

a storage register for receiving a digital value word from said computer;

an address logic circuit for enabling said storage register responsively to an address work from said computer;

a reference voltage source;

means responsive for selectively modifying the voltage of said source; and

means for controlling the polarity of said modified voltage,

said voltage modifying and polarity controlling means being responsive to said digital value word.

9. The apparatus of claim 1 wherein each of said plurality of digital to synchro converters comprise:

a variable gain amplifier;

a plurality of input elements each having a different impedance value;

a plurality of output elements each having a different impedance value differing from the impedance values of said input elements by an order of magnitude; and

means for selectively connecting one of said input elements and at least one of said output elements to said amplifier to control the gain thereof.

12. The apparatus of claim 7 wherein each of said plurality of digital to synchro converters comprise:

a variable gain amplifier;

a plurality of input elements each having a different impedance value;

a plurality of output elements each having a different inpedance value and differing from the impedance values of said input elements by an order of magnitude; and

means for selectively connecting one of said input elements and at least one of said output elements to said amplifier to control the gain thereof.

10. Apparatus for testing electronic equipment comprising:

a general purpose digital computer programmable with a series of digital words;

a plurality of digital to analog converters electrically connected to said computer for selectively converting a digital word into a predetermined voltage level;

a plurality of digital to synchro converters for selectively converting a digital word into three predetermined amplitude alternating current synchro signals;

a plural lead test terminal adapted to be electronically connected to the electronic equipment to be tested;

a measurement unit electrically connected to said computer, said measurement unit including an analog to digital converter for converting a voltage level into a digital word and an analog to digital converter for converting the relative amplitudes of response synchro signals into a digital word;

switching means electrically connected to said computer for selectively operably interconnecting said digital to analog converters to the leads of said test terminal and the leads of said test terminal to said measurement unit;

said computer being programmable for the equipment to be tested to control the numeric generation of a voltage waveform by said digital to analog converters, to control the numeric generation of the three synchro signals by said plurality of digital to synchro converters, to control the interconnections of said switching means, and to store digital words related to acceptable voltage response levels and related to acceptable differences in the amplitudes of the three synchro signals;

said computer being further programmable to compare both the voltage level related digital word and the synchro response related digital word generated by said measurement unit with the digital words related to the acceptable response of the equipment to be tested; and

display means electrically interconnected to said computer for displaying the results of said comparison.

11. Apparatus for testing electronic equipment comprising:

a general purpose digital computer programmable with a series of digital words;

a plurality of digital to analog converters electrically connected to said computer for selectively converting a digital word into a predetermined voltage level;

a second plurality of digital to analog converters electrically connected to said computer for selectively converting a digital word into a predetermined rate of current flow;

a plural lead test terminal adapted to be electronically connected to the electronic equipment to be tested;

a measurement unit electrically connected to said computer, said measurement unit including an analog to digital converter for converting a voltage level into a digital word and an analog to digital converter for converting rate of response current flow into a digital word;

switching means electrically connected to said computer for selectively operably interconnecting said digital to analog converters to the leads of said test terminal and the leads of said test terminal to said measurement unit;

said computer being programmable for the equipment to be tested to control the numeric generation of a voltage waveform by said plurality of digital to analog converters, to control the numeric generation of a current waveform by said second plurality of digital to analog converters, to control the interconnections of said switching means, and to store digital words related to acceptable voltage response levels and related to acceptable rates of response current flow;

said computer being further programmable to compare both the voltage level related digital word and the response current flow related digital work generated by said measurement unit with the digital words related to the acceptable response of the equipment to be tested; and

display means electrically interconnected to said computer for displaying the results of said comparison.