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Dynamic linearization system for a radiation gauge

  • US 4,064,396 A
  • Filed: 12/13/1976
  • Issued: 12/20/1977
  • Est. Priority Date: 12/13/1976
  • Status: Expired due to Term
First Claim
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1. In a radiation gauge for measuring the thickness of objects, apparatus for converting a thickness representative non-linear analog signal to a thickness representative linear analog signal exhibiting the same degree of resolution inherent in said non-linear signal, comprising:

  • a. memory means for storing a set of precalculated correction coefficient signals each of which is associated with a preselected range of possible values for said non-linear signal;

    b. addressing means responsive to said non-linear signal to address said memory and output the stored coefficient signal associated therewith;

    c. correction term generator means, coupled to said memory means, responsive to both said non-linear signal and said output coefficient signal to develop a correction term signal exhibiting the same degree of resolution inherent in said non-linear signal; and

    d. summing means, coupled to said generator means, responsive to said non-linear signal and said correction term signal to develop a linearized signal exhibiting the same resolution inherent in said non-linear signal.

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