Automatic clutter-mapper

• US 4,068,231 A
• Filed: 09/02/1976
• Issued: 01/10/1978
• Est. Priority Date: 09/02/1976
• Status: Expired due to Term

• Current Assignee: Hughes Aircraft Company (Rtx Corporation)
• Original Assignee: Hughes Aircraft Company (Rtx Corporation)
• Inventors: Wilmot, Richard D.
• Primary Examiner(s): Hubler, Malcolm F.
• Application Number:
  US05/721,628
• Time in Patent Office: 495 Days
• Field of Search: 343/5 CM, 343/5 VQ
• US Class Current: 342/90
• CPC Class Codes: G01S 7/2923 based on data belonging to a number of consecutive radar periods

Abstract

A system for detecting the presence of clutter utilizing an area overlap technique that effectively rejects scintillating position clutter near the boundaries of the area clutter map ACM cells. A first area clutter-mapper system is provided with its area ACM cells at a first position and a second clutter-mapper system is provided with its ACM cells in a second position with each cell displaced by about one-half ACM cell dimension in range and azimuth to overlap the original ACM cell boundaries. All of the clutter returns which were divided among the original set of ACM cells occur in one of the area overlap ACM cells so that when the clutter scintillates between ACM cells for any selected detection criterion, it is identified as clutter rather than a moving target. Separate detection history counts for clutter-identification and inhibit code for clutter rejection are provided in both the first and second clutter overlap map units. A clutter rejection code or condition in either area map unit will determine that clutter is present and the control gate samples either the clutter amplitude or a cluster code in both the first and second ACM cell units and rejects target signals if clutter has been determined in either of the units. In one modeling of the concept of invention, it was found that the area overlap method increased the amount of clutter rejected by 55% over a conventional single ACM mapping system unit.

Claims

1. A system for determining the presence of clutter over an area responsive to a target detector comprising

first area mapping means for defining a first group of mapping cells over said area in range and azimuth,

second area mapping means for defining a second group of mapping cells over said area, offset from said first group in both range and azimuth, and

target threshold means coupled to said first and second mapping means and to said target detector for controlling the passing of targets.

2. The system of claim 1 in which each first and second mapping means are coupled to said target detector and determines the presence of clutter in the corresponding group of mapping cells.

3. The system of claim 2 in which the clutter amplitudes are stored in the mapping cells of the first an second groups and said target threshold means includes means to compare the clutter amplitudes for each mapping cell and to compare the maximum amplitude with the target amplitude.

4. The system of claim 2 in which a code representing the presence of the predetermined clutter condition is stored in the mapping cells of said first and second groups and said target threshold means includes means to select either code to inhibit the selection of a target signal from said target detector.

5. The system of claim 2 in which said first and second groups are overlapped substantially one-half of a mapping cell length in range and substantially one-half of a mapping cell width in azimuth.

6. A clutter mapping system for determining the presence of clutter over a surveillance area comprising

a source of target signals, for detecting the presence of a target during each range bin of a plurality of azimuth sweeps,

first area clutter mapping means for defining a first area clutter mapping pattern of cells, each cell including a predetermined number of range bins over a predetermined number of azimuth sweeps,

second area clutter mapping means for defining a second area clutter mapping pattern of cells of substantially the same number of range bins and azimuth sweeps of said first pattern, said second pattern positioned relative to said surveillance area to be offset a selected portion of a cell in both the range and azimuth dimensions, and

threshold means coupled to said first and second area clutter mapping means and to said source of target signals for determining the presence of targets.

7. The system of claim 6 in which said first and second mapping means includes means for establishing said offset of a selected portion equal to substantially one-half of the number of range bins and one-half of the number of azimuth sweeps of each cell.

8. The system of claim 7 in which said first and second area clutter mapping means includes means for storing clutter amplitude for each cell.

9. The system of claim 7 in which said first and second area clutter mapping means includes means for storing an inhibit code representative of clutter in each cell.

10. The combination of claim 8 in which said threshold means includes means for comparing the clutter amplitude for each cell from said first and second mapping means to select the larger value and for comparing the larger value with the amplitude of said target signals.