Electronic phase comparison apparatus for the remote measurement of layer thickness

• US 4,075,555 A
• Filed: 03/25/1977
• Issued: 02/21/1978
• Est. Priority Date: 03/25/1977
• Status: Expired due to Term

• Current Assignee: Her Majesty The Queen In Right of Canada As Represented By The Minister of National Defence
• Original Assignee: Canadian Patents and Development Limited
• Inventors: Wight, James S., Makios, Vassilios, Chudobiak, Walter J.
• Primary Examiner(s): Krawczewicz, Stanley T.
• Application Number:
  US05/781,506
• Time in Patent Office: 333 Days
• Field of Search: 324/58.5 R, 324/58.5 A, 324/58.5 B, 324/58 R
• US Class Current: 324/644
• CPC Class Codes: G01B 7/06 for measuring thickness measuring during the manufacture of coatings C23C14/54
• CPC Class Codes: G01R 25/02 in circuits having distributed constants

Abstract

A continuous wave, phase measurement system which provides at least an order of magnitude improvement in accuracy over modulated carrier systems is disclosed for the determination of the thicknesses of layered targets consisting of a known number of dielectric layers, each of a known maximum thickness. This system uses related frequencies such as the fundamental and its harmonics to establish a multi-harmonic coherence relationship whereby a homodyne phase reference between harmonics can be conserved and information extracted from just the received and not the transmitted signals. Consequently doppler effects due to motion between the target and the apparatus, as well as severe local oscillator stability and drift limitations are avoided, and thus this system can measure remote target parameters by interferometric techniques without the distance being a constraint.

Claims

1. Apparatus for the remote measurement of the thickness of n layers in a dielectric target where n ≧

1, comprising;

transmitter means having n + 1 single frequency channels for directing n + 1 related frequency signals to the target; and

receiver means for receiving the n + 1 signals from the target, said receiver means including first means for converting the signals to a common frequency and second means for comparing the phase of pairs of the converted signals for determining the thicknesses l of the n layers as a function of the phase differences where l <

λ

/4, λ

being the shortest wavelength of the difference frequency between the related n + 1 signals.

2. Apparatus as claimed in claim 1 wherein said receiver further includes third means for detecting the amplitudes of the received signals for determining the thicknesses l of the n layers as a function of amplitude ratios of the received signals, where l <

λ

/2.

3. Apparatus as claimed in claim 2 wherein the frequency of each of the n + 1 signals is greater than 5 MHz.

4. Apparatus as claimed in claim 1 wherein the second means includes n phase comparing means each having a first input coupled to a common one of the converted signals and each having a second input coupled to a different one of the converted signals.

5. Apparatus as claimed in claim 1 wherein the transmitter means includes oscillator means for generating a signal having a fundamental frequency f and harmonic generator means coupled to the oscillator means for generating n harmonic signals.

6. Apparatus as claimed in claim 5 wherein n = 1 and the signals have a frequency f and 2f.

7. Apparatus as claimed in claim 6 wherein the first means includes multiplier means for multiplying the received signals of frequency f by a factor of 2.

8. Apparatus as claimed in claim 5 wherein the transmitter includes detector means for detecting the amplitude of each of the n + 1 transmitted signals.