Pattern position detecting system

• US 4,091,394 A
• Filed: 01/26/1977
• Issued: 05/23/1978
• Est. Priority Date: 01/26/1976
• Status: Expired due to Term

• Current Assignee: Hitachi, Ltd.
• Original Assignee: Hitachi, Ltd.
• Inventors: Hamada, Toshimitsu, Miyatake, Takafumi, Kashioka, Seiji, Yamazaki, Isamu, Ejiri, Masakazu, Mese, Michihiro
• Primary Examiner(s): Boudreau, Leo H.
• Application Number:
  US05/762,717
• Time in Patent Office: 482 Days
• Field of Search: 340/146.3 B, 340/146.3 Q, 340/146.3 H, 340/146.3 AH
• US Class Current: 382/151
• CPC Class Codes: G06F 18/00 Pattern recognition
• CPC Class Codes: G06V 10/20 Image preprocessing
• CPC Class Codes: G06V 10/24 Aligning, centring, orientation detection or correction of the image
• CPC Class Codes: G06V 10/40 Extraction of image or video features

Abstract

A pattern position detecting system comprising first means to sequentially fetch local images in a two-dimensionally arrayed form from a video signal in accordance with the scanning of an image and at sampling intervals which are variably instructed independently in the vertical and horizontal directions, second means to hold two-dimensional patterns having the same array as the local images, third means to evaluate the degree of non-coincidence between the image of the first means and the pattern of the second means, fourth means to store the position of an image scanning point at the time when the degree of non-coincidence becomes the minimum in a predetermined range within a picture frame, fifth means to calculate the position of an object from the position obtained by the fourth means, and sixth means to store the vertical and horizontal sampling intervals necessary for the operation of the first means, the two-dimensional patterns for use in the second means and numerical values necessary for the positional calculation of the fifth means, and to select required ones and send them to the first, second and fifth means.

Claims

1. A pattern position detecting system comprising image input means to generate a video signal by means of a scanning of an image, first means to selectively designate one of a plurality of desired sampling periods, second means to generate sampling pulses having the sampling period designated by said first means, third means to extract a partial image pattern sampled by said sampling pulses from the video signal generated by said image input means, fourth means for storing standard patterns, fifth means to compare one of the standard patterns from said fourth means and said partial image pattern from said third means and to evaluate the degree of coincidence between them, and sixth means for detecting the position of the partial image pattern on said image at the time when the degree of coincidence is judged to be the greatest by said fifth means.

2. The pattern position detecting system according to claim 1, wherein said first means includes means to selectively designate a range on the image to be extracted as the partial image pattern, and said second means comprises means to generate sampling pulses having the period instructed by said first means during a time interval corresponding to the range designated by said first means.

3. The pattern position detecting system according to claim 2, wherein said third means comprises binary-coding means to encode said video signal from said input means, first memory means for storing the output of said binary-coding means, and second memory means for sampling the output from said first memory means in response to said sampling pulses from said second means and for storing the sampled result.

4. The pattern position detecting system according to claim 1, wherein said fifth means comprises comparison means for generating a signal indicative of the degree of non-coincidence between said partial image pattern from said third means and one of the standard patterns of said fourth means, and detection means for detecting the point at which the non-coincidence signal from said comparison means reaches a minimum value.

5. The pattern position detecting system according to claim 3, wherein said second means comprises first signal generation means to generate synchronizing signals for driving said image input means and coordinate signals indicative of the position on the image being presently scanned by said image input means, by predetermined clocks, and second signal generation means to generate sampling pulses in response to said coordinate signals from said first signal generation means in accordance with said sampling periods designated by said first means.

6. The pattern position detecting system according to claim 2, wherein said first means includes means to designate the range on the image to be extracted and the sampling period in response to the positional signal outputted from said sixth means.

7. A pattern position detecting system comprising image input means for generating video signal by means of the scanning of a picture frame, first means to extract a partial image pattern sampled on the basis of either of first and second sampling periods from the video signal generated by said image input means, second means to selectively hold a plurality of standard patterns, third means to compare the patterns from said first and second means to evaluate the degree of coincidence between them, fourth means for detecting the position of the partial image pattern at the time when the degree of coincidence by said third means is the greatest, and fifth means for designating to said first and third means said second sampling period as well as a positional range on the picture frame of the partial image pattern to be extracted by this period, in response to the position of the partial image pattern at the time when the partial image pattern extracted by said first sampling period is the greatest in the degeee of coincidence with the corresponding standard pattern, and further, to detect the position of a specific pattern in response to the position of the partial image pattern at the time when the partial image pattern extracted by said second sampling period is the greatest in the degree of coincidence with the corresponding standard pattern.