Single channel electrical comparative measuring system

• US 4,091,683 A
• Filed: 09/27/1976
• Issued: 05/30/1978
• Est. Priority Date: 09/27/1976
• Status: Expired due to Term

• Current Assignee: Panex Corporation
• Original Assignee: Panex Corporation
• Inventors: Delatorre, Leroy C.
• Primary Examiner(s): Ruehl, Charles A.
• Application Number:
  US05/726,771
• Time in Patent Office: 610 Days
• Field of Search: 73/398 C, 73/407 PR, 73/304 C, 324/61 R, 307/118
• US Class Current: 73/718
• CPC Class Codes: G01L 9/0072 using variations in capacitance
• CPC Class Codes: G01L 9/12 by making use of variations in capacitance , i.e. electric circuits therefor

Abstract

A measuring system based on using a ratio of variable capacitance measurements derived from alternate sampling and referencing of at least two capacitance devices and use of a single channel for the capacitance outputs so that the measurements are basically independent of the circuit components, supply voltage, temperature drift problems. The measurements can be high resolution digital signals.

Claims

1. Apparatus for processing measured parameters including:

sensing means for receiving two parameters to be measured and for providing two capacitance measurement values respectively functionally related to the parameters received by said sensing means,

a single channel means responsive to such capacitance measurement values for producing output signals with frequencies functionally related to such capacitance measurement values from said sensing means,

means for providing a reference voltage, and

means for alternately coupling said reference voltage and said single channel means to said sensing means for referencing a capacitance measurement value alternately to said voltage reference and applying a capacitance measurement value to said single channel means.

2. The apparatus as defined in claim 1 and, further including means responsive to said single channel means for operating said alternate coupling means.

3. The apparatus as defined in claim 1 wherein said alternate coupling means includes a field effect switching device.

4. The apparatus as defined in claim 1 wherein said single channel means includes an electrical comparator means responsive to capacitance values for oscillation between a reference voltage value and an upper voltage value.

5. The apparatus as defined in claim 4 wherein said alternate coupling means includes a field effect switching device, said electrical comparator means and said field effect device being referenced to a common voltage source.

6. The apparatus as defined in claim 4 and further including flip-flop means for producing a first output signal for one capacitance value input and for producing a second output signal for the other capacitance value input, and wherein said alternate coupling means includes a field effect switching device which is operated in response to the output signals from said flip-flop means.

7. Electrical measuring apparatus including:

sensing means having separate components for respectively receiving a parameter for measurement and for producing measured signals related to said parameters;

means for providing a reference signal to said sensing means;

single channel means for processing a measured signal and for developing a corresponding pulse width signal;

means for alternately coupling said separate components from said sensing means to said single channel means and said means for providing a reference signal so that, in one alternate coupling, one of said separate components from said one sensing means is coupled to said reference signal and a second one of said separate components from said sensing means is coupled to said single channel and, in the other alternate coupling, the first one of said separate components from said one sensing means is coupled to said single channel means and the second one of said separate components from said sensing means is coupled to said reference signal.

8. The apparatus as defined in claim 7 and further including means coupled to said single channel means and responsive to said pulse width signal for operating said alternately coupling means at the end of each of said pulse width signals.

9. The apparatus as defined in claim 7 wherein said means for alternately coupling includes a switching device, and a unity gain amplifier coupled between said single channel means and said switching device for balancing out any inherent capacitance effects in said switching device.

10. The apparatus as defined in claim 9 and further including means for receiving alternate pulse width signals and for converting said alternate pulse width signals into a ratio measurement.

11. Apparatus for use in measuring differential pressures as a ratio including:

functionally interrelated first and second capacitor means for sensing the pressure in at least two pressure conduits where said capacitor means are electrically chargeable at a rate proportion to pressure;

comparator means responsive to a capacitor means for producing an alternating signal having a time period related to the rate of charging for the capacitor means;

a source of reference voltage;

an insulated-gate metal oxide semi-conductor means coupled between said capacitor means and said comparator means for selectively coupling, in a first condition, one of said first or second capacitor means to said comparator means and for coupling said reference voltage to the other of said first or second capacitor means and for coupling, in a second condition, the said other of said first or second capacitor means to said comparator means and for coupling said reference voltage to the said one of said first or second capacitor means.

12. The apparatus as defined in claim 11 and further including means coupled between said comparator means and said semi-conductor means for providing a feedback signal to said semi-conductor means for cancelling out capacitance effects in said semi-conductor means.

13. Apparatus for use in measuring the magnitude values of a capacitance means where such magnitudes are functionally related to measured parameters, said apparatus being a subcombination comprised of:

comparator means responsive to alternately occurring first and second magnitude values derived from capacitance means for producing an alternating signal where half cycles of said alternating signal have time periods related to the magnitude of said first and second magnitude values,

an insulated-gate metal oxide semi-conductor means for receiving such first and second magnitude values at first and second inputs and for receiving a reference voltage from a reference voltage source,

said semi-conductor means in a first condition, coupling one of said capacitance magnitude values to said comparator means and coupling such reference voltage to one of said first and second inputs, and

in a second condition, coupling the other of said capacitance magnitude values to said comparator means and coupling such reference voltage to the other of said first and second inputs; and

means responsive to said alternating signal coupling said semi-conductor means to the output of said comparator means for switching said semi-conductor means between said first and second conditions, thereby alternately coupling such first and second magnitude values to said comparator means.

14. The apparatus as defined in claim 13 and further including means coupled between said comparator means and said semi-conductor means for providing a feedback signal to said semi-conductor means for cancelling out capacitance effects in said semi-conductor means.

15. The apparatus as defined in claim 14 and further including means coupled to said comparator means for obtaining a ratio value of such first and second capacitance values.

16. A method for measuring physical parameters using a common detecting channel and including the steps of:

applying at least one such physical parameter to a first capacitance sensing means which initially is at a reference voltage level for developing a capacitance value as a function of the magnitude of the applied parameter;

electrically clamping a second capacitance sensing means to such reference voltage while such first capacitance sensing means develops a capacitance value;

applying the capacitance value of such first capacitance sensing means to a common electrical channel means and producing a first pulse width signal as a function of the capacitance value developed by such first capacitance sensing means;

switching such reference voltage to the first capacitance sensing means to electrically clamp such first capacitance sensing means to such reference voltage while applying to such second capacitance sensing means another physical parameter for developing a capacitance value as a function of the magnitude of such another applied parameter; and

applying the capacitance value developed by such second capacitance sensing means to such common electrical channel means for producing a second pulse width signal as a function of the magnitude of such another applied parameter.

17. The method as defined in claim 16 and further including the step of obtaining said pulse width signals from such common electrical channel and electrically comparing pulse width signals from the first capacitance sensing means to pulse width signals from the second capacitance sensing means for providing a ratio measurement.

18. A method for measuring parameters including the steps of:

applying at least two measurement parameters to capacitance sensing means for developing respective capacitance values as a function of the applied parameters;

electrically clamping a first capacitance sensing means to a reference voltage while connecting a second capacitance sensing means to a single channel capacitance responsive circuit means;

obtaining a first pulse width signal from said circuit means, said pulse width signal being functionally related to the capacitance value of said second capacitance sensing means; and

obtaining a second pulse width signal for the other parameter by electrically clamping the second capacitance sensing means to the reference voltage while connecting the first capacitance sensing means to such circuit means.