Direct electronic fourier transforms of optical images

• US 4,099,207 A
• Filed: 01/21/1977
• Issued: 07/04/1978
• Est. Priority Date: 12/29/1972
• Status: Expired due to Term

• Current Assignee: Research Corporation
• Original Assignee: Research Corporation
• Inventors: Kowel, Stephen T., Kornreich, Philipp G.
• Primary Examiner(s): Martin, John C.
• Application Number:
  US05/760,904
• Time in Patent Office: 529 Days
• Field of Search: 315/55, 315/169 TV, 250/211 J, 250/211 R, 250/208, 250/213 R, 358/213, 358/209, 358/107, 340/146.3 P, 340/146.3 F, 356/71, 338/15, 310/8.1, 310/8, 310/8.3, 310/9.7, 310/334
• US Class Current: 382/280
• CPC Class Codes: G02F 1/11 based on acousto-optical elements, e.g. using variable diffraction by sound or like mechanical waves acousto-optical deflection G02F1/33
• CPC Class Codes: G06V 10/12 Details of acquisition arrangements; Constructional details thereof
• CPC Class Codes: G06V 10/20 Image preprocessing
• CPC Class Codes: G06V 10/42 Global feature extraction by analysis of the whole pattern, e.g. using frequency domain transformations or autocorrelation
• CPC Class Codes: G08B 13/18 Actuation by interference with heat, light, or radiation of shorter wavelength; Actuation by intruding sources of heat, light, or radiation of shorter wavelength
• CPC Class Codes: G08B 13/1961 Movement detection not involving frame subtraction, e.g. motion detection on the basis of luminance changes in the image
• CPC Class Codes: G08B 13/19634 Electrical details of the system, e.g. component blocks for carrying out specific functions
• CPC Class Codes: H04N 3/10 by means not exclusively optical-mechanical H04N3/36 takes precedence

Abstract

Method and apparatus for directly converting between optical images and the spatial Fourier transforms of optical images by interacting sound waves and light. Controlled sound waves couple with optical images, and electrical signals may be derived from this coupling which are functions of the spatial Fourier transforms of the entire optical images. In a reverse process, optical images are obtained directly by coupling controlled sound waves with electrical signals which are a function of the spatial Fourier transforms of the optical images and with light.

Claims

1. A device for generating an electrical signal representation of an optical image comprising:

a medium having an electrical property which varies as a function of an optical image formed on the medium and as a function of time and space varying strain disturbances in the medium, said medium being made of a material selected from the group consisting of degenerate semiconductors and metals;

means for forming an optical image on the medium;

means for causing a plurality of different time and space varying strain disturbances in the medium; and

means for measuring said electrical property of the medium at a plurality of said different strain disturbances in the medium while the image is formed on the medium to derive a plurality of electrical signals, each signal representing an aspect of the entire image rather than of a point or an elemental area of the image, said measuring means including means for establishing a constant current across a portion of the medium and means for detecting the potential difference across at least a part of said portion of the medium at a plurality of said different strain disturbances in the medium while the image is formed on the medium.

2. A device as in claim 1 wherein said different strain disturbances in the medium are strain waves of different spatial wavelengths propagating in the medium.

3. A device as in claim 1 wherein said strain disturbances in the medium are bulk strain waves propagating in the medium.

4. A device as in claim 1 wherein the measuring means comprises means for deriving electrical signals each of which is a Fourier transform representation of the image corresponding to a particular strain disturbance in the medium.

5. A device as in claim 1 wherein the medium is formed of a continuous, solid, substantially homogeneous material capable of propagating strain waves induced therein and having an electrical property which varies as a Fourier transform function of an optical image formed on the medium and of strain waves propagating in the medium.

6. A device as in claim 5 wherein the medium comprises essentially a bar of silicon material.

7. A device as in claim 1 wherein the means for measuring the electrical property comprises means for deriving electrical signals each of which represents a selected component of a Fourier transform representation of a single dimension of the optical image.

8. A device as in claim 1 wherein the measuring means includes means for measuring the magnitude of said electrical property of the medium and the phase of said electrical property relative to the strain disturbances present in the medium to thereby derive electrical signals representing both the magnitude and the phase of said property, said electrical signals representing the optical image.

9. A device as in claim 1 wherein the means for causing strain disturbances comprise means for causing a plurality of strain waves of different spatial wavelengths to be concurrently present in the medium and the measuring means include means for deriving an electrical signal corresponding to each of the concurrently present strain waves, said electrical signal representing a Fourier transform representation of the image corresponding to said concurrently present strain waves.

10. A device for generating an electrical signal representation of an optical image comprising:

a medium having an electrical property which varies as a function of an optical image formed on the medium and as a function of strain disturbances present in the medium;

means for forming an optical image on the medium;

means for causing a plurality of strain waves of different spatial wavelengths to be concurrently present in the medium; and

means for measuring the electrical property of the medium at each of said plurality of different strain waves to derive a corresponding plurality of electrical signals each of which represents an aspect of the entire optical image rather than of a point or an elemental area of the image.

11. A device as in the claim 10 wherein each of said strain waves in the medium is a bulk strain wave.

12. A device as in claim 10 wherein the measuring means includes means for deriving electrical signals each of which represents a Fourier transform component of the optical image.

13. A device as in claim 10 wherein the measuring means includes means for measuring the magnitude of the electrical property of the medium corresponding to each of said strain waves and the phase of the electrical property of the medium corresponding to each of said strain waves and relative to the phase of the corresponding strain wave.

14. A method of deriving an electrical signal representation of an optical image comprising the steps of:

forming an optical image on a medium having an electrical property which varies as a function of the optical image formed on it and as a function of strain disturbances present in it;

causing a plurality of different strain disturbances in the medium; and

measuring the electrical property of the medium at a plurality of said different strain disturbances in the medium to derive a plurality of electrical signals each corresponding to a different strain disturbance and each representing the entire optical image formed on the medium, said measuring means including means for maintaining a constant current through a selected portion of the medium and for deriving said electrical signals by measuring the potential difference across said selected portion of the medium.

15. A method as in claim 14 wherein the step of causing the strain disturbances comprises causing bulk strain waves propagating through the medium.

16. A method as in claim 14 wherein the measuring step comprises measuring the electrical property to derive electrical signals each of which is a Fourier representation component corresponding to a different strain disturbance in the medium.

17. A method as in claim 14 wherein the measuring step comprises measuring the magnitude of the electrical property corresponding to each of the different strain waves and measuring the phase of the electrical property corresponding to each different strain disturbance and relative to the phase of the corresponding strain disturbance.