Chuck for use in the testing of semiconductor wafers
First Claim
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1. A chuck having a wafer receiving surface for testing semiconductor wafers comprising:
- a first and a second plurality of electrically conductive members, said members being alternately arranged and substantially electrically isolated from each other;
means for retaining said members together such that said wafer receiving surface is provided;
means electrically connecting said first plurality of members together;
means electrically connecting said second plurality of members together;
means for attaching power and sensing means to said first and second members connecting means, respectively; and
means, integral with said chuck for holding a semiconductor wafer to said wafer receiving surface.
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Abstract
A chuck for use in the testing of semiconductor wafers comprising first and second pluralities of electrically conductive members alternately arranged to provide a wafer receiving surface. The members are substantially completely electrically isolated from each other. Electric power leads and measurement sensing leads are provided to the first plurality of conductive members and the second plurality of conductive members respectively.
17 Citations
13 Claims
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1. A chuck having a wafer receiving surface for testing semiconductor wafers comprising:
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a first and a second plurality of electrically conductive members, said members being alternately arranged and substantially electrically isolated from each other; means for retaining said members together such that said wafer receiving surface is provided; means electrically connecting said first plurality of members together; means electrically connecting said second plurality of members together; means for attaching power and sensing means to said first and second members connecting means, respectively; and means, integral with said chuck for holding a semiconductor wafer to said wafer receiving surface. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of fabricating a chuck having a wafer receiving surface comprising the steps of:
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forming a plurality of slots in one face of a workpiece of conductive material; refilling said slots with a dielectric material; machining an opposing face of said workpiece until a first and second plurality of separate conductive members is formed, said members being alternately arranged and substantially electrically isolated from each other; retaining said conductive members together to form said wafer receiving surface; connecting said first plurality of members together; connecting said second plurality of members together; attaching power and sensing means to said first and second members respectively; and
providing means, integral with said chuck, for holding a semiconductor wafer to said wafer receiving surface. - View Dependent Claims (10, 11, 12, 13)
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Specification