Device for measuring at least one dimension of an object and a method of operating said device

• US 4,115,702 A
• Filed: 04/25/1977
• Issued: 09/19/1978
• Est. Priority Date: 05/05/1976
• Status: Expired due to Term

• Current Assignee: Zumbach Electronic AG
• Original Assignee: Zumbach Electronic AG
• Inventors: Nopper, Peter
• Primary Examiner(s): Nelms, David C.
• Application Number:
  US05/790,182
• Time in Patent Office: 512 Days
• Field of Search: 356/159, 356/160, 356/165, 356/168, 250/560, 250/561, 250/237, 250/208, 250/209
• US Class Current: 250/559.2
• CPC Class Codes: G01B 11/08 for measuring diameters
• CPC Class Codes: G01B 11/105 using photoelectric detection means

Abstract

A device for measuring at least one dimension of an object comprises two light channels of which one is intended to receive the object and the other serves as a reference channel. Light from the two channels is conducted to respective photo-electric transducers the outputs of which are connected to a comparison circuit. The relationship between the relative intensities of illumination of the transducers provides a measure of the dimension of the object. In order to improve the response characteristics of the transducers they are connected in parallel with mutually reversed polarity and the difference between the electric currents passed by the two transducers is compensated by negative feedback via a resistor connected to the output of an amplifier at the input of which the said transducers are connected.

Claims

1. In a device for measuring at least one dimension of an object, comprising a light source, means defining two independent light channels for conducting light from said source to respective photo-electric transducers, means for adjusting the relative quantities of light transmitted by said channels, and a comparison circuit connected to the outputs of said transducers in order to compare the relationship between the intensities of illumination thereof, whereby when the object to be measured is introduced into one of said channels the dimension thereof can be determined in terms of the deviation of said relationship from a preset condition;

the improvement wherein said photo-electric transducers are connected to the input of an amplifier of said circuit in parallel and with their polarity mutually reversed with respect to one another, and the said amplifier is provided with a negative feedback resistance connected to its output and arranged to compensate the difference between the electric currents of the said two transducers.

2. The improvement according to claim 1, wherein the photo-electric transducers are photodiodes.

3. The improvement according to claim 1, including means for maintaining the photo-electric transducers at equal temperatures.

4. The improvement according to claim 3, wherein the said means for maintaining the photo-electric transducers at equal temperatures comprises a common thermally conductive support upon which said transducers are arranged, and means for maintaining said support and said transducers at a temperature differing from ambient temperature.

5. The improvement according to claim 4, wherein the said temperature maintaining means includes a thermostatic control.

6. The improvement according to claim 1, wherein the said amplifier is an operational amplifier and the negative feedback resistance, the input of said amplifier and a compensating resistance are connected in series.

7. The improvement according to claim 6, wherein the negative feedback resistance and the compensating resistance have values of the same order of magnitude.

8. The improvement according to claim 1, wherein the said photo-electric transducers have matched characteristics.

9. The improvement according to claim 1, wherein the said comparison circuit includes a differentiating member for the purpose of detecting rapid variations of measured value whilst avoiding any disturbing influences due to slow variations in measured value.

10. The improvement according to claim 1, wherein the said comparison circuit includes an integrating member for the purpose of suppressing rapid variations in measured value.

11. The improvement according to claim 1, wherein the said device includes a tolerance supervision circuit for comparing the value of an output signal from said comparison circuit with two prescribed values lying below and above a nominal value, said tolerance supervision circuit being adapted to emit a warning signal when the said output signal exceeds or falls below one of the prescribed values.

12. The improvement according to claim 11, wherein the tolerance supervision circuit comprises two sources of potential representing the said prescribed values, two differential amplifiers each having a first input connected to the output of said comparison circuit and a second input connected to a respective one of said potential sources, and an OR gate, the inputs of which are connected to the outputs of said differential amplifier and the output of which delivers the said warning signal.

13. A device according to claim 1, including a servo-control mechanism for the automatic adjustment of the position of a diaphragm movable in the light channel intended to receive said object in order to control the intensities of illumination of said photo-electric elements to the same value.

14. A device according to claim 13, wherein the servo-control mechanism is coupled to an indicating system which indicates a measured value corresponding to the position of the movable diaphragm.

15. A device according to claim 14, wherein the servo-control mechanism includes a stepping servomotor.

16. A device according to claim 15, wherein a stepping counter is connected in parallel to the stepping servomotor, whereby the position of the counter corresponds to that of the stepping servomotor and the movable diaphragm.

17. A device for measuring at least one dimension of an object, comprising a light source;

an optical element for producing parallel light rays from said light source;

optical means for the lateral deflection of light beyond the ray path of said optical element;

a diaphragm having diaphragm apertures defining respectively the cross-sections of a first light channel into which the object to be measured is to be introduced and comprising rays derived directly from said optical element, and the cross-section of a second light channel comprising rays derived via said optical means and serving as a reference channel, the said diaphragm apertures being so dimensioned and arranged that the paths of light rays proceeding from said source to the respective channels are mutually exclusive;

means for adjusting the relative quantities of light transmitted by said channels;

a pair of photo-electric transducers arranged to be illuminated by the light transmitted by the said two channels, respectively; and

a comparison circuit connected to the outputs of said transducers in order to compare the relationship between the intensities of illumination thereof.

18. The device claimed in claim 17, wherein said transducers are connected to the input of an amplifier of said circuit in parallel and with their polarity mutually reversed with respect to one another, and the said amplifier is provided with a negative feedback resistance connected to its output and arranged to compensate the difference between the electric currents of the said two transducers.

19. A device according to claim 18, wherein the diaphragm aperture defining the cross-section of the said first channel comprises a slit extending over substantially the whole diameter of said optical element, and the said optical means for deflecting the light into the second channel is arranged laterally with respect to the beam path defined by the said slit.

20. A device for measuring at least one dimension of an object, comprising a light source;

means defining a first light channel for light rays from said source and having a cross-section in the shape of a slit;

means defining a second light channel of substantially smaller cross-section than the first;

a diaphragm leaf mounted for movement in the direction of the major dimension of said first light channel;

a micrometer coupled to said diaphragm leaf for effecting measured movement thereof;

means for finely adjusting the cross-section of said second light channel;

a pair of photo-electric transducers arranged to be illuminated by the light transmitted by the said two channels respectively; and

a comparison circuit connected to the outputs of said transducers in order to compare the relationship between the intensities of illumination thereof.

21. The device claimed in claim 20, wherein said transducers are connected to the input of an amplifier of said circuit in parallel and with their polarity mutually reversed with respect to one another, and the said amplifier is provided with a negative feedback resistance connected to its output and arranged to compensate the difference between the electric currents of the said two transducers.

22. A method of pre-adjusting a device as claimed in claim 20, wherein a standard object is introduced into said first channel, said object having a nominal dimension in the direction of the major dimension of said slit, the said micrometer is adjusted into a position corresponding to said nominal dimension, the fine adjusting means of said second channel is adjusted to balance the output of said comparison circuit to a null condition, and the standard object is removed.

23. A method of pre-adjusting a device as claimed in claim 20, wherein the said micrometer is adjusted to a zero position corresponding to the position of maximum reduction of the dimension of said slit, and the said fine adjustment means is adjusted to balance the output of said comparison circuit to a null condition.

24. A method as claimed in claim 22, wherein during the measurement of an object proceeding from a production line the said balance of the comparison circuit to a null condition is effected after removing the object from the said first channel or swinging the optical path of said channel away from the object.

25. A method as claimed in claim 23, wherein during the measurement of an object proceeding from a production line the said balance of the comparison circuit to a null condition is effected after removing the object from the said first channel or swinging the optical path of said channel away from the object.