×

Binary inspection probe for numerically controlled machine tools

  • US 4,118,871 A
  • Filed: 06/13/1978
  • Issued: 10/10/1978
  • Est. Priority Date: 06/13/1978
  • Status: Expired due to Term
First Claim
Patent Images

1. A method of measuring a dimension of a workpiece in a numerically controlled machine tool, said machine tool including a workpiece holder for holding said workpiece;

  • means including a detachably mounted toolholder for holding a tool in a position to perform work on said workpiece;

    numerical control means for varying the relative position of said workpiece holder and toolholder means in response to digital input signals; and

    position feedback means indicating the position of said workpiece holder and toolholder means with respect to a machine reference point, said method comprising the steps of;

    (1) mounting a toolholder including an inspection probe in said toolholder means;

    (2) causing relative motion between said toolholder means and said workpiece holder in the direction of decreasing the distance between said workpiece and inspection probe;

    (3) stopping relative movement of said toolholder means and workpiece holder after said inspection probe makes contact with said workpiece;

    (4) causing relative motion between said toolholder means and said workpiece holder in the direction of separating said workpiece and inspection probe; and

    (5) recording the position of said workpiece and toolholder means as indicated by the output of said position feedback means at the instant said inspection probe breaks contact with said workpiece.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×