Frequency adjusting a piezoelectric device by lasering

• US 4,131,484 A
• Filed: 02/13/1978
• Issued: 12/26/1978
• Est. Priority Date: 02/13/1978
• Status: Expired due to Term

• Current Assignee: AT&T Technologies Inc (Nokia Corporation)
• Original Assignee: Western Electric Co., Inc. (Nokia Corporation)
• Inventors: Caruso, Robert D., Setter, Gerald A. Jr.
• Primary Examiner(s): Fisher, Richard V.
• Application Number:
  US05/877,541
• Time in Patent Office: 316 Days
• Field of Search: 134/1, 29/25.35, 29/593, 310/328, 219/121 LM
• US Class Current: 134/1
• CPC Class Codes: B08B 17/02 Preventing deposition of fouling or of dust
• CPC Class Codes: B08B 7/0042 by laser
• CPC Class Codes: B23K 26/0853 Devices involving movement of the workpiece in at least in two axial directions, e.g. in a plane
• CPC Class Codes: H03H 3/04 for obtaining desired frequency or temperature coefficient
• CPC Class Codes: Y10T 29/42 Piezoelectric device making
• CPC Class Codes: Y10T 29/49004 including measuring or testing of device or component part

Abstract

Electrode material is laser machined from a piezoelectric device (10) to adjust its resonant frequency to a nominal value. At the same time the device (10) is electronically cleaned by overdriving the device at a high current level to prevent loosely adhering lasered particles, which cause the device to be electrically unstable, from accumulating on the device. The simultaneous laser machining and electronic cleaning also eliminates erratic resonant frequency changes in the device (10) which occur if the electronic cleaning is performed after the laser machining. As the nominal resonant frequency value is approached, the device (10) is overdriven at successively lower current levels and the laser machining is carried out at respective successively lower rates.

Claims

1. A method of adjusting the resonant frequency of a piezoelectric device, which comprises:

laser machining electrode material from the piezoelectric device to change the resonant frequency of the device to a nominal value; and

simultaneously electronically cleaning the piezoelectric device by overdriving the device at a high current level in comparison to the current level at which the device normally is operated, to prevent lasered particles which cause electrical instability of the device in subsequent operation from accumulating on the device.

2. The method as recited in claim 1, in which:

the piezoelectric device is overdriven at a current level on the order of at least thirty times the normal operating current level of the device.

3. The method as recited in claim 1, in which:

the piezoelectric device is overdriven so as to produce a current flow of at least sixty milliamps in the device.

4. The method as recited in claim 1, in which:

the resonant frequency change in the piezoelectric device due to lasering is on the order of at least 500 Hz.

5. The method as recited in claim 1, which further comprises:

reducing the current level at which the piezoelectric device is overdriven as the resonant frequency of the device nears the nominal value, to reduce distortion in the resonant frequency response of the device.

6. The method as recited in claim 5, which further comprises:

reducing the rate at which the electrode material is laser machined from the piezoelectric device as the resonant frequency of the device nears the nominal value.

7. The method as recited in claim 6, in which:

the current level at which the piezoelectric device is overdriven and the rate at which electrode material is laser machined from the piezoelectric device are reduced in sequential steps.

8. The method as recited in claim 1, which further comprises:

continuously displaying a curve representative of the resonant frequency of the piezoelectric device on a monitor; and

reducing the current level at which the piezoelectric device is overdriven as the resonant frequency of the device nears the nominal value, to reduce distortion in the resonant frequency response of the device and to obtain improved definition of the resonant frequency curve on the monitor.

9. The method as recited in claim 8, which further comprises:

initially overdriving the piezoelectric device at different frequencies in a first frequency step size over a frequency range extending below and above the nominal resonant frequency; and

then overdriving the piezoelectric device at different frequencies in a reduced frequency step size upon reducing the current level at which the device is being overdriven, to produce a frequency curve display on the monitor over a narrower frequency range extending below and above the nominal resonant frequency.

10. A method of adjusting the resonant frequency of a piezoelectric device, which comprises:

laser machining electrode material from the piezoelectric device to change the resonant frequency of the device to a nominal value;

simultaneously with the laser machining of electrode material from the piezoelectric device, electronically cleaning the piezoelectric device by overdriving the device at a high current level in comparison to the current level at which the device is normally operated, to prevent lasered particles which cause electrical instability of the device in subsequent operation from accumulating on the device;

reducing the current level at which the piezoelectric device is overdriven in sequential steps as the resonant frequency of the device nears the nominal value, to reduce distortion in the resonant frequency response of the device; and

simultaneously with each reducing of the current level at which the piezoelectric device is overdriven, reducing the rate at which the electrode material is laser machined from the device.