Repeat defect detector system

• US 4,134,684 A
• Filed: 01/18/1977
• Issued: 01/16/1979
• Est. Priority Date: 01/18/1977
• Status: Expired due to Term

• Current Assignee: Union Trustees
• Original Assignee: Intex Corporation
• Inventors: Jette, Paul C.
• Primary Examiner(s): McGraw, Vincent P.
• Assistant Examiner(s): Bovernick, Rodney B.
• Application Number:
  US05/760,279
• Time in Patent Office: 728 Days
• Field of Search: 356/200, 356/199, 356/209, 356/212, 250/563, 250/572
• US Class Current: 356/430
• CPC Class Codes: G01N 21/89 in moving material, e.g. running paper or textiles G01N21/90, G01N21/91, G01N21/94 take precedence

Abstract

A flaw detection system is provided in which a source of radiation is scanned across a web of moving material being examined for repeat defects. The web is divided into lanes for processing purposes, and flaw information derived from the surface of material being examined is processed to provide a two-coordinate matrix location (lane and down-web), which is stored. This circuitry without the matrix outputs has other applications. Separation distances of a repeat flaw in the same lane are compared with a predetermined list, and if a match occurs, future flaw locations are projected in that lane. A repetition of a predetermined number of flaw repeats in a given lane signals an alarm. A predetermined number of misses in a row will result in the clearing of that lane of the particular flaw that failed to repeat.

Claims

1. A repeat defect detection system for detecting repetitive flaws on predetermined areas of moving web of material being examined, comprising in combination

(a) a source of radiation,

(b) scanning means for scanning said source of radiation in a predetermined scan path over the web of material being examined,

(c) detector means positioned for receiving radiation applied by said source from the material being examined and generating signals in response to the intensity of radiation applied thereto,

(d) flaw discriminator means coupled to said detector means for passing flaw signals of predetermined characteristics in accordance with the requirements of said discriminator means,

(e) lane means for dividing the web of material being examined into predetermined lane areas along the length of travel of the web and means for generating lane signals representing said lane areas for flaw signal processing purposes, and

(f) settable recirculating processing means coupled to said flaw discriminator means and said lane signals for providing flaw signal matrix coordinator outputs indicative of lane number versus downweb position of each new flaw passed by said discriminator means, said processing means having means for locking out individual lanes with a predetermined high data rate until such predetermined high data rate disappears for a predetermined time interval.

2. The repeat defect flaw detection system set forth in claim 1 including

(a) means for determining separation distances between a next succeeding flaw signal and a prior flaw signal in a given lane,

(b) means for comparing said separation distances in any given lane with a predetermined list of separation distances for providing matched pairs of flaws,

(c) means for projecting future flaw locations in a given lane band from matched pairs of flaw separations,

(d) means for comparing any new flaw in a given lane with said future flaw locations, and

(e) means for generating an alarm indication of flaw size and lane location on a predetermined number of flaw repeats in a given lane which coincide with projections of said future flaw locations.

3. The repeat defect flaw detection system set forth in claim 2, including means for resetting a given lane by removing flaw data for a given flaw on a predetermined number of misses in a row in a comparison with projections of said future flaw locations for that flaw.

7. The structure set forth in claim 1 wherein said settable recirculating processing means includes a read only memory and a recirculating memory, said recirculating memory being coupled between the input and output of said read only memory.

4. The method of providing flaw information in accordance with the position of flaws occurring in a moving web of material being examined by a flaw detection system in which a source of radiation is scanned on a surface of the moving web of material for locating flaws thereon comprising the steps of

(a) dividing said moving web of material into lanes and generating lane signals in accordance with the position of the scan across said material,

(b) sorting the flaw signals in accordance with the lane in which they occur,

(c) quantizing the number of flaws in a given lane and disabling a given lane for predetermined high flaw rates in that lane until the high flaw rate subsides for a predetermined interval of travel of said moving web of material, and

(d) providing down-web and cross-web position data for all flaws occurring on the material for all non-disabled lanes.

5. The method set forth in claim 4 for providing repeat flaw indications including steps of

(a) determining separation distances between a next succeeding flaw and prior flaws in a given lane,

(b) comparing said separation distances to a predetermined list of sizes,

(c) projecting future flaw locations when match is produced on said comparisons,

(d) testing each new defect in a given lane for coincidence with said projected future locations,

(e) generating a hit or miss list based on said testing step, and

(f) indicating the lane and size of a repeat flaw after a predetermined number of hits.

6. The method set forth in claim 5 including the step of resetting those lanes by removing all previous flaw data accumulation with respect to a particular flaw on the occurrence of a predetermined number of misses for that flaw in a given lane.