Infrared gas analyzer

• US 4,157,470 A
• Filed: 03/20/1978
• Issued: 06/05/1979
• Est. Priority Date: 03/24/1977
• Status: Expired due to Term

• Current Assignee: Yokogawa Electric Corporation
• Original Assignee: Yokogawa Electric Works Limited
• Inventors: Takahashi, Ryo, Matsuura, Tamizo, Muraki, Kaisuke, Kotaka, Mitsuo, Takahara, Hisao
• Primary Examiner(s): Willis, Davis L.
• Application Number:
  US05/888,223
• Time in Patent Office: 442 Days
• Field of Search: 250/343, 250/344, 250/345, 250/346
• US Class Current: 250/345
• CPC Class Codes: G01N 21/3504 for analysing gases, e.g. multi-gas analysis

Abstract

To detect the density of a measurement component of a sample gas, infrared light is directed alternately through a measuring-light optical system and a reference-light optical system to a heated light sensor. The measuring-light optical system includes a sample cell, a first filter for transmitting infrared rays of a fixed wave-length band, and a temperature compensating cell having a gas which has a part of its absorption wave-length band within the transmission wave-length band of the first filter but has a spectrum different from the spectrum of the measurement component. The reference-light optical system includes a light throttle, an interference cell having a gas containing a fixed density of the measurement component, an adjustable-length interference compensating cell filled with the sample gas, and a second filter for transmitting rays of a wave-length band that includes the major part of the transmission wave-length band of the first filter. The compensating cell is set such that, with temperature fluctuations, variations in absorption by the temperature compensating cell in the wave-length band of the first filter are equal to variations in absorption by the interference cell within the wave-length band of the second filter.

Claims

1. An infrared gas analyzer comprising:

an infrared source for emitting infrared rays;

a light sensor responsive to the quantity of light received;

means for directing some of said infrared rays through a measuring-light optical system to said light sensor, said measuring-light optical system comprising

a sample cell filled with a sample gas,

a first filter for principally transmitting infrared rays of a fixed wave-length band included within the absorption wave-length band of a measurement component, and

a temperature compensating cell enclosing a gas which has a part of its absorption wave-length band within the transmission wave length band of said first filter but having a spectrum different from the spectrum of said measurement component; and

means for directing others of said infrared rays through a reference-light optical system to said light sensor, said reference-light optical system comprising

an interference cell enclosing a gas containing a fixed density of said measurement component,

an interference compensating cell filled with the sample gas, and

a second filter for transmitting infrared rays of a wave-length band that includes the major part of the transmission wave-length band of said first filter.

2. The infrared gas analyzer as defined in claim 1, wherein at least one of said optical systems includes a light throttle for varying the relative amounts of infrared rays through said optical systems.

3. The infrared gas analyzer as defined in claim 1, wherein said interference compensating cell is adjustable for varying the length of the path of said infrared rays through said interference compensating cell.

4. The infrared gas analyzer as defined in claim 1, wherein one end of the interference compensating cell forms a window for transmission of infrared rays, and the interference cell is inserted hermetically into the other end thereof and is movable in the direction of insertion so as to change the length of the interference compensating cell.

5. The infrared gas analyzer as defined in claim 1, further comprising a detector equipped with a metallic block in which first and second light inlet ports intersect each other, wherein a light sensor is positioned at the intersection of the two light inlet ports, and the first and second filters are attached to the metallic block to close the first and second light inlet ports respectively, and temperature control means is provided for maintaining the metallic block at a fixed temperature.

6. The infrared gas analyzer as defined in claim 3, wherein each of said light inlet ports is conical.

7. The infrared gas analyzer as defined in claim 3, wherein measuring light is introduced into the first light inlet port and reference light is introduced into the second light inlet port alternately to obtain the light sensor output, and the a-c component of the light sensor output is used as a measurement signal, while the superposed a-c and d-c components is fed as an input to the temperature control means.

8. A method of analyzing a gas to determine the density of a measurement component of the gas, said method comprising the steps of:

providing a measuring-light optical system between an infrared ray source and a light sensor, said measuring-light optical system including a sample cell, a first filter for principally transmitting infrared rays of a fixed wave-length band included within the absorption wave-length band of said measurement component, and a temperature compensating cell enclosing a gas which has a part of its absorption wave-length band within the transmission wave-length band of said first filter but has a spectrum different from the spectrum of said measurement component;

providing a reference-light optical system between said infrared ray source and said light sensor, said reference-light optical system including an interference cell enclosing a gas containing a fixed density of said measurement component, an interference compensating cell, and a second filter for transmitting infrared rays of a wave-length band that includes the major part of the transmission wave-length band of the first filter;

setting the length of the temperature compensating cell and the density of the gas therein so that, with temperature fluctuation, variations in the absorption by the temperature compensating cell within the wave-length band of said first filter equals variations in absorption by the interference cell within the wave-length band of said second filter;

introducing a gas without infrared absorption as a sample gas in both said sample cell and said interference compensating cell, and setting the relative amounts of light passing through said respective optical systems so that the difference between the quantities of light received at the sensor from said optical systems becomes a fixed value;

supplying a sample gas containing an interference component but not a measurement component as a sample gas in both said sample cell and said interference compensating cell, and setting the length of said interference compensating cell relative to said sample cell so that the difference between the quantities of light received at said sensor from said optical systems becomes said fixed value;

supplying a sample gas having an unknown density of said measurement component to both said sample cell and said interference compensating cell and detecting the difference between the quantities of light received at said light sensor from said optical systems.