Circuit arrangement for testing operating and/or capacity conditions in automotive vehicles

• US 4,162,478 A
• Filed: 11/11/1976
• Issued: 07/24/1979
• Est. Priority Date: 11/11/1975
• Status: Expired due to Term

• Current Assignee: Bayerische Motoren Werke AG
• Original Assignee: Bayerische Motoren Werke AG
• Inventors: Huber, Manfred, Kapfhammer, Karl, Krappel, Alfred, Schweiger, Erwin, Jochmann, Franz
• Primary Examiner(s): Waring, Alvin H.
• Application Number:
  US05/740,941
• Time in Patent Office: 985 Days
• Field of Search: 340/52 F, 340/52 R, 340/412, 340/411, 340/413, 340/414, 340/415, 340/214, 340/514, 340/517, 307/10 R, 324/51, 324/133
• US Class Current: 340/459
• CPC Class Codes: B60Q 11/00 Arrangement of monitoring devices for devices provided for in groups B60Q1/00 - B60Q9/00
• CPC Class Codes: B60T 17/225 brake fluid level indicators level indication in general G01F; H01H
• CPC Class Codes: F16D 66/022 indicating that a lining is worn to minimum allowable thickness
• CPC Class Codes: G07C 5/0816 Indicating performance data, e.g. occurrence of a malfunction

Abstract

In order to test at least one of the operating and capacitating conditions of an automotive vehicle, plural parallel circuits are included in a test circuit associated with sensors for each condition to be tested. These parallel circuits contain at least one pilot lamp and at least one switching unit. The switching unit may have simple switch contacts or may contain an electronic switching element. During normal operating conditions, the switching units are closed to provide a conductive path therethrough. During non-normal operating conditions and/or capacity conditions, the switching units open. For testing any condition, an individual test switch, which energizes each pilot lamp in the plural parallel circuits, is connected in series with the switching contacts and/or the conductive electronic switching elements of the switch units and with the pilot lamps in the plural circuits.

Claims

1. A circuit for testing operating and capacity conditions of an automotive vehicle comprising plural parallel circuits each containing at least one pilot lamp and switching means operable in accordance with an operating or capacity condition, and a single test switch to simultaneously energize said pilot lamps independently of vehicle operation, wherein each of said switching means is connected in series with at least one pilot lamp and with said single test switch, and wherein each of said switching means is electrically conductive during normal operating and capacity conditions.

2. A circuit according to claim 1, wherein said switching means includes switching contacts.

3. A circuit according to claim 2, wherein said switching means further include transistor switching elements.

4. A circuit according to claim 3, wherein said transistor switching elements comprise at least one n-p-n transistor, the collector-emitter path of which is connected in series with a pilot lamp and switching contacts of said test switch, and the base of which is connected via at least one pickup element forming a conductor section in the normal condition to a switching contact of said test switch.

5. A circuit according to claim 1, wherein said single test switch is a single-pole switch, and said switching means connect a conductive line of said parallel circuits to a ground pole of the vehicle power supply, while said parallel circuits are further connected to a switching contact of said single-pole test switch, a second switching contact of said test switch being connected to a switchable pole of the vehicle power supply.

6. A circuit according to claim 5, wherein said switching means include an n-p-n transistor, the collector-emitter path of which is connected in series with a pilot lamp and switching contacts of said test switch, and the base of which is connected via at least one pickup element forming a conductor section in the normal condition to a switching contact of said test switch.

7. A circuit according to claim 5, wherein said switching means include a p-n-p transistor, the collector-emitter path of which is connected in series with a pilot lamp and switching contacts of said test switch, and the base of which is connected to a connecting line from a pole of the vehicle power supply to a current load and/or to a switching element placed in conductive condition by the current load in operation by the light and/or heat radiation thereof, said switching element being connected with its other terminal to the other pole of the vehicle power supply.

8. A circuit according to claim 5, wherein said switching means include a transistor switching element, conductive during normal operating and/or capacity conditions, and controlled by an operating and/or capacity condition pickup element, the circuit of which is open in the normal condition.

9. A circuit according to claim 8, comprising an n-p-n transistor, the collector-emitter path of which is connected in series with a pilot lamp and switching contacts of said test switch, and the base of which is connected, on the one hand, to the switching contacts of said test switch and, on the other hand, via switching contacts closed in case of abnormal operating and/or capacity conditions and pertaining to a pickup element, to a pole of the vehicle power supply, and wherein a resistor is connected between the test switch and said pole.

10. A circuit according to claim 1, wherein said switching means include a p-n-p transistor, the collector-emitter path of which is connected in series with a pilot lamp and switching contacts of said test switch, and the base of which is connected to a connecting line from a pole of the vehicle power supply to a current load and/or to a switching element placed in conductive condition by the current load in operation by the light and/or heat radiation thereof, said switching element being connected with its other terminal to the other pole of the vehicle power supply.

11. A circuit according to claim 1, wherein said switching means include a transistor switching element, conductive during normal operating and/or capacity conditions, and controlled by an operating and/or capacity condition pickup element, the circuit of which is open in the normal condition.

12. A circuit according to claim 11, comprising an n-p-n transistor, the collector-emitter path of which is connected in series with a pilot lamp and switching contacts of said test switch, and the base of which is connected, on the one hand, to the switching contacts of said test switch and, on the other hand, via switch contacts closed in case of abnormal operating and/or capacity conditions and pertaining to a pickup element, to a pole of the vehicle power supply, and wherein a resistor is connected between the test switch and said pole.

13. A circuit arrangement according to claim 12, wherein a flasher unit is interposed in the connection to one of the poles of the vehicle power supply, said pilot lamp being connected in parallel to directional blinker lamps.

14. A circuit according to claim 1, wherein a circuit including said switching means for a pilot lamp associated with an operating and/or capacity condition essential to the operation of the automotive vehicle is connected to one pole of the vehicle power supply in case of an abnormal condition by way of switching contacts of said switching means, said circuit being connected, in the rest position of said test switch, to the other pole of the vehicle power supply by way of break contacts of said test switch and/or by way of transistor switching elements controlled by said test switch.

15. A circuit according to claim 1, wherein said switching means include transistor switching elements.

16. In a circuit for testing operating and capacity conditions of an automotive vehicle of the type comprising plural parallel circuits, each including a pilot lamp and sensing means for sensing an operating or capacity condition, the improvement comprising means including a single test switch to simultaneously energize said pilot lamps independently of vehicle operation for testing failure of said pilot lamp and said sensing means, as well as testing said operating or capacity condition.

17. A circuit according to claim 16, wherein said pilot lamp of each parallel circuit and said single test switch are connected in series.

18. A circuit according to claim 16, wherein switching means are associated with said sensing means to maintain each said parallel circuit in conductive state during normal operating or capacity conditions, said switching means being connected in series with said pilot lamp and said single test switch.

19. A circuit according to claim 16, wherein said switching means include switching contacts and transistor switches.

20. A circuit according to claim 16, wherein said sensing means include level pickup elements, conductive loops, and light and/or heat detector elements.