Process and apparatus for automatically realizing Kohler's principle of illumination

• US 4,163,150 A
• Filed: 09/28/1977
• Issued: 07/31/1979
• Est. Priority Date: 10/01/1976
• Status: Expired due to Term

• Current Assignee: Ernst Leitz Wetzlar GmbH (ACM Project Development Co.)
• Original Assignee: Ernst Leitz Wetzlar GmbH (ACM Project Development Co.)
• Inventors: Stankewitz, Hans-Werner
• Primary Examiner(s): Nelms, David C.
• Assistant Examiner(s): Hostetter, Darwin R.
• Application Number:
  US05/837,402
• Time in Patent Office: 671 Days
• Field of Search: 250/201, 250/205, 350/87, 350/40, 350/17
• US Class Current: 250/205
• CPC Class Codes: G02B 21/08 Condensers

Abstract

A process and apparatus is disclosed for automatically realizing Kohler'"'"'s Principle of Illumination in microscopes and the like in which the illumination means of the microscope is adjusted to fully take Kohler'"'"'s Principle of Illumination into account. Optimization is achieved by sensing the extent of illumination, preferably with photoelectric type sensors, which generate signals proportional to the brightness of illumination. The signals are converted into control signals in a converter stage which in turn control motor means which serve to adjust the openings of at least one diaphragm and/or the focal length of an illumination pancratics in the system. The sensing means are adjustably positioned so that it may be moved depending on the objective and magnification used.

Claims

1. A process for automatically adjusting the illumination system of a microscope having a variable magnification system which comprises the steps of:

(a) measuring the extent of illumination of the viewable portion of the viewing plane or planes conjugated thereto with a sensing means which emits a measurement signal;

(b) converting said measurement signal into a control signal; and

(c) feeding said control signal to adjustment means for automatically adjusting said degree of illumination in accordance with Kohler'"'"'s Principle in response to the magnification chosen, by varying at least one of (i) a diaphragm or (ii) the focal length.

2. The process as defined in claim 1, wherein said microscope comprises a plurality of objectives for varying said magnification, said process further comprising sensing the degree of illumination at the edge of said viewable portion of said viewing plane for each objective.

3. The process as defined by claim 1, wherein said microscope comprises at least one of an aperture diaphragm and a luminous field diaphragm and said process further comprises the step of adjusting said degree of illumination by adjustment means which comprise means for varying the setting of at least one of said aperture diaphragm and said luminous field diaphragm.

4. The process as defined by claim 3, wherein said microscope comprises both an aperture diaphragm and a luminous field diaphragm and said adjustment means adjusts both of said diaphragms in response to signals received from said converting means.

5. The process as defined by claim 1, comprising measuring said illumination in the viewable plane of the viewing portion of said microscope or in a plane conjugated thereto.

6. The process as defined by claim 1 wherein said sensing means is a photoelectric senser.

7. The process as defined by claim 1, wherein said microscope comprises an illumination means having an adjustable focal length and said adjustment means varies said focal length in response to said control signals in accordance with the Kohler'"'"'s Principle.

8. The process as defined in claim 1, wherein said sensing means measures the brightness of the illumination in the luminous field diaphragm, the aperture diaphragm plane or planes conjugated thereto.

9. A variable magnification microscope comprising:

(a) an illumination means for illuminating an object to be viewed;

(b) a sensing means for sensing the image brightness of said illumination provided by said illumination means and for emitting a signal corresponding to said brightness of illumination;

(c) a converter means for converting said signals received from said sensing means so as to generate control signals for automatically adjusting the illumination in response to the magnification of the microscope in accordance with Kohler'"'"'s Principle, by varying at least one of (i) a diaphragm or (ii) the focal length.

10. The microscope as defined by claim 9, comprising a luminous field diaphragm plane, an aperture diaphragm plane and planes conjugated thereto and wherein diaphragms are provided in at least on of said planes, converter means being operatively connected to said diaphragm for adjusting said diaphragms in response to said illumination.

11. The microscope as defined by claim 10, wherein said diaphragm is variable for adjusting the amount of illumination in each of said planes.

12. The microscope as defined by claim 10, wherein said sensing means comprises at least one photoelectric sensor located in said luminous field diaphragm plane or in a plane conjugated thereto for sensing the brightness of said illumination, said photoelectric sensors emitting signals proportional to said brightness which may be converted into control signals for adjusting said diaphragms in response to said illumination.

13. The microscope as defined by claim 10, wherein said sensing means are supported by positioning means for automatically positioning said sensing means at the edge of said viewable portion of said viewing plane.

14. The microscope as defined by claim 9, wherein said sensing means are supported by positioning means for automatically positioning said sensing means at the edge of said viewable portion of said viewing plane.

15. The microscope as defined by claim 9, which comprises a luminous field diaphragm plane and wherein said sensing means comprises at least one photoelectric system located in said viewable portion of said viewing plane or in a plane conjugated thereto, said photoelectric system being selected such that the output signals from said sensing means are proportional to the image brightness within said plane.

16. The microscope as defined by claim 15, wherein said sensing means are supported by positioning means for automatically positioning said sensing means at the edge of said viewable portion of said viewing plane.

17. The microscope as defined by claim 15, which comprises at least two photoelectric systems, said systems being arranged such that one of said systems is at the edge of said viewable portion of said viewing plane or of a plane conjugated thereto and the other photoelectric system is arranged in the center of said viewable portion of said viewing plane or in a plane conjugated thereto.

18. The microscope as defined by claim 9, which comprises an aperture diaphragm and a sensing means comprising two sensors;

a first sensor being provided at the edge of the viewable portion of the viewing plane of said microscope and a second sensor being arranged in the plane of said aperture diaphragm or in a plane conjugated thereto.

19. The microscope as defined by claim 18, wherein said first sensor is connected to a converter means operatively connected to a luminous field diaphragm for sensing the extent of illumination in said viewing plane and adjusting said luminous field diaphragm in accordance with Kohler'"'"'s Principle and said second sensor is connected to a converter means operatively connected to said aperture diaphragm for sensing the extent of illumination in said diaphragm plane and adjusting said aperture diaphragm in accordance with Kohler'"'"'s Principle.

20. The microscope as defined by claim 19, wherein said sensors are photoelectric sensors.

21. The microscope as defined by claim 20, wherein said microscope comprises an objective and said photoelectric receiver in said aperture diaphragm plane has a photosensitive surface which is greater than the pupil of said objective.

22. The microscope as defined by claim 9, wherein said converter means are connected to means for varying the focal length of the illumination system.