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Arrangement for examining objects

  • US 4,163,991 A
  • Filed: 05/08/1978
  • Issued: 08/07/1979
  • Est. Priority Date: 05/10/1977
  • Status: Expired due to Term
First Claim
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1. A device for examining objects for regions whose emission, absorption or reflection deviates from that of the surrounding regions, comprising:

  • scanning means which scan the object, line-by-line, and supply a scanning signal depending on the emission, absorption or reflection;

    means for generating a binary identification signal when a region whose emission, absorption or reflection considerably deviates from that of the surrounding regions is scanned;

    coding means which produce binary sample signals corresponding to samples of said identification signal at a plurality of discrete positions on said scan lines, the logic level of said sample signals assuming a first value when the identification signal is present and a second value when the identification signal is not present;

    a store connected to receive the sample signals;

    a gate means which produce a relative shift of at least one discrete position between sample signals associated with successive lines and which combine said shifted sample signals by ORing logic levels of said first value; and

    evaluation means which process the result of said combination and which activate a signal upon the occurrence therein of several consecutive logic levels associated with the identification signal.

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