Determining semiconductor characteristic
First Claim
1. A method for determining carrier concentration as a function of depth in a semiconductor material comprising mounting the semiconductor material in an electrolytic cell so that electrolyte in the cell is in contact with the semiconductor material, applying a d.c. voltage to the material and electrolyte to simultaneously form a Schottky diode between the material and electrolyte and bring about anodic etching at the surface of the material with the aid of the electrolyte, applying an a.c. voltage to said Schottky diode, and measuring the capacitance of the depletion layer of the Schottky diode.
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Abstract
The electrochemical measuring technique of the present invention employs, as the barrier material, a concentrated electrolyte, which also forms a medium for the controlled dissolution of a surface of the semiconductor so as to provide a continuous depth profile. The depth profile characteristic may be determined by capacitance-voltage measurements on n-type bulk GaAs, using KOH as the electrolyte.
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Citations
5 Claims
- 1. A method for determining carrier concentration as a function of depth in a semiconductor material comprising mounting the semiconductor material in an electrolytic cell so that electrolyte in the cell is in contact with the semiconductor material, applying a d.c. voltage to the material and electrolyte to simultaneously form a Schottky diode between the material and electrolyte and bring about anodic etching at the surface of the material with the aid of the electrolyte, applying an a.c. voltage to said Schottky diode, and measuring the capacitance of the depletion layer of the Schottky diode.
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