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Element analyzer exploiting a magneto-optic effect

  • US 4,171,912 A
  • Filed: 09/29/1977
  • Issued: 10/23/1979
  • Est. Priority Date: 10/04/1976
  • Status: Expired due to Term
First Claim
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1. An element analyzer exploiting a magneto-optic effect comprising:

  • a space for a sample material, means for applying a magnetic field to said sample material,a light source arranged on an optical axis,a polarizer arranged on the optical axis between said light source and said space for said sample material,an analyzer arranged on the optical axis next to the space for said sample material and disposed on the side of said space opposite that on which said polarizer is arranged,spectro analyzing means arranged on the optical path of the light emergent from said analyzer which acts on the light which has passed through said space for the sample material, anddetector means for detecting light emergent from said spectro analyzing means, including a detector for detecting the light and means for discriminating between a signal obtained at the output of said detector having a single peak and a signal having multiple peaks.

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