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Chemical-sensitive field-effect transistor

  • US 4,180,771 A
  • Filed: 12/02/1977
  • Issued: 12/25/1979
  • Est. Priority Date: 12/02/1977
  • Status: Expired due to Term
First Claim
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1. A field-effect transistor device for measuring a chemical property of a substance to which the device is exposed, comprising:

  • a semiconductor substrate;

    a source region in contact with the substrate and located near a first surface of the substrate;

    a drain region in contact with the substrate, located near the first surface of the substrate and spaced apart from the source region;

    a gate insulator which overlies a first area of the first surface of the substrate between the source and drain regions;

    three electrodes for providing a separate electrical connection to the source region, drain region, and gate insulator; and

    a layer of chemically sensitive material which overlies a second area of the substrate separate from the first area and which has an active surface for exposure to the substance, said chemically sensitive material connected in series with the substrate and located on the opposite side of the substrate from the gate insulator, said second area located sufficiently near the source and drain regions so that exposure of the chemically sensitive material to the substance results in a change of the electrical conductance between the source and drain regions.

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