×

Method of and apparatus for automatic measurement of impedance or other parameters with microprocessor calculation techniques

  • US 4,196,475 A
  • Filed: 09/02/1976
  • Issued: 04/01/1980
  • Est. Priority Date: 09/02/1976
  • Status: Expired due to Term
First Claim
Patent Images

1. A method of automatic instrument measurement of impedance, that comprises, measuring voltages across an unknown impedance element and a standard element connected to receive the same a.c. current to produce voltage signals the values of which are meaningless of themselves in terms of impedance values but that have theoretical ratio formulae relationship to the impedance values;

  • converting the voltage signal values into corresponding digital quantities;

    employing a microprocessor to automatically electronically calculate the ratio of said quantities in accordance with said formulae; and

    indicating the calculated ratios to provide impedance measurement of said unknown element.

View all claims
  • 3 Assignments
Timeline View
Assignment View
    ×
    ×