Admittance sensing probe having multiple sensing elements

• US 4,208,909 A
• Filed: 11/24/1978
• Issued: 06/24/1980
• Est. Priority Date: 11/24/1978
• Status: Expired due to Term

• Current Assignee: Drexelbrook Controls, Inc.
• Original Assignee: Drexelbrook Controls, Inc.
• Inventors: Kramer, L. Jonathan, Maltby, Frederick L.
• Primary Examiner(s): Woodiel, Donald O.
• Application Number:
  US05/963,300
• Time in Patent Office: 578 Days
• Field of Search: 73/304 C, 73/304 R, 361/284
• US Class Current: 73/304.00C
• CPC Class Codes: G01F 23/266 measuring circuits therefor
• CPC Class Codes: G01F 23/268 mounting arrangements of probes

Abstract

A single, elongated admittance sensing probe element comprises an elongated probe structure including a conductive level measuring probe electrode and a conductive composition probe electrode longitudinally spaced from the level measuring probe electrode closer to one end of the probe. A conductive shield extends between the level measuring and composition probe elements and beyond the composition probe element at the end of the probe. The entire structure is enclosed within an insulating material. In one embodiment, a cylindrical ground electrode or shield is mounted around the probe structure.

Claims

1. An admittance sensing probe adapted to sense the level of materials within a vessel comprising:

a condition measuring probe electrode comprising a conductive material;

a compensating probe electrode comprising a conductive material;

a conductor connected to one of said electrodes;

conductive shield means interposed between said conductor and said other of said electrodes, said conductive shield means also being interposed between said conductor and said materials within said vessel;

insulating means separating said condition measuring probe electrode, said compensating probe electrode, and said conductive shield means; and

electrical connection means adapted to connect said shield means to circuitry for maintaining the potential of said conductive shield means substantially the same as said compensating probe electrode and said condition measuring probe electrode.

2. The admittance sensing probe of claim 1 wherein said conductive shield means is also interposed between said probe electrodes.

3. The admittance sensing probe of claim 2 wherein said conductive shield means extends beyond said one probe electrode in a direction away from said other probe electrode.

4. The admittance sensing probe of claim 1 wherein said probe is elongated and said composition probe electrode and said level measuring probe electrode are mutually longitudinally spaced along the probe.

5. The admittance sensing probe of claim 4 wherein said longitudinal length of said composition probe electrode is short relative to said measuring probe electrode.

6. The admittance sensing probe of claim 5 wherein said shield means and said conductor extend longitudinally along the probe.

7. The admittance sensing probe of claim 6 wherein said shield means is also physically interposed between said compensating probe electrode and said condition measuring probe electrode.

8. The admittance sensing probe of claim 7 wherein said shield means extends longitudinally beyond said compensating probe electrode.

9. The admittance sensing probe of claim 6 wherein said shield means is physically interposed between said compensating probe electrode and said condition measuring probe electrode and said shield means extends longitudinally beyond said compensating probe electrode.

10. The admittance sensing probe of claim 4 wherein:

said compensating probe electrode is substantially cylindrical;

said condition measuring probe electrode is substantially cylindrical;

said conductor extends through said condition measuring probe electrode and compensating probe electrode in a direction generally parallel with the axis of said condition measuring probe electrode; and

said shield means also extends through said condition measuring probe electrode generally parallel with the axis of said condition measuring probe electrode.

11. The admittance sensing probe of claim 1 including circuit means for combining the admittance measured at said condition measuring electrode with the admittance measured at said compensation probe electrode for detecting the level of material corrected for variations in the nature of the material.

12. The admittance sensing probe of claim 1 wherein said shield means is driven at substantially the same potential as said condition measuring probe electrode and said compensating probe electrode.

13. The admittance sensing probe of claim 1 wherein said conductive shield means extends beyond said one probe electrode in a direction away from said other probe electrode and also extends beyond said other probe electrode in an opposing direction away from said one probe electrode and said other probe electrode.

14. The admittance sensing probe of claim 13 wherein said probe is elongated and said compensation probe electrode is located nearer one end and said condition measuring probe electrode is located nearer another end.

15. The admittance sensing probe of claim 14 wherein said shield means extends beyond said condition measuring probe electrode in said opposing direction.

16. The admittance sensing probe of claim 15 further comprising a coaxial cable having an inner conductor and an outer conductor wherein said shield means includes the outer conductor of a coaxial cable and the inner conductor is connected to said compensating probe electrode.

17. The admittance sensing probe of claim 16 including additional shield means connected to said outer conductor at said one end of said probe.

18. An elongated admittance sensing probe adapted to sense the level of materials within a vessel comprising:

a condition measuring probe electrode comprising a conductive material nearer one end of said probe;

a compensating probe electrode comprising a conductive material nearer another end of said probe;

conductive shield means interposed between said condition measuring probe electrode and said compensating probe electrode;

insulating means mutually electrically insulating said condition measuring electrode, said compensating electrode and said shield means; and

electrical connection means adapted to connect said conductive shield means to circuitry for driving said conductive shield means at substantially the same potential as said condition measuring probe electrode and said compensating probe electrode.

19. The admittance sensing probe of claim 18 further comprising additional conductive shield means located adjacent one end of said probe and longitudinally displaced from said compensating probe electrode such that said compensating probe electrode is located between said additional shield means and said condition measuring probe electrode.

20. An elongated admittance sensing probe adapted to sense the level of materials within a vessel comprising:

a condition measuring probe electrode comprising a conductive material;

a compensating probe electrode comprising a conductive material longitudinally displaced from said condition measuring probe electrode;

conductive shield means located adjacent one end of said probe and longitudinally displaced from said compensating probe electrode such that said compensating probe electrode is located between said shield means and said condition measuring probe electrode; and

insulating means mutually separating said condition measuring probe electrode, said compensating probe electrode and said conductive shield means, said insulating means also separating said materials from said condition measuring said conductive shield means with substantially the same thickness thereof.

21. An admittance sensing probe adapted to sense the level of materials within a vessel comprising:

a condition measuring probe electrode comprising a conductive material;

a compensating probe electrode comprising a conductive material longitudinally displaced from said condition measuring probe electrode;

conductive shield means interposed between said condition measuring probe electrode and said compensating probe electrode; and

insulating means mutually separating said condition measuring probe electrode, said compensating probe electrode in said conductive shield means, said insulating means also separating said materials from said condition measuring probe electrode, said compensating probe electrode and said conductive shield means with substantially the same thickness thereof.

22. An admittance sensing probe adapted to sense the level of materials within a vessel comprising:

a condition measuring probe electrode comprising a conductive material;

a compensating probe electrode comprising a conductive material;

a conductor connected to one of said electrodes;

conductive shield means interposed between said conductor and said other of said electrodes, said conductive shield means also being interposed between said conductor and said materials within said vessel; and

insulating means tightly covering said compensating probe electrode and said condition measuring probe electrode.

23. The admittance sensing probe of claim 22 wherein said insulating means comprises a high molecular weight polymer of vinylidene fluoride having a dielectric constant in excess of 4.

24. The admittance sensing probe of claim 22 further comprising a coaxial cable including an inner conductor and an outer conductor, said conductor comprising the inner conductor of said cable and said shield means comprising the outer conductor of said cable.

25. The admittance sensing probe of claim 22 wherein said shield means extends radially outwardly to a position between said compensating probe electrode and said condition measuring probe electrode.

26. The admittance sensing probe of claim 22 wherein said shield means extends beyond said compensating probe electrode away from said condition measuring electrode.