Apparatus for detecting defects in patterns

• US 4,209,257 A
• Filed: 07/05/1978
• Issued: 06/24/1980
• Est. Priority Date: 07/15/1977
• Status: Expired due to Term

• Current Assignee: Nippon JIDO Seigyo Limited
• Original Assignee: Nippon JIDO Seigyo Limited
• Inventors: Awamura, Daikichi, Uchiyama, Yasushi
• Primary Examiner(s): Corbin, John K.
• Assistant Examiner(s): Rosenberger, R. A.
• Application Number:
  US05/922,216
• Time in Patent Office: 720 Days
• Field of Search: 356/71, 356/394, 356/398
• US Class Current: 356/394
• CPC Class Codes: G01B 11/2433 for measuring outlines by shadow casting
• CPC Class Codes: G01N 21/95607 using a comparative method
• CPC Class Codes: G06V 20/66 Trinkets, e.g. shirt buttons or jewellery items recognising microscopic objects G06V20/69

Abstract

An apparatus for detecting defects in patterns, particularly defects in chip patterns of photomasks for use in manufacturing semiconductor integrated circuits comprising optically scanning means for scanning in a raster scan mode identical portions of the two patterns to be compared with each other by means of a pair of lens systems to produce a pair of picture signals each corresponding to a respective one of the scanned pattern portions and a defect signal producing means for receiving said pair of picture signals and producing a defect signal as a difference between the two picture signals. A variable delay circuit is provided between the optically scanning means and defect signal producing means to correct or compensate for deviations in the two picture signals due to differences in optical characteristics between the two lens system such as distortion and magnification. The variable delay circuit delays the picture signals for a delay time which is varied as a function of a position on the raster.

Claims

1. An apparatus for detecting defects in patterns, particularly defects in chip patterns of photomasks for use in manufacturing semiconductor integrated circuits comprising

optically scanning means including first and second lens systems each of which projects a scanning light spot onto a respective one of two identical portions of two patterns to be compared with each other and for scanning simultaneously said portions in a two dimensional scanning mode to produce first and second picture signals corresponding to said two identical pattern portions, respectively;

delay means for delaying at least one of said first and second picture signals for a delay time which is varied as a function of a position on the two dimensional scanning plane so as to decrease a relative deviation of the picture signals mainly due to a difference in distortion and/or magnification between the first and second lens systems; and

means for receiving output picture signals from said delay means and forming a difference between these picture signals to produce a defect signal.

2. An apparatus according to claim 1, wherein said delay means comprise a variable delay circuit and a control circuit which supplies to the variable delay circuit a delay time control signal which varies as a function of a position on the two dimensional scanning plane.

3. An apparatus according to claim 2, wherein said variable delay circuit comprises a pi-type circuit network including inductors and variable capacitance diodes and said delay time control signal is applied to the variable capacitance diodes as a control voltage signal.

4. An apparatus according to claim 2, wherein said control circuit produces the delay time control signal having a repetition period equal to a horizontal scanning period so as to correct the deviation in the horizontal direction.

5. An apparatus according to claim 3, wherein said variable delay circuit comprises

a picture input terminal for receiving the picture signal to be delayed;

a plurality of delay elements connected to said picture signal input terminal and each having a fixed delay time equal to a fraction of the horizontal scanning period;

a plurality of gates having respective picture signal input terminals connected to a respective one of said picture signal input terminal and the output terminals of the delay elements, respective output terminals and respective control input terminals;

a picture signal output terminal commonly connected to output terminals of said gates to produce the delayed picture signal; and

gate pulse producing means for receiving the delay time control signal and supplying gate pulses to said control input terminals of given gates which should be made conductive in accordance with an amplitude of the delay time control signal.

6. An apparatus according to claim 5, wherein said gate pulse producing means comprises

an analog to digital converter for converting the analog delay time control signal from the control circuit into a digital signal;

and

a decoder for decoding said digital signal to produce an output signal at a given one of a plurality of output terminals.

7. An apparatus according to claim 6, wherein said delay time control signal is of a substantially parabolic waveform having a period equal to the horizontal scanning period so as to correct the deviation in the horizontal direction due to the difference in distortion between the two lens systems.

8. An apparatus according to claim 5, wherein said delay time control signal is of a substantially sawtooth waveform having a repetition period equal to the horizontal scanning period so as to correct the deviation in the horizontal direction due to the difference in magnification between the two lens systems.

9. An apparatus according to claim 7, wherein said delay time control signal further includes in superimposition thereon a substantially sawtooth waveform having a repetition period equal to the horizontal scanning period so as to correct the deviation in the horizontal direction due to the difference in distortion and magnification between the two lens systems.

10. An apparatus according to claim 4, wherein said variable delay circuit comprises

a picture signal input terminal for receiving the picture signal to be delayed;

a plurality of delay elements connected to the picture signal input terminal and each having a delay time equal to a fraction of the horizontal scanning period;

a plurality of gates having respective picture signal input terminals each connected to a respective one of the picture signal input terminal and output terminals of the delay elements, respective output terminals and respective control input terminals;

an output terminal commonly connected to the output terminals of the gates; and

gate pulse producing means for receiving the delay time control signal and producing gate pulses at a plurality of output terminals which pulses divide the horizontal scanning period into a plurality of fractional periods, the control input terminals of given gates being fixedly connected to the output terminals of the gate pulse producing means so as to obtain at said output terminal a picture signal which has been desirably delayed.

11. An apparatus according to claim 10, wherein said gate pulse producing means comprises

a plurality of cascade connected multivibrators to which is supplied the delay time control signal as a trigger pulse having a repetition period of the horizontal scanning period.

12. An apparatus according to claim 2, wherein said delay time control signal has a repetition period equal to a vertical scanning period of the two dimensional scan so as to correct the deviation in the vertical direction.

13. An apparatus according to claim 12, wherein said variable delay circuit comprises

an input terminal for receiving the picture signal to be delayed;

a plurality of delay elements connected to said input terminal and each having a delay time equal to an integer multiple of the horizontal scanning period;

a plurality of gates having input terminals each connected to a respective one of said picture signal input terminal and output terminals of said delay elements, respective output terminals and respective control signal input terminals;

a picture signal output terminal commonly connected to the output terminals of the gates; and

gate pulse producing means for receiving the delay time control signal and supplying gate pulses to given gates which sould be made conductive in accordance with the amplitude of the delay time control signal.

14. An apparatus according to claim 13, wherein said gate pulse producing means comprise

an analog to digital converter for converting the analog delay time control signal into a digital signal, and

a decoder for receiving the digital signal and producing an output signal at a given one of a plurality of output terminals.

15. An apparatus according to claim 13, wherein said delay time control signal is of a sawtooth waveform having a period of the horizontal scanning period and having an amplitude which varies during the vertical scanning period so as to correct the deviation in the vertical direction due to the difference in distortion between the two lens systems.

16. An apparatus according to claim 13, wherein said delay time control signal is of a substantially sawtooth waveform having a period equal to the vertical scanning period so as to correct the deviation in the vertical direction due to the difference in magnification between the two lens systems.

17. An apparatus according to claim 15, wherein said delay time control signal further includes in superimposed thereon a substantially sawtooth waveform having a period equal to the vertical scanning period so as to correct the deviation in the vertical direction due to the difference in distortion and magnification between the two lens systems.

18. An apparatus according to any one of the preceding claims 1 to 17, wherein said optically scanning means comprises a carrier table on which is placed a specimen having a number of identical patterns and two identical portions of two patterns in the specimen are scanned simultaneously.

19. An apparatus according to claim 18, wherein said optically scanning means comprises a flying spot cathode ray tube for producing a raster scanning light spot and said two lens systems project simultaneously images of said scanning light spot onto the identical portions of the patterns.

20. An apparatus according to claim 1, wherein said defect signal producing means comprises a circuit for removing a pseudo-defect appearing in a vicinity of pattern contours.

21. An apparatus according to claim 20, wherein said pseudo-defect removing circuit comprises a delay circuit for delaying the defect signal and an AND gate for receiving the delayed and non-delayed defect signals.

22. An apparatus according to claim 20, wherein said pseudo-defect removing circuit comprises a circuit for producing a contour signal which represents a contour region having a given width and a control circuit for receiving said contour signal to decrease a defect detection sensitivity in said contour region.