Circuit board testing apparatus and method

• US 4,211,917 A
• Filed: 07/17/1978
• Issued: 07/08/1980
• Est. Priority Date: 07/17/1978
• Status: Expired due to Term

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Hofmann, George F.
• Primary Examiner(s): Malzahn, David H.
• Application Number:
  US05/925,302
• Time in Patent Office: 722 Days
• Field of Search: 235/302, 324/73 R, 324/73 AT, 324/73 PC, 324/158 F
• US Class Current: 714/724
• CPC Class Codes: G01R 15/002 Switches for altering the measuring range or for multitesters
• CPC Class Codes: G01R 31/2806 Apparatus therefor, e.g. test stations, drivers, analysers, conveyors G01R31/2805, G01R31/281, G01R31/2818 take precedence
• CPC Class Codes: G01R 31/31905 Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
• CPC Class Codes: G01R 31/31908 Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

Abstract

A system by which a plurality of different circuit boards can be reliably tested by a single testing apparatus having a plurality of test programs adapted for testing particular circuit boards. Each circuit board has a pair of non-circular keying pins, with each circuit board having its particular pair of pins arranged in a unique combination of angular positions. There is an inter-facing member connected between the circuit board to be tested and the testing apparatus. The inter-facing member has a pair of rotatably mounted indexing discs, each having a plurality of receptacles, and each receptacle having a particular angular orientation to receive a keying pin of a similar angular orientation. A particular circuit board can be mounted to the inter-facing unit by moving the two indexing discs to the appropriate location so that the appropriate receptacles of the two discs receive the two keying pins of that particular circuit board. When the indexing discs are in a position to receive a particular circuit board, this connects predetermined circuit elements to the test apparatus to provide an identifying signal to the test apparatus to indicate the particular circuit board which is connected to the inter-facing member. This signal insures that the test apparatus is arranged to utilize the proper test program for that particular circuit board.

Claims

1. A testing system comprising:

a. a testing apparatus

b. a plurality of units which are to be tested by said testing apparatus,

c. a plurality of keying means, each keying means being mounted to a related one of said units, with each keying means having a predetermined mating orientation unique to the unit to which that keying means is mounted,

d. a unit inter-facing member adapted and arranged to be connected to said testing apparatus and selectively connected to said units, said unit inter-facing member comprising;

1. a movable mating means mounted to said unit inter-facing member in a manner to be moveable to a plurality of mating locations, each mating location corresponding to a related one of said keying means, such that at any one of said mating locations the mating means is able to be matched to the corresponding keying means to engage that keying means in mating relationship and permit the unit inter-facing member to be connected to that unit having the keying means for which the mating means is matched,

2. a plurality of identifying circuit means provided by said inter-facing member, each of said circuit means corresponding to a related one of said units, and being arranged to generate an identifying signal for the unit to which that circuit means corresponds,

3. switch means connected to the plurality of circuit means and said testing apparatus, in a manner that with movement of said mating means to any particular mating location, said switch means connects to the testing apparatus the circuit means which corresponds to the unit having the keying means corresponding to that particular mating location,

whereby when a particular unit is connected to said inter-facing member to be tested by said testing apparatus, said mating means is necessarily moved to a mating location corresponding to the keying means of that particular unit, with the result that the circuit means corresponding to that particular unit transmits to the testing apparatus the signal identifying that particular unit, thus ensuring that the testing apparatus is able to perform a testing procedure appropriate to that particular unit.

2. The system as recited in claim 1, wherein each of said keying means comprises at least one non-circular keying element having a particular angular orientation, said mating means being mounted for rotation to various angular mating locations, each of which corresponds to a related one of the angular orientations of the keying elements.

3. The system as recited in claim 2, wherein said mating means comprises a rotatably mounted dial member having a plurality of mating elements spaced angularly on the dial member and moveable with said dial member to an indexing location for engagement with a related keying element.

4. The system as recited in claim 3, wherein said switching means comprises a rotatably mounted switching member having a plurality of angularly spaced contact locations for said circuit means, each of which corresponds to a related angular position of said dial member, in a manner that with a particular mating element at said indexing location, the switching member makes contact at the corresponding contact location.

5. The system as recited in claim 2, wherein said switching means comprises a rotatably mounted switching member having a plurality of angularly spaced contact locations for said circuit means, each contact location corresponding to a related angular location of the mating means, such that when the mating means is at a particular angular location, the switching member makes contact at the corresponding contact location.

6. The system as recited in claim 1, wherein:

a. each of said keying means comprises at least one non-circular keying element having a particular angular orientation,

b. said mating means comprises a rotatable dial member mounted to said inter-facing member for rotation to various angular mating locations, each of which corresponds to a related one of the angular orientations of the keying elements,

c. said switch means comprises a switch member connected to said dial member so as to be rotatable therewith to various angularly spaced contact points for said circuit means, each contact point corresponding to a related mating location and angular orientation of a related keying element,

d. each of said circuit means being connected to a related contact point corresponding to the particular keying element for which the dial member is positioned so as to place the switch member in engagement with the corresponding circuit means,

whereby when a particular unit is connected to the inter-facing member to be tested by the testing apparatus, the dial member is necessarily moved to a position such that the switch member is also rotated to a position to make contact with the circuit means corresponding to the unit being tested.

7. The system as recited in claim 1, wherein:

a. each of said keying means comprises a pair of non-circular keying elements, with the keying elements of each pair having a particular combination of angular orientation,

b. said mating means comprises a pair of rotatable dial members mounted to said inter-facing member for rotation to various angular mating locations, the locations of each dial member each corresponding to a related one of the angular orientations of the related keying element,

c. said switch means comprising two switching means, each connected to a related dial member so as to be rotatable therewith to various angularly spaced contact points for said circuit means, each contact point corresponding to a related mating location and angular orientation of a related keying element,

d. each of said circuit means comprising two sets of circuits, each circuit connected to and corresponding to a related contact point which in turn corresponds to the particular keying element for which the related dial element is positioned, so as to place the related switch member in engagement with the related corresponding circuit,

whereby when a particular unit is connected to the inter-facing member to be tested by the testing apparatus the two dial members are necessarily moved to position so that the two switch members are also rotated to positions to make contact with the two circuits corresponding to the unit being tested.

8. In a computerized testing system, comprising:

a. a plurality of units which are to be tested,

b. test system hardware to provide testing inputs to a unit being tested and receive test response from the unit being tested,

c. a computer having a plurality of test programs for various units to be tested with said computer being programed to selectively apply various test programs to various units being tested,

an improvement to ensure that the computer is applying the proper program to the unit to be tested, said improvement comprising;

a. a plurality of keying means, each keying means being mounted to a related one of said units, with each keying means having a predetermined mating orientation unique to the unit to which that keying means is mounted,

b. a unit inter-facing member adapted and arranged to be connected to said test system hardware and selectively connected to said units, said unit interfacing member comprising;

1. a moveable mating means mounted to said unit inter-facing member in a manner to be moveable to a plurality of mating locations, each mating location corresponding to a related one of said keying means, such that at any one of said mating locations the mating means is able to be matched to the corresponding keying means to engage that keying means in mating relationship and permit the unit inter-facing member to be connected to that unit having the keying means for which the mating means is matched,

10. In the computerized system of claim 8, wherein each of said keying means comprises at least one non-circular keying element having a particular angular orientation, said mating means being mounted to various angular mating locations, each of which corresponds to a related one of the angular orientations of the keying elements.

12. In the computerized system of claim 10, wherein said switch means comprises a rotatably mounted switching member having a plurality of angularly spaced contact locations for said circuit means, each of which corresponds to a related angular position of said dial member, in a manner that with a particular mating element at a said indexing location, the switching member makes contact at the corresponding contact location.

14. In the computerized system of claim 8, wherein

a. each of said keying means comprises at least one non-circular keying element having a particular angular orientation,

b. said mating means comprises a rotatable dial member mounted to said inter-facing member for rotation to various angular mating locations, each of which corresponds to a related one of the angular orientations of the keying elements,

c. said switch means comprises a switch member connected to said dial member so as to be rotatable therewith to various angularly spaced contact points for said circuit means, each contact point corresponding to a related mating location and angular orientation of a related keying element,

d. each of said circuit means being connected to a related contact point corresponding to the particular keying element for which the dial member is positioned so as to place the switch member in engagement with the corresponding circuit means,

whereby when a particular unit is connected to the inter-facing member to be tested by the testing apparatus, the dial member is necessarily moved to a position such that the switch member is also rotated to a position to make contact with the circuit means corresponding to the unit being tested.

15. In the computerized system of claim 8, wherein:

a. each of said keying means comprises a pair of non-circular keying elements, with the keying elements of each pair having a particular combination of angular orientation,

b. said mating means comprises a pair of rotatable dial members mounted to said inter-facing member for rotation to various angular mating locations, the locations of each dial member each corresponding to a related one of the angular orientations of the related keying element,

c. said switch means comprises two switching members, each connected to a related dial member so as to be rotatable therewith to various angularly spaced contact points for said circuit means, each contact point corresponding to a related mating location and angular orientation of a relating keying element,

d. each of said circuit means comprising two sets of circuits, each circuit connected to and corresponding to a related contact point which in turn corresponds to the particular keying element for which the related dial element is positioned, so as to place the related switch member in engagement with the related corresponding circuit,

whereby when a particular unit is connected to the inter-facing member to be tested by the testing apparatus the two dial members are necessarily moved to position so that the two switch members are also rotated to positions to make contact with the two circuits corresponding to the unit being tested.

18. The method as recited in claim 15 wherein:

a. each of said keying means comprises at least one non-circular keying element having a particular angular orientation,

b. said method further comprising rotating the mating means to an angular mating location corresponding to that of the keying means of the unit to be tested.

19. The method as recited in claim 15, wherein:

a. said mating means comprises a rotatable dial member rotatably mounted to the interfacing member, and said switch means comprises a switch member connected to the dial member so as to be rotatable therewith to various angularly spaced contact points for said circuit means,

b. said method further comprising rotating said dial member to the mating location matching the keying means of the unit being tested, and thus bringing said switching member into contact at a corresponding contact point to connect a particular circuit means identifying the unit being tested into contact with said test system hardware.

9. a plurality of identifying circuit means provided by said inter-facing member, each of said circuit means corresponding to a related one of said units, and being arranged to generate an identifying signal for the unit to which that circuit means corresponds,switch means connected to the plurality of circuit means and said test system hardware, in a manner that with movement of said mating means to any particular mating location, said switch means connects to the test system hardware the circuit means which corresponds to the unit having the keying means corresponding to that particular mating location,

whereby when a particular unit is connected to said interfacing member to be tested, said mating means is necessarily moved to a mating location corresponding to the keying means of that particular unit, with the result that the circuit means corresponding to that particular unit transmits to the computer the signal identifying the particular unit, thus ensuring that the test system hardware is able to perform a testing procedure appropriate to that particular unit.

11. In the computerized system of claim 9, wherein said mating means comprises a rotatably mounte dial member having a plurality of mating elements spaced angularly on the dial member and moveable with said dial member to an indexing location for engagement with a related keying element.

13. In the computerized system of claim 11, wherein said switch means comprises a rotatably mounted switching member having a plurality of angularly spaced contact locations, for said circuit means, each contact location corresponding to a related angular location of the mating means, such that when the mating means is at a particular angular location, the switching member makes contact at a related contact location.

16. A method of testing a plurality of units where there is:

a. test system hardware which is capable of providing testing inputs into a unit being tested and receiving test responses from the unit being tested,

b. a computer having a plurality of test programs for various units to be tested, with said computer being programmed to selectively apply various test programs to various units being tested,

c. each unit having a particular keying means, with the keying means of each unit having a predetermined mating orientation unique to the unit to which that keying means is mounted,

d. a unit inter-facing member adapted and arranged to be connected to the test system hardware and selectively connected to said units, said inter-facing member comprising;

17. a moveable mating means mounted to said inter-facing member in a manner to be moveable to a plurality of mating locations, each mating location corresponding to a related one of said keying means, such that at any one of said mating locations, the mating means is able to be matched to a corresponding keying means to engage that keying means in mating relationship and permit the unit inter-facing member to be connected to that unit having the keying means for which the mating means is matched,a plurality of circuit means, each of said circuit means corresponding to a related one of said units, and being arranged to generate an identifying signal for the unit to which the circuit means corresponds,a switch means operatively positioned between the plurality of circuit means and said testing apparatus, said switch means further being operatively connected to said mating means in a manner that with movement of said mating means to any particular mating location, said switch means connects to the testing apparatus circuit means which corresponds to the unit having keying means corresponding to that particular mating location,

said method being characterized in that it ensures that the proper test program is being applied to the particular unit being tested, said method comprising:

a. connecting the unit which is being tested to the inter-facing member by first moving the mating means to the mating location corresponding to the unit being tested, and connecting the unit being tested to the inter-facing member with the keying means of that unit mating with the moveable mating means,

b. identifying the unit which is to be tested in the computer and creating an interrogating signal to be transmitted to said inter-facing member to activate said identifying circuit means and provide an identifying signal corresponding to the unit being tested,

c. comparing the identifying signal corresponding to the unit connected to the inter-facing member with a unit identification placed in the computer.