Method and system for surface contouring

• US 4,212,073 A
• Filed: 12/13/1978
• Issued: 07/08/1980
• Est. Priority Date: 12/13/1978
• Status: Expired due to Term

• Current Assignee: Miles, Inc. (Bayer AG)
• Original Assignee: N Balasubramanian
• Inventors: Balasubramanian, N.
• Primary Examiner(s): Atkinson, Charles E.
• Assistant Examiner(s): Chin, Gary
• Application Number:
  US05/969,241
• Time in Patent Office: 573 Days
• Field of Search: 364/560, 364/562, 364/525, 356/374-376, 356/371, 356/358, 250/237 G, 250/558, 318/569
• US Class Current: 702/167
• CPC Class Codes: G01B 11/2527 with phase change by in-plane movement of the patern

Abstract

A method and system for surface contouring including: projecting a sinusoidal pattern on a surface to be tested; shifting the pattern in three steps at one-quarter period intervals of the sinusoidal pattern; sensing the intensity of the radiation from the test surface through a mask containing the same sinusoidal pattern at at least one position of the surface at each of the steps; storing the intensity sensed at each position at each step; for each of the positions adding the intensity of the first and third steps to produce a d.c. spatial frequency amplitude, subtracting the intensity of the third step from that of the first to obtain the cosinusoidal spatial frequency amplitude, and subtracting the intensity of the second step from the d.c. amplitude to produce the sinusoidal spatial frequency amplitude; combining the sinusoidal and cosinusoidal amplitudes to produce a trigonometric function of the phase angle of the projected sinusoidal pattern on the test surface and generating from the trigonometric function of the phase angle an output representative of the height of the surface at each position.

Claims

1. A surface contouring system comprising:

means for projecting a sinusoidal pattern on a surface to be tested;

means for shifting the pattern in three steps at one quarter period intervals of the sinusoidal pattern;

mask means containing the same sinusoidal pattern;

at least one detector for sensing, through said mask means, the intensity of the radiation from the test surface;

means for scanning each said detector at each step to obtain from each detector a signal representative of the level of intensity at each detector;

means for storing each intensity level derived from each detector at each of said steps;

means responsive to said storing means for determining the d.c. spatial frequency amplitude from the sum of the intensity levels derived from the first and third steps;

for determining the cosinusoidal spatial frequency amplitude from the difference between the intensity levels derived from the first and third steps and for determining the sinusoidal spatial frequency amplitude and intensity level derived from the second step;

means for combining said sinusoidal and cosinusoidal spatial frequency amplitudes to generate an amplitude representative of a trigonometric function of the phase angle of the radiation from the test surface; and

means, responsive to said amplitude representative of a trigonometric function of the phase angle, for generating an output representative of the height of the test surface at each position monitored by a said detector.

2. The system of claim 1 further including means for comparing the d.c. spatial frequency amplitude to twice the intensity level at the second step;

and means responsive to the former being greater than the latter for indicating that the sign of the height is positive, and responsive to the converse for indicating that the difference is negative

3. The system of claim 1 in which said means for storing includes means for converting from analog to digital signals, said signals representative of levels of intensity from said means for scanning.

4. The system of claim 1 in which said means for determining the d.c. spatial frequency amplitude includes means for adding, and said means for determining the cosinusoidal and sinusoidal spatial frequency amplitude each includes means for subtracting.

5. The system of claim 1 in which said means for combining includes means for dividing said sinusoidal by said cosinusoidal spatial frequency amplitude and said trigonometric function produced is the tangent.

6. The system of claim 1 in which said means for combining includes means for squaring said cosinusoidal amplitude, means for squaring said sinusoidal amplitude, and means for adding the squared cosinusoidal and sinusoidal amplitudes.

7. The system of claim 6 in which said means for combining further includes means for dividing said cosinusoidal amplitude squared by the sum of the squares of said cosinusoidal and sinusoidal amplitudes and the trigonometric function produced is the cosine squared.

8. The system of claim 6 in which said means for combining further includes means for dividing said sinusoidal amplitude squared by the sum of the squares of said cosinusoidal and sinusoidal amplitudes and the trigonometric function produced is the sine squared.

9. The system of claim 6 in which said means for combining further includes means for producing the square root of the sum of the squares of the cosinusoidal and sinusoidal amplitudes.

10. The system of claim 9 in which said means for combining further includes means for dividing said cosinusodial amplitude by the square root of the sum of the squares of said cosinusoidal and sinusoidal amplitudes and said trigonometric function produced is cosine.

11. The system of claim 9 in which said means for combining further includes means for dividing said sinusoidal amplitude by the square root of the sum of the squares of said cosinusoidal and sinusoidal amplitudes and said trigonometric function produced is sine.

12. The system of claim 1 in which said means for generating includes means for storing a table of trigonometric functions, means for comparing the generated trigonometric function with said table of functions, to determine the phase angle;

and means for combining that phase angle with the ratio of 2π

/period to generate the height of the surface.

13. A method of surface contouring comprising:

projecting a sinusoidal pattern on a surface to be tested;

shifting the pattern in three steps at one-quarter period intervals of the sinusoidal pattern;

sensing the intensity of the radiation from the test surface through a mask containing the same sinusoidal pattern at at least one position of the surface at each of said steps;

storing the intensity sensed at each position at each step;

for each of said positions, adding the intensity at the first and third steps to produce the d.c. spatial frequency amplitude, subtracting the intensity at the third step from that at the first to obtain the cosinusoidal spatial frequency amplitude and subtracting the intensity at the second step from the d.c. amplitude to produce the sinusoidal spatial frequency amplitude;

combining the sinusoidal and cosinusoidal amplitudes to produce a trigonometric function of the phase angle of the radiation from the test surface; and

generating from the trigonometric function of the phase angle an output representative of the height of the surface at each position.

14. The method of claim 13 further including comparing the d.c. amplitude to twice the intensity level at the second step;

and indicating that the sign of the height is positive when the former is greater and negative when it is smaller.