Interferometric measurement with .lambda./4 resolution

• US 4,221,486 A
• Filed: 10/06/1978
• Issued: 09/09/1980
• Est. Priority Date: 12/27/1977
• Status: Expired due to Term

• Current Assignee: Gunter Makosch
• Original Assignee: Gunter Makosch
• Inventors: Jaerisch, Walter, Makosch, G/enter
• Primary Examiner(s): Corbin, John K.
• Assistant Examiner(s): Sugarman, Scott J.
• Application Number:
  US05/949,311
• Time in Patent Office: 704 Days
• Field of Search: 356/345, 356/357, 356/359
• US Class Current: 356/504
• CPC Class Codes: G01B 11/0675 using interferometry
• CPC Class Codes: G01B 11/306 for measuring evenness
• CPC Class Codes: G01B 9/02 Interferometers

Abstract

Described is a method for interferometric measurement in which a monochromatic, coherent and parallel, convergent or divergent radiation is directed onto the test object so as to generate in a manner of an interference fringe pattern, the distances between two adjacent fringes being correlated to λ/2 distances in the object space.

The radiation reflected from the object and containing an interference field, giving rise to said fringe pattern, is redirected onto the test object, e.g. by a suitable mirror arrangement under an angle of incidence different from the angle of incidence of the radiation first impinging on the test object.

This radiation, after reflexion from the test object, forms an interference field comprising four interfering components and producing, e.g. on an observation screen, an interference fringe field. By properly adjusting the angles of incidence of both radiations, the distances between adjacent fringes can be made to correspond to λ/4 distances in the object space.

Claims

1. An inteferometric method with λ

/4 resolution for distance, thickness, and/or flatness measuring, characterized in that a collimated, convergent or divergent radiation (S_o) is directed at a first angle of incidence (θ

₁), or at a first range of angles of incidence onto an object (1) to be measured, that the components (S₁, S₂) of the radiation (S_o) reflected from different surfaces or different parts of the object to be measured are superimposed to a new radiation (S'"'"'), with this new radiation redirected onto the object to be measured at a second angle of incidence (θ

₂) differing from the first angle of incidence, or at a second range of angles of incidence differing from the first range, that the components (S₃, S₄) of this radiation reflected from different surfaces or parts of the object to be measured are brought into interference, and that the resulting interference fringe pattern is imaged for evaluation.

2. The interferometric method of claim 1, characterized in that the product of layer thickness (d) and difference of the cosine of the angles of incidence equals λ

/4 or an odd-numbered multiple thereof.

3. The interferometric method of claim 1 characterized in that the angles of incidence (θ

₁, θ

₂) of the radiations (S_o, S), for altering the resolution, are controllably changeable from λ

/2 to λ

/4 and vice versa.

4. The interferometric method of claim 2 characterized in that the angles of incidence (θ

₁, θ

₂) of the radiations (S_o, S), for altering the resolution, are controllably changeable from λ

/2 to λ

/4 and vice versa.

5. The interferometric method of claims 1, 2 or 4 characterized in that the angles of incidence (θ

₁, θ

₂) are controllably changeable for adaptation to the reflectivities of the surfaces to be measured.

6. Apparatus for interferometric measurement comprising a light source designed as a laser (2), lenses (3, 4) for expanding the cross-section of the beam, a mirror (7) for deflecting the light beam in the direction of a lens (5) by which a bundle (12) of parallel beams impinging onto an object (1) to be measured at an angle of incidence (θ

₁) is generated, a concave mirror (6) directing the radiation components of the bundle (12) of parallel beams, which components are reflected from different surfaces or parts of the object (1) to be measured through the lens (5) as a bundle (13) of parallel beams at an angle (θ

₂) onto the object, and by a mirror (8) by which the radiation (14) reflected for the second time from the object (1) and consisting of four components is reflected into the range of an evaluation plane (9).

8. The apparatus of claims 6 or 7 characterized by visual conversion of the pattern at the evaluation plane (9, 30) by means of a photocathode of a television camera.

9. The apparatus of claims 6 or 7 characterized by visual conversion of the pattern at the evaluation plane (9, 30) by means of a photodetector array.

7. Apparatus for interferometric measurement comprising a light source designed as a laser (22), lenses (23, 24) for expanding the laser beam, a polarization-independent beam splitter (27), a polarization-dependent beam splitter (28), a quarter-wave plate (19) arranged in the path of the bundle (32) of beams deflected by the polarization-dependent beam splitter, a lens (25) transferring the components of the bundle (32) of beams reflected from the object (1) to a concave mirror (26), that lens directing again the radiation reflected from the concave mirror as a bundle (33) of parallel beams after the passage through the quarter-wave plate onto the object (1), the components of the bundle of beams (33) reflected from the object, owing to the position of its polarization plane, being deflected by the polarization-dependent beam splitter (28) in the direction of the polarization-independent beam splitter, and by the latter in the direction of an evaluation plane (30).