Method of and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosis

• US 4,228,537 A
• Filed: 08/29/1978
• Issued: 10/14/1980
• Est. Priority Date: 08/29/1978
• Status: Expired due to Term

• Current Assignee: Genrad Incorporated (Teradyne Incorporated)
• Original Assignee: Genrad Incorporated (Teradyne Incorporated)
• Inventors: Anderson, Ralph, Haas, Rene, Henckels, Lutz
• Primary Examiner(s): Atkinson, Charles E.
• Application Number:
  US05/937,789
• Time in Patent Office: 777 Days
• Field of Search: 235/302, 235/302.1, 364/200, 364/900, 324/73 R, 371/23, 371/15, 371/20
• US Class Current: 714/33
• CPC Class Codes: G06F 11/261 by simulating additional hardware, e.g. fault simulation

Abstract

This disclosure is concerned with the use of on-line simulation of circuit faults during diagnosis to generate a small part of a complete fault dictionary needed for diagnosis of the circuit, being adapted for use of a mini-computer-based automated test system having only a small amount of secondary storage; and being adapted for an exact match diagnosis with modeled failures, and a heuristic approach for a partial match of faulty behaviour that leads to a highly probable diagnosis.

Claims

1. A method of automatic fault diagnosis of an electrical circuit under test comprising applying a set of tests to the circuit under test;

comparing the responses of the circuit under test with the responses of a good circuit to detect variations which are indicative of faults;

selecting from a stored partial fault dictionary of modeled circuit faults a list of possible circuit faults which are capable of producing at least one of said variations;

simulating on-line circuits having at least one of the faults from said list;

generating the responses of the simulated circuits to the set of tests; and

comparing the responses of the simulated circuits with the responses of the circuit under test to effect fault diagnosis.

2. A method as claimed in claim 1 and in which said last-named comparing step comprises matching all the responses of the circuit under test for all tests of said set to those of a simulated circuit to verify the fault diagnosis.

3. A method as claimed in claim 1 and in which said last-named comparing step comprises effecting a partial match of the responses of the circuit under test for some tests to corresponding responses of a simulated circuit to indicate probable fault location.

4. A method as claimed in claim 1, wherein said partial fault dictionary is prepared by simulating in response to the set of tests fault-free circuit responses;

simulating in response to the same set of tests modeled faulty circuit responses;

comparing the fault-free and faulty circuit responses in order to detect variations; and

generating from said comparing, said partial fault dictionary by grouping all modeled circuit faults which produce the same variations for a particular one of the tests of said set.

5. Electrical circuit fault diagnosis apparatus for a circuit under test comprising means for applying a set of tests to the circuit under test;

means for comparing the responses of the circuit under test with the responses of a good circuit to detect variations which are indicative of faults;

means for selecting from a stored partial fault dictionary of modeled circuit faults a list of possible circuit faults which are capable of producing at least one of said variations;

means for simulating on-line circuits having at least one of the faults from said list;

means for generating the responses of the simulated circuits to said set of tests; and

means for comparing the responses of the simulated circuits with the responses of the circuit under test to effect fault diagnosis.

6. Electrical circuit fault diagnosis apparatus as claimed in claim 5 and in which the last-named comparing means comprises means responsive to the matching of all the responses of the circuit under test for all tests to those of a simulated circuit to verify the fault diagnosis.

7. Electrical circuit fault diagnosis apparatus as claimed in claim 5 and in which the last-named comparing means comprises means responsive to a partial matching of some of the responses of the circuit under test for some tests to corresponding responses of a simulated circuit to indicate probable fault location.

8. Electrical circuit fault diagnosis apparatus as claimed in claim 5 comprising means for storing the responses of the circuit under test and means for storing the responses of the good circuit.

9. Electrical circuit fault diagnosis apparatus as claimed in claim 5 in which the first-mentioned means comprises stimulus pattern register means for storing input tests of said set;

signal driver means connected to the stimulus pattern register means for applying the input tests to the circuit under test; and

response pattern register means for storing the circuit responses to said input tests.