×

Etchant for silicon dioxide films disposed atop silicon or metallic silicides

  • US 4,230,523 A
  • Filed: 12/29/1978
  • Issued: 10/28/1980
  • Est. Priority Date: 12/29/1978
  • Status: Expired due to Term
First Claim
Patent Images

1. In a process for selectively etching a silicon oxide layer which is disposed atop a metallic silicide layer and wherein exposed silicon may be present below or adjacent to said silicide, the step of contacting said oxide layer with an etchant comprising:

  • hydrogen fluoride in polyhydric alcohol, the solution being substantially free of unbound water and ammonium fluoride;

    said etchant not substantially attacking either said silicide layer or said silicon.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×