Thermal emission flaw detection method

• US 4,232,554 A
• Filed: 11/30/1978
• Issued: 11/11/1980
• Est. Priority Date: 11/30/1978
• Status: Expired due to Term

• Current Assignee: Grumman Aerospace Corporation (Northrop Grumman Corporation)
• Original Assignee: Grumman Aerospace Corporation (Northrop Grumman Corporation)
• Inventors: Aleck, Benjamin J.
• Primary Examiner(s): Swisher, S. Clement
• Application Number:
  US05/964,912
• Time in Patent Office: 712 Days
• Field of Search: 73/762, 73/799, 73/805, 73/808, 73/577, 73/356, 73/15 FD, 73/15.6, 73/104, 73/355, 73/811, 73/812
• US Class Current: 73/577
• CPC Class Codes: G01N 19/08 Detecting presence of flaws or irregularities
• CPC Class Codes: G01N 25/72 Investigating presence of flaws

Abstract

A method of detecting very small structural flaws at loads below those which cause the flaws to propagate is disclosed. Certain phenomena and relationships of fracture mechanics are utilized in conjunction with the generation, detection and interpretation of thermal emission signals indicative of plastic deformation of the tested material.

Claims

1. A nondestructive method for detecting flaws in a structure comprising a material having a characteristic threshold stress intensity factor, including the steps of:

(a) loading the structure at a level corresponding to a stress intensity factor below the characteristic threshold stress intensity factor of the material; and

(b) positioning detection means in thermal proximity to the structure for detecting thermal emission signals indicative of plastic deformation.

2. The method of claim 1 further including the step of determining the positioning of the detection means by measuring and observing the detected thermal emission signals until a region is located on the surface of the structure where the measured thermal emission signals exceed a predetermined level.

3. The method of claim 2 including the additional step of producing a signal responsive to said detection means indicating that said detected thermal emission signals exceed a predetermined level.

4. A nondestructive method for detecting flaws in a structure comprising a material having a characteristic threshold stress intensity factor, including the steps of:

(a) cyclically loading the structure at a level corresponding to a stress intensity factor below the characteristic threshold stress intensity factor of the material; and

(b) positioning detection means in thermal proximity to the structure for detecting thermal emission signals indicative of plastic deformation.

5. The method of claim 4 further including the step of determining the positioning of the detection means by measuring and observing the detected thermal emission signals until a region is located on the surface of the structure where the measured thermal emission signals exceed a predetermined level.

6. The method of claim 5 including the additional step of producing a signal responsive to said detection means indicating that said detected thermal emission signals exceed a predetermined level.

7. A nondestructive method for detecting flaws in a structure comprising a material having a characteristic threshold stress intensity factor, including the steps of:

(a) resonantly loading the structure;

(b) cyclically loading the structure at a level corresponding to a stress intensity factor below the characteristic threshold stress intensity factor of the material; and

(c) positioning detection means in thermal proximity to the structure for detecting thermal emission signals indicative of plastic deformation.

8. The method of claim 7 further including the step of determining the positioning of the detection means by measuring and observing the detected thermal emission signals until a region is located on the surface of the structure where the measured thermal emission signals exceed a predetermined level.

9. The method of claim 8 including the additional step of producing a signal responsive to said detection means indicating that said detected thermal emission signals exceed a predetermined level.