System and method for obtaining compensated level measurements

• US 4,235,106 A
• Filed: 12/08/1978
• Issued: 11/25/1980
• Est. Priority Date: 12/08/1978
• Status: Expired due to Term

• Current Assignee: Drexelbrook Controls, Inc.
• Original Assignee: Drexelbrook Controls, Inc.
• Inventors: Stern, David M., Maltby, Frederick L.
• Primary Examiner(s): Woodiel, Donald O.
• Application Number:
  US05/967,683
• Time in Patent Office: 718 Days
• Field of Search: 73/304 C, 361/284, 324/61 R
• US Class Current: 73/304.00C
• CPC Class Codes: G01F 23/24 by measuring variations of resistance of resistors due to contact with conductor fluid
• CPC Class Codes: G01F 23/263 by measuring variations in capacitance of capacitors

Abstract

A compensated level measuring system is disclosed for measuring the level of the material housed in a vessel, the system incorporating compensation means for compensating for variations in the dielectric constant of the material. A two element measuring system is used, having a first element mounted at a fixed position within the vessel containing the material for obtaining a level signal which is a function of the material level, and a second element maintained within the vessel and always submerged in the material for obtaining a reference signal. Means are provided for adjusting the reference signal so that it can accurately compensate for variations in the level signal which occur independently of the material level. The compensating means is provided either by a mechanical embodiment in which the reference signal is effectively tuned by modifying the position of the reference probe, or electronic means where the effective reference signal is modified by an error function to compensate for errors introduced by changes in the dielectric constant of the material being measured.

Claims

1. A compensated level measuring system for measuring the level of material housed in a vessel, said material being characterized by certain electrical characteristics such as dielectric constant and conductivity, comprising:

a. first probe means having a first probe portion mounted at a fixed position within said vessel, for obtaining a level signal which is a function of said material level and said electrical characteristics;

b. second probe means having a second probe portion maintained within said vessel at a position always submerged in said material, for obtaining a reference signal which is a function of said electrical characteristics;

c. said second probe means comprising means located external to said second probe portion and operable while said second probe portion is submerged in said material for adjusting said reference signal to provide a compensated reference signal;

d. means for deriving a compensated level signal as a predetermined function of said level signal and said compensated reference signal; and

e. wherein said first probe means comprises a first electronic source circuit in combination with said first probe portion for generating said level signal, and said second probe means comprises a second electronic source circuit in combination with said second probe portion for generating said reference signal.

2. The compensated level measuring system as described in claim 1, wherein said first and second probes have non-congruent geometrical relationships with said vessel.

3. The compensated level measuring system as described in claim 1, wherein said first and second probe portions are housed in a composite probe element.

4. The compensated level measuring system as described in claim 1, wherein said first and second probe portions are housed in respective separate probe housings.

5. The compensated level measuring system as described in claim 1, wherein said adjusting means comprises means for mechanically changing the geometrical relationship of said second probe portion with system ground.

6. The compensated level measuring system as described in claim 5, wherein said second probe means comprises a reference housing for maintaining said second probe portion at an angle to the vertical, and means for rotating said angled second probe portion about a substantially vertical axis.

7. The compensated level measuring system as described in claim 5, comprising housing for maintaining said first and second probe portions in vertical positions, and means for adjusting said portions to have different geometrical relationships to said vessel.

8. The compensated level measuring system as described in claim 5, comprising housing for maintaining said second probe portion below said first probe portion.

9. The compensated level measuring system as described in claim 5, wherein said vessel has walls which are at A.C. electrical ground, and wherein said mechanical adjusting means comprises means for adjusting the effective capacitance between said second probe portion and said system ground.

10. The compensated level measuring system as described in claim 9, wherein said capacitance adjusting means comprises means for rotating said second portion so as to vary its distance from said vessel walls.

11. The compensated level measuring system as described in claim 1, wherein said means for adjusting comprises an electronic compensating circuit for compensating said reference signal.

12. The compensated level measuring system as described in claim 11, wherein said electronic circuit compensates said reference signal by a linear factor.

13. The compensated level measuring system as described in claim 11, wherein said electronic compensating circuit is an analog circuit.

14. The compensated level measuring system as described in claim 11, wherein said electronic compensating circuit is a digital circuit.

15. The compensated level measuring system as described in claim 14, wherein said digital circuit comprises a microprocessor unit.

16. The compensated level measuring system as described in claim 11, wherein said electronic circuit compensates said reference signal by a factor designated by the mathematical formula [1-G|F|-F(1-e_2R)].

17. The compensated level measuring system as described in claim 16, wherein said tuning circuit has a single calibration control for adjusting F.

18. The compensated level measuring system as described in claim 1, wherein said adjusting means provides for adjusting said second probe portion relative to said first probe portion such that the air capacity per unit length parameter of said first probe portion is substantially equal to the air capacity per unit length parameter of said second probe portion.

19. The compensated level measuring system as described in claim 11, wherein said electronic circuit compensates said reference signal by a factor which is a predetermined function of said reference signal.

20. A compensated level measuring system for measuring the level of a material housed in a vessel having walls, said material having electrical characteristics including a dielectric constant K which may vary during usage of said system, comprising:

a level probe assembly comprising a level probe mounted at a fixed position within said vessel in combination with a level electronic source circuit, for generating a level signal which is a function of said level;

a reference probe assembly comprising a reference probe always submersed in such material, in combination with a reference electronic source circuit, for generating a reference signal; and

means for adjusting the position of said reference probe, whereby said probes can be geometrically matched.

21. The compensated level measuring system as described in claim 20, wherein said reference probe assembly comprises a housing comprising a first portion maintained vertically within said housing and a second portion maintained at a fixed angle relative to said first portion, said second portion housing said reference probe, and means for rotating said first portion such that the effective geometrical position of said second portion relative to the vessel walls is changed while the effective geometrical position of said first portion relative to said vessel walls is unchanged.

22. The compensated level measuring system as described in claim 20, comprising an element for holding said level probe assembly and said reference probe assembly in fixed geometrical relationship with each other, and wherein said adjusting means comprises means for changing the respective geometrical positions of said level and reference probe assemblies relative to said vessel walls.

23. A compensated level measuring system for measuring the level of a material housed in a vessel, said material having a dielectric constant K which may vary during usage of said system, comprising:

a level probe assembly comprising a level probe mounted at a fixed position within said vessel in combination with a level electronic source circuit, for generating a level signal which is a function of said level;

a reference probe assembly comprising a reference probe submerged in said material, in combination with a reference electronic source circuit, for generating a reference signal; and

electronic compensating means for compensating said generated reference signal in accordance with a predetermined function, and for deriving a compensated level signal as a predetermined function of said level signal and said compensated reference signal.

24. The compensated level measuring system as described in claim 23, wherein said electronic compensating means comprises an analog circuit.

25. The compensated level measuring system as described in claim 23, wherein said electronic compensating means comprises a digital circuit.

26. The compensated level measuring system as described in claim 23, wherein said electronic compensating means compensates said reference signal by a factor which is a predetermined function of said reference signal.