Highly solar-energy absorbing device and method of making the same

• US 4,252,865 A
• Filed: 05/24/1978
• Issued: 02/24/1981
• Est. Priority Date: 05/24/1978
• Status: Expired due to Term

• Current Assignee: GP Strategies Corporation (Learning Technologies Group Plc)
• Original Assignee: GP Strategies Corporation (Learning Technologies Group Plc)
• Inventors: Roy, Rustum, Gilbert, Laurence R., Messier, Russell F.
• Primary Examiner(s): Weisstuch, Aaron
• Assistant Examiner(s): Leader, William
• Application Number:
  US05/909,166
• Time in Patent Office: 1,007 Days
• Field of Search: 204/192 P, 204/192 S, 136/89 CC, 428/446, 428/450, 428/141, 428/620, 428/641, 428/611, 428/333, 428/913, 428/687, 427/160, 427/74, 427/82, 357/2, 156/662, 156/651, 156/654, 126/901
• US Class Current: 428/611
• CPC Class Codes: F24S 70/225 for spectrally selective absorption
• CPC Class Codes: F24S 70/25 Coatings made of metallic material
• CPC Class Codes: H01L 31/02363 of the semiconductor body itself, e.g. textured active layers
• CPC Class Codes: H01L 31/202 including only elements of Group IV of the Periodic Table
• CPC Class Codes: Y02E 10/40 Solar thermal energy, e.g. solar towers
• CPC Class Codes: Y02E 10/50 Photovoltaic [PV] energy
• CPC Class Codes: Y02P 70/50 Manufacturing or production processes characterised by the final manufactured product
• CPC Class Codes: Y10S 126/908 Particular chemical
• CPC Class Codes: Y10S 428/913 Material designed to be responsive to temperature, light, moisture
• CPC Class Codes: Y10T 428/12465 having magnetic properties, or preformed fiber orientation coordinate with shape
• CPC Class Codes: Y10T 428/12528 Semiconductor component
• CPC Class Codes: Y10T 428/12674 Ge- or Si-base component
• CPC Class Codes: Y10T 428/12993 Surface feature [e.g., rough, mirror]
• CPC Class Codes: Y10T 428/261 In terms of molecular thickness or light wave length

Abstract

The invention contemplates a highly solar-energy absorbing device wherein the surface exposed to incident solar energy is a particularly characterized roughness of an amorphous semiconductor material, the particular characterization being that of an array of outwardly projecting structural elements of relatively high aspect ratio and at effective lateral spacings which are or include those in the order of magnitude of wavelengths within the solar-energy spectrum.

Claims

1. A highly solar-energy absorbing device comprising an amorphous semiconductor body having at least one etched surface characterized by an array of oriented acicular structures, wherein the distance between adjacent structures is within or near the solar-energy wavelength or wavelengths to be absorbed.

2. An energy-absorbing device that is highly absorbent of energy incident in a particular direction and in a particular and limited spectral range, comprising an amorphous semiconductor body having an etched surface adapted to be exposed to such energy incidence, said surface being characterized by an array of acicular structures having spaced axes such that at least a substantial fraction of said structures are at an axis-to-axis lateral offset between adjacent acicular structures which offset is in the order of magnitude of wavelengths within the solar-energy spectrum.

3. The device of claim 2, in which said acicular structures are of randomly distributed axial extent.

4. The device of claim 2, in which the aspect ratio of said acicular structures is in the range of 2:

1 to 10;

1.

5. The device of claim 2, in which the aspect ratio of said acicular structures is greater than 3:

1.

6. A highly solar-energy absorbing device, comprising an amorphous semiconductor body having at least one etched surface characterized by an array of interpenetrating generally conical pits, wherein said pits are of randomly distributed depth and wherein the spacing between pits of greatest depth does not substantially exceed the wavelength of the infrared end of the solar-energy spectrum, whereby the axial spacing between pits of lesser depth within said random distribution necessarily includes a random distribution of spacings of smaller pits at solar-energy wavelengths.

7. A highly solar-energy absorbing device, comprising a substrate having a supporting surface, a sputtered amorphous semiconductor body united to and covering at least a portion of said surface, said body having an etched outer surface substantially characterized by an array of outwardly projecting structural elements of aspect ratio within the range 2:

1 to 10;

1 and at lateral spacings at least a substantial fraction of which are in the order of magnitude of wavelengths within the solar-energy spectrum.

8. The device of claim 7, in which said projecting structural elements are acicular.

9. The device of claim 7, in which said projecting structural elements are of randomly distributed peak elevation with respect to the unetched body material to which they are integrally connected.

10. The device of claim 7, in which said projecting structural elements are defined by intersecting walls of an array of interpenetrating generally conical pits.

11. The device of claim 7, in which said body includes tetrahedrally bonded amorphous material as an essential component.

12. The device of claim 7, in which said body is of tetrahedrally bonded amorphous material selected from the group including non-crystalline germanium and non-crystalline silicon.

13. The device of claim 7, in which said body comprises an alloy of non-crystalline germanium and non-crystalline silicon.

14. The device of claim 7, in which said surface is substantially flat, but for said array of projecting structural elements.

15. The device of claim 7, in which said surface is convex and curvilinear, but for said array of projecting structural elements.

16. The device of claim 15, in which said surface is cylindrical.

17. The device of claim 14, in which the projecting direction of said structural elements is substantially normal to said surface.

18. The device of claim 14, in which the projecting direction of said structural elements is at substantially the same inclination to a normal to said surface.

19. The device of claim 7, in which said semiconductor body is an element of a photothermal device.

20. The device of claim 7, in which said semiconductor body is an element of a photovoltaic cell.

21. The device of claim 7, in which said semiconductor body is a thin film.

22. The device of claim 7, in which said substrate is of metal, at least at or near interface with said semiconductor body.

23. The method of making a highly solar-energy absorbing surface on a substrate body, which comprises the controlled sputtering application of a layer of amorphous semiconductor material to an exposed-surface area of said body, and then altering the exposed-surface morphology of said layer by etching the same to form an array of outwardly projecting structural elements, the etchant being selected for the particular semiconductor material and applied in such strength and for such exposure time and ambient conditions of temperature as to form said structural elements with an aspect ratio in the range 2:

1 to 10;

1 and at lateral spacings which are in the order of magnitude of a wavelength within the solar-energy spectrum.

24. The method of claim 23, in which said amorphous semiconductor material is non-crystalline germanium and the etchant consists essentially of hydrogen peroxide.

25. The method of claim 24, in which the hydrogenperoxide etchant is to the extent of a substantially 30 percent solution thereof in water.

26. The method of claim 23, in which said amorphous semiconductor material is non-crystalline silicon and the etchant consists essentially of hydrogen fluoride and nitric acid.

27. The method of claim 26, in which the proportion by volume of hydrogen fluoride to nitric acid is approximately 10:

1.

28. The method of claim 27, in which said etchant further includes water dilution, to the extent that the volume proportions of nitric acid and water are substantially the same.

29. The method of claim 23, in which said etching step is one of a plurality of etching steps with different etchants.

30. The method of claim 23, in which said controlled sputtering step is one of a plurality of sputtering steps with different sputtered materials.

31. The method of claim 30, in which the etching step is performed between successive sputtering steps.

32. The method of claim 23, including the additional step of annealing at least to the extent of crystallizing said body.

33. The product of the method of claim 32.

34. The product of the method of making a highly solar-energy absorbing surface on a substrate body, which comprises the controlled sputtering application of a layer of amorphous semiconductor material to an exposed-surface area of said body, and then altering the exposed-surface morphology of said layer by etching the same to form an array of outwardly projecting structural elements, the etchant being selected for the particular semiconductor material and applied in such strength and for such exposure time and ambient conditions of temperature as to form at least a substantial fraction of said structural elements with an aspect ratio in the range 2:

1 to 10;

1 and at lateral spacings which are in the range of 0.2 to 2.0μ

.