Defect detection means for charge transfer imagers

• US 4,253,120 A
• Filed: 12/05/1979
• Issued: 02/24/1981
• Est. Priority Date: 12/05/1979
• Status: Expired due to Term

• Current Assignee: RCA Corporation (General Electric Company)
• Original Assignee: RCA Corporation (General Electric Company)
• Inventors: Levine, Peter A.
• Primary Examiner(s): Martin, John C.
• Application Number:
  US06/100,452
• Time in Patent Office: 447 Days
• Field of Search: 358/213, 358/163, 358/212, 358/225, 358/294
• US Class Current: 348/246
• CPC Class Codes: H04N 25/63 applied to dark current
• CPC Class Codes: H04N 25/68 applied to defects
• CPC Class Codes: H04N 25/683 by defect estimation performed on the scene signal, e.g. real time or on the fly detection

Abstract

Real time detection of defective picture sampling elements of a high resolution imager may be achieved by (1) imaging a scene by means of low resoluting power imaging optics to produce an image resolution limit spot size on the imager which is large relative to the center-to-center pitch distance of the picture sampling elements, and (2) indicating as spurious each single picture sample of the serial output from the imager that exhibits certain discriminating contrast characteristics with respect to its neighboring picture samples. This permits a spurious sample to be corrected by replacement with an interpolated value derived from its neighboring samples.

Claims

1. In combination

a charge transfer imager comprised of a spatial array of discrete picture sampling elements disposed at a given center-to-center pitch distance,

imaging optics having a relatively low resolving power adapted to image a scene on said array with a given image resolution limit spot size, which spot size is larger than said pitch distance, whereby the highest spatial-frequency component of said image illuminates at least two picture sampling elements,

means for applying clock voltages to said imager to derive a serial output signal therefrom, said serial output signal being comprised of successive picture samples obtained from said elements at a clock rate of said clock voltages, and

signal processing means for processing said serial output signal from said imager, said signal processing means including imager defect detection means for indicating as spurious each single picture sample of said serial output signal that exhibits certain discriminating characteristics with respect to its neighboring picture samples.

2. The combination defined in claim 1,

wherein said defect detection means comprises discrimination means responsive to the respective values of neighboring picture samples of each successive single picture sample of said imager serial output signal for deriving a discrimination signal indicating as spurious any single picture sample having an actual value which falls outside of a range of probable interpolated values for that single picture sample, which range is determined from said respective values of neighboring picture samples to that single picture sample.

3. The combination defined in claim 2,

wherein said discrimination means derives said discrimination signal in response to the contrast ratio of said actual value of that single picture sample to the average of the respective values of its adjacent picture samples on either side thereof differing from unity by more than a specified amount in at least one of positive and negative directions.

4. The combination defined in claim 3,

wherein said discrimination signal is derived in response to said contrast ratio differing from unity in the positive direction by a first specified amount and in the negative direction by a second specified amount.

5. The combination defined in claim 3, wherein said discrimination means also derives said discrimination signal in the concurrence of (1) response to a second contrast ratio of the average of said adjacent picture samples to the average of the neighboring picture samples next to said adjacent picture samples differing from unity by less than a first particular absolute value and (2) said first-mentioned contrast ratio differing from said second contrast ratio in at least one of said positive and negative directions by more than a second particular value.

6. The combination defined in claim 2,

wherein said signal processing means comprises defect correction means responsive to said discrimination signal for substituting, for the actual value of any spurious single picture sample in said serial output, a substantially correct-value picture sample derived by interpolation from at least some of the respective values of said neighboring picture samples to that single picture sample.

7. The combination defined in claim 6,

wherein said imaging optics constitutes a low-pass spatial frequency filter having a predetermined high spatial frequency roll-off characteristic, and

wherein said signal processing means comprises filter means for deriving a video output signal from the picture samples of said imager serial output signal after correction by said defect correction means, filter means including a peaking circuit having a high-frequency characteristic which substantially corresponds to the complement of said high spatial frequency roll-off characteristic for effectively restoring in said video output signal the loss in image resolution produced by said low-pass spatial filter.