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Defect detection means for charge transfer imagers

  • US 4,253,120 A
  • Filed: 12/05/1979
  • Issued: 02/24/1981
  • Est. Priority Date: 12/05/1979
  • Status: Expired due to Term
First Claim
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1. In combinationa charge transfer imager comprised of a spatial array of discrete picture sampling elements disposed at a given center-to-center pitch distance,imaging optics having a relatively low resolving power adapted to image a scene on said array with a given image resolution limit spot size, which spot size is larger than said pitch distance, whereby the highest spatial-frequency component of said image illuminates at least two picture sampling elements,means for applying clock voltages to said imager to derive a serial output signal therefrom, said serial output signal being comprised of successive picture samples obtained from said elements at a clock rate of said clock voltages, andsignal processing means for processing said serial output signal from said imager, said signal processing means including imager defect detection means for indicating as spurious each single picture sample of said serial output signal that exhibits certain discriminating characteristics with respect to its neighboring picture samples.

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