Processing system for detection and the classification of flaws on metallic surfaces

• US 4,253,768 A
• Filed: 08/09/1978
• Issued: 03/03/1981
• Est. Priority Date: 08/09/1978
• Status: Expired due to Term

• Current Assignee: Westinghouse Electric Company LLC (Brookfield Asset Management Incorporated)
• Original Assignee: Westinghouse Electric Company LLC (Brookfield Asset Management Incorporated)
• Inventors: Miller, Robert C., Sarkozi, Miklos, Kennedy, Paul G., Yaroshuk, Nicholas
• Primary Examiner(s): Corbin, John K.
• Assistant Examiner(s): Arnold, Bruce Y.
• Application Number:
  US05/932,235
• Time in Patent Office: 937 Days
• Field of Search: 356/51, 356/237, 356/430, 356/431, 356/445, 250/563, 250/572
• US Class Current: 356/431
• CPC Class Codes: G01N 21/89 in moving material, e.g. running paper or textiles G01N21/90, G01N21/91, G01N21/94 take precedence

Abstract

This invention is a system of automatically classifying defects both for sorting defective products (metallic surfaces, especially tube surfaces) as to the reworking operation required for correcting the defect, and for classifying the defect as to the preceding manufacturing operation which is the most probable cause of that defect and sending a signal to that operation to provide for adjustments to minimize future defects. The system uses a source of electromagnetic radiation (typically a laser beam which is scanned across the surface) and at least two sensors (adjusted such that the radiation is reflected from a defect-free surface principally received by one of the sensors but that there is a measured amount of radiation in the other sensor). An average signal of the principal sensor is developed as a function of scan position. Threshold circuitry detects when the ratio of sensor signal to average signal varies by a predetermined amount. Special circuitry is used to detect the essentially simultaneous occurrence of at least two different preselected combinations of signal variations to identify the type of defect.

Claims

1. In an automatic surface scanning method of the type in which surfaces have been subjected to at least two manufacturing steps, said method utilizing advancing a surface past a source of electromagnetic radiation, directing said electromagnetic radiation toward said surface, sensing reflected radiation from said surface with electromagnetic-radiation sensing means, and effectively scanning at least one of said source and said radiation sensing means across said surface generally transverse to the direction in which said surface is advanced to produce a series of serial scan signals, an improvement utilizing defect classification, said improvement comprising:

a. using a first radiation sensor and a second sensor, each sensor generating a signal which is a function of the amount of radiation received;

b. adjusting the relative position of said radiation source and said sensors so that an essentially defect-free surface reflects radiation principally to said first sensor and reflects a measured amount of radiation to said second sensor;

c. generating a first sensor, position-related, average signal;

d. comparing said first sensor signal to said average signal and generating a first error signal if said first sensor signal exceeds said average signal by a first predetermined amount, and generating a second error signal if said first sensor signal is less than said average signal by a second predetermined amount;

e. comparing said second radiation sensor signal to said first sensor average signal and generating a third error signal when said second signal exceeds a first predetermined fraction of said average signal and generating a fourth error signal when said second signal exceeds a second predetermined fraction of said average signal, both said first and said second predetermined fractions being greater than the ratio of said measured amount of radiation received by said second sensor from said essentially defect-free surface to said first sensor average signal and both said fractions being less than one, and said second predetermined fraction being larger than said first predetermined fraction;

f. detecting the essentially simultaneous occurrence of at least two preselected conditions involving at least two of said error signals to provide defect classification signals;

g. utilizing said classification signals to indicate rejection of said surface and to indicate the defect classification; and

h. utilizing at least one of said classification signals to indicate to at least one of said at least two manufacturing steps that there has been an occurrence of a classification defect, whereby process control can be implemented to minimize the future occurrences of said classification defect.

2. The method of claim 1 wherein there are at least two types of said classification signals each of which is utilized to indicate to at least one of said at least two manufacturing steps that there has been an occurrence of a given type of classification defect.

3. The method of claim 2, wherein said first sensor signal is compared to said average signal and a fifth error signal is generated if said first sensor signal is less than said average signal by a third predetermined fraction, said third predetermined fraction being greater than said second predetermined fraction, whereby surfaces may be rejected upon very low values of said first sensor signal.

4. The method of claim 2, wherein defect classification signals are utilized to sort said rejected surfaces into defect classifications, whereby reworking and grading of said surfaces may be efficiently implemented.

5. The method of claim 3, wherein a first condition of error signals is used, said condition comprising the essentially simultaneous occurrence of said fifth error and said fourth error signals, whereby a dent is indicated.

6. The method of claim 5, wherein a second condition of error signals is used, said second condition comprising the essentially simultaneous occurrence of said second error signal without the occurrence of either said fifth or said third error signal, whereby a stain is indicated.

7. The method of claim 3, wherein a third condition of error signals is utilized to provide a third defect classification signal, said third condition of error signals comprising either:

the essentially simultaneous occurrence of said second error signal without the occurrence of said fifth error signal;

or the essentially simultaneous occurrence of said third error signal without the occurrence of said first error signal, whereby a scratch is indicated.

8. The method of claim 3, wherein a third sensor is used to generate a signal which is a function of the amount of radiation received by said third sensor and which third sensor is adjusted to receive a measured amount of radiation from an essentially defect-free surface;

a sixth error signal is generated when said third sensor signal exceeds said first predetermined fraction of said average signal;

a seventh error signal is generated when said third sensor signal exceeds said second predetermined fraction of said average signal; and

a fourth condition of error signals is used, said fourth condition of error signals comprising the essentially simultaneous occurrence of said fifth error signal with at least one of said fourth and seventh error signals, whereby a dent is indicated.

9. The method of claim 8, wherein a fifth condition of error signals is used, said fifth condition comprising the essentially simultaneous occurrence of said second error signal without the occurrence of any of said fifth, third or sixth error signals, whereby a stain is indicated.

10. The method of claim 9, wherein a sixth condition of error signals is used, said sixth condition comprising either:

the essentially simultaneous occurrence of said second signal without the occurrence of said fifth error signal;

or the essentially simultaneous occurrence of at least one of said third and said sixth error signals without the occurrence of said first error signal, whereby a scratch is indicated.