Gas analyzer

• US 4,266,131 A
• Filed: 08/31/1979
• Issued: 05/05/1981
• Est. Priority Date: 09/01/1978
• Status: Expired due to Term

• Current Assignee: Instrumentarium Corporation
• Original Assignee: Instrumentarium Corporation
• Inventors: Auvinen, Jorma J., Ahjopalo, Hannu
• Primary Examiner(s): Willis, Davis L.
• Application Number:
  US06/071,564
• Time in Patent Office: 613 Days
• Field of Search: 250/343, 250/344, 250/345, 356/51, 356/433, 356/436, 356/437
• US Class Current: 250/341.1
• CPC Class Codes: G01N 21/37 using pneumatic detection opto-acoustic detection G01N21/1702

Abstract

The present invention concerns a gas analyzer, for instance a CO₂ analyzer, comprising a measuring chamber for the gas to be examined, a reference chamber from which the gas to be measured has been drawn off, a light source and a chopper disk, which chops the light beam to make it pass alternatingly through the measuring and reference chambers and so that in between there is a period during which no light is passed through at all, and an automatic gain control which maintains a constant difference between the "dark" signal and the signal delivered by the reference chamber. An attenuation member is positioned adjacent the reference chamber so the light beam passing through the reference chamber is attenuated to cause a shift of the operating point of the gain control circuit into the gently ascending part of the absorption versus concentration curve.

Claims

1. A gas analyzer, in particular a CO₂ analyzer, comprising a measuring chamber for the gas to be examined, a reference chamber from which the gas to be measured has been drawn off, a light source, and a chopper disk to chop the light beam so that the beam alternatingly passes through the measuring and reference chambers and generates a related measuring signal and a reference signal and a dark signal, signal processing means for detecting the difference between said signals, an automatic gain control circuit connected to said signal processing means to maintain constant the difference between the dark signal and the reference signal from the reference chamber, a linearizing circuit connected to said signal process means for compensating for the non-linearity of the difference between the measuring signal and the reference signal, and an attenuation member disposed in the path of the light beam passing through the reference chamber and which in the wave length range employed has a high enough attenuation capacity to cause a shift of the operating point of the gain control circuit so that the linearizing circuit operates at the gently sloping part of the absorption versus concentration curve.

2. The gas analyzer of claim 1, wherein the attenuation member is disposed between the reference chamber and the chopper disk.

3. The gas analyzer of claim 1, wherein the attenuation member is a plate affixed to the surface of the reference chamber.

4. A method of analyzing gas, comprising the steps of locating a first gas having a gas component to be analyzed in a measuring chamber, locating a second gas from which the gas component to be analyzed has been removed in a reference chamber, passing a light beam alternately through the measuring chamber and the reference chamber to alternately generate a measuring signal and a reference signal and a dark signal, maintaining the difference between the reference signal and the dark signal at a constant value by a gain control circuit, linearizing the difference between the measuring signal and the reference signal by a linearizing circuit, and attenuating the light beam passing through the reference chamber to cause a shift of the operating point of the gain control circuit, so that the linearizing circuit operates at the gently sloping part of the absorption versus concentration curve.

5. The method of claim 4, wherein the step of chopping the light beam comprises the step of contacting the light beam with a rotating chopper disk.