Optical inspection of gold surfaces

• US 4,278,353 A
• Filed: 04/11/1980
• Issued: 07/14/1981
• Est. Priority Date: 04/11/1980
• Status: Expired due to Term

• Current Assignee: Bell Telephone Laboratories, Inc. (Nokia Corporation)
• Original Assignee: Bell Telephone Laboratories, Inc. (Nokia Corporation)
• Inventors: Ostermayer, Frederick W. Jr.
• Primary Examiner(s): Corbin, John K.
• Assistant Examiner(s): ARNOLD, BRUCE
• Application Number:
  US06/139,172
• Time in Patent Office: 459 Days
• Field of Search: 356/445-448, 356/402, 356/408, 356/425, 356/416, 250/226
• US Class Current: 356/416
• CPC Class Codes: G01N 21/474 Details of optical heads therefor, e.g. using optical fibres

Abstract

Gold plated surfaces are inspected by means of reflected light in the wavelength range of 450 to 575 nanometers to give a sensitive indication of surface conditions. This test automates the visual inspection for "brown gold" and is advantageously used in continuous strip gold plating operations. The technique may be used as a quality control check or as a process control to correct non-optimum process parameters that lead to degradation of gold surface conditions. In a preferred embodiment, the reflected light from the surface being inspected is compared with light reflected from a reference surface. Alternately, a separate wavelength band, typically 700 to 800 nanometers, is reflected from the surface being inspected and compared to the reflected light in the 450 to 575 nanometer wavelength band.

Claims

1. A method of making an article comprising the step of determining the condition of a gold surface on said article by steps comprising directing illumination from a source toward the inspected gold surface and detecting reflected light therefrom by means of an inspection detector, with said illumination thereby traversing an optical path between said source, said surface, and said detector, characterized in that the reflected light detected by said inspection detector is substantially in the wavelength range of 450 to 575 nanometers, and further characterized in that the amount of reflected light detected in said wavelength range is substantially determined by the degree of scattering of said illumination by said gold surface.

2. The method of claim 1 further characterized in that the overall wavelength response to the reflected light, obtained by integrating the product of the illumination spectrum, the inspection detector response spectrum, and the optical path transmission spectrum over a given wavelength range, is at least a factor of 2 greater for the range 450-575 nanometers than the overall wavelength response for all wavelengths outside this range.

3. The method of claim 1 further characterized in that said source is a light emitting diode having a peak output within the range 450-575 nanometers.

4. The method of claim 1 further characterized in that a filter having a transmission spectrum maximum in the wavelength range 450-575 nanometers is placed in said optical path.

5. The method of claim 1 further characterized by directing illumination towards a reference gold surface, detecting light reflected therefrom by means of a reference detector, and comparing the output of said inspection detector to the output of said reference detector.

6. The method of claim 1 further characterized by detecting by means of a reference detector light having wavelengths greater than 700 nanometers reflected from said surface, and comparing the output of said inspection detector to the output of said reference detector.

7. The method of claims 1, 2, 3, 4, 5, or 6 further characterized in that said optical path includes a bundle of parallel optical fibers which conducts illumination to the proximity of said inspected surface from said source, and which conducts said reflected light from the proximity of said inspected surface to said inspection detector.

8. The method of claim 7 further characterized in that the distance from the ends of said fibers to said inspected surface is such that the output of said inspection detector as a function of said distance is within 10 percent of the maximum output.

9. The method of claim 1 further characterized in that the output of said inspection detector is employed to control a parameter of a process used in forming said gold surface.

10. The method of claim 9 further characterized in that said parameter is plating current density or plating solution concentration.