Method and apparatus for measuring magnetooptic anisotropy

• US 4,298,284 A
• Filed: 12/14/1978
• Issued: 11/03/1981
• Est. Priority Date: 12/14/1977
• Status: Expired due to Term

• Current Assignee: Hitachi, Ltd.
• Original Assignee: Hitachi, Ltd.
• Inventors: Ito, Masaru, Murayama, Seiichi, Yamamoto, Manabu, Oishi, Kounosuke
• Primary Examiner(s): Rosenberger, Richard A.
• Application Number:
  US05/969,268
• Time in Patent Office: 1,055 Days
• Field of Search: 356/367, 356/368
• US Class Current: 356/368
• CPC Class Codes: G01N 2021/218 Measuring properties of electrooptical or magnetooptical media
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence

Abstract

In measuring a change in the polarization state of light attributed to magnetooptic anisotropy, a means for generating optic anisotropy is added to a light source or onto an optical path extending from the light source to a polarization analyzer. This allows high precision analysis of the polarization state of light emergent from the polarization analyzer.

Claims

1. A apparatus for providing a measure of the concentration of a sample element by magnetooptic effect comprising:

means for providing a sample element on an optical path, said element having a given atomic resonance frequency,

means for subjecting said sample to a magnetic field transverse to said optical path,

means for supplying and directing at said sample and along said optical path a beam of light,

a polarizer on said optical path positioned to interrupt the emergent beam from said sample, and

means to detect said emergent beam after passing through said polarizer, the improvement in said beam supplying means comprising;

a light source radiating elliptically or circularly polarized light at a frequency shifted from the atomic resonance frequency of said element.

2. A method of providing a measure of the concentration of a sample element utilizing magnetooptic effect comprising the steps of;

positioning a sample containing said element having a given atomic resonance frequency on an optical path,

subjecting said sample to a magnetic field transverse to said optical path,

directing along said optical path and at the sample a beam of light emitted by a light source radiating elliptically or circularly polarized light at a frequency shifted from the atomic resonance frequency of said element,

passing said beam through a polarizer after emergence from said sample, and

detecting the intensities of said emergent beam after it passes through said polarizer.