Analyzer featuring a contacting reflectometer

• US 4,302,420 A
• Filed: 01/09/1981
• Issued: 11/24/1981
• Est. Priority Date: 01/09/1981
• Status: Expired due to Term

• Current Assignee: Clinical Diagnostic Systems Inc.
• Original Assignee: Eastman Kodak Company
• Inventors: Jakubowicz, Raymond F., Schnipelsky, Paul N.
• Primary Examiner(s): Serwin, Ronald
• Application Number:
  US06/223,559
• Time in Patent Office: 319 Days
• Field of Search: 422/63, 422/64, 422/65, 422/66, 356/244, 356/246
• US Class Current: 422/63
• CPC Class Codes: G01N 2035/00039 Transport arrangements specific to flat sample substrates, e.g. pusher blade
• CPC Class Codes: G01N 2035/00089 Magazines
• CPC Class Codes: G01N 2035/00356 Holding samples at elevated temperature (incubation)
• CPC Class Codes: G01N 21/474 Details of optical heads therefor, e.g. using optical fibres
• CPC Class Codes: G01N 35/00029 provided with flat sample substrates, e.g. slides G01N35/028 takes precedence

Abstract

In an analyzer of the kind in which a reflectometer contacts a test element during scanning of the element, means are provided for moving test elements to and from the reflectometer in a manner avoiding significant contact wear of the reflectometer.

Claims

1. In an analyzer for measuring an analyte in a liquid by scanning a test element containing the liquid, said analyzer including a reflectometer having a face adapted to contact a test element during scanning and means for biasing the test element and said reflectometer face into contact with each other while the element is being scanned,

the improvement comprising removing means for removing a scanned test element from said reflectometer, said removing means including first means for moving said scanned element and said face out of contact with each other, and second means for pushing said element across said face, said first means and said second means being configured and arranged so that said second means is operative only after said first means is operative.

2. An analyzer as defined in claim 1, wherein said reflectometer includes an optical scanning head having a center axis, and wherein said removing means includes a pusher element and means for moving said pusher element in a direction that is generally perpendicular to said scanning head axis, said pusher element including a camming surface for forcing the scanned test element to move away from said scanning head in a direction that is generally aligned with said axis.

3. An analyzer as defined in claim 2, wherein said pusher element is mounted and constructed to move between a starting position wherein a test element in contact with said scanning head is free of contact with said pusher element, and an advanced position wherein said pusher element is under the scanned test element and astraddle said scanning head.

4. An analyzer as defined in claim 2, and further including means for supplying said test elements in a stack adjacent said reflectometer and above said pusher element, said pusher element including a raised shoulder dimensioned to engage the bottommost element of said stack.

5. An analyzer as defined in claim 1, wherein said removing means comprises a bifurcated pusher element having said camming surface mounted on an end thereof.

6. An analyzer as defined in claim 5, wherein said camming surface is beveled at an angle sufficient to lift a test element off said reflectometer and onto said bifurcated element as said bifurcated element is advanced toward said reflectometer.

7. An analyzer as defined in claim 1, and further including means for supplying said test elements in a stack adjacent said reflectometer.

8. An analyzer as defined in claim 7, and further including advancing means for moving a test element into a position within said reflectometer, said advancing means being disposed below said stack and including ejector means for removing the bottommost one of said stack of test elements.

9. An analyzer as defined in claim 8, wherein said ejector means comprises a raised shoulder on said advancing means dimensioned to engage the trailing edge of said bottommost stack element only.

10. An analyzer as defined in claim 1, and further including advancing means for moving a test element into a position within said reflectometer, means for reciprocating said advancing means between a starting position outside said reflectometer and said position within said reflectometer, and means for retaining a test element moved into said reflectometer while said advancing means is moved back to said starting position.

11. An analyzer for measuring an analyte in a liquid by scanning a test element containing the liquid, said analyzer including

a reflectometer adapted to contact a test element during scanning,

advancing means for moving a test element into scanning position within said reflectometer,

means for pressing the test element into contact with said reflectometer while the element is being scanned, and

removing means for removing a scanned test element from said reflectometer, said removing means being provided with a camming surface at one end thereof, said camming surface being beveled at an angle sufficient to lift a test element off said scanning head and onto said removing means as said camming surface is advanced toward said scanning head,

said advancing means and said removing means being coupled for synchronous movement.

12. An analyzer as defined in claim 11, wherein said advancing means and said removing means together comprise a bifurcated element.

13. An analyzer as defined in claim 12, and further including means for supplying said test elements in a stack adjacent said reflectometer above said bifurcated element, said bifurcated element including a raised shoulder dimensioned to engage the bottommost one of said stack of test elements.

14. An analyzer as defined in claim 12, and further including means for reciprocating said bifurcated element between a starting position outside said reflectometer and said position within said reflectometer, and means for retaining a test element moved into said reflectometer while said bifurcated element is moved back to said starting position.