Apparatus for determining the reflectivity of the surface of a measured object

• US 4,311,393 A
• Filed: 03/05/1980
• Issued: 01/19/1982
• Est. Priority Date: 03/15/1979
• Status: Expired due to Term

• Current Assignee: Rolf Bartke
• Original Assignee: Rolf Bartke
• Inventors: Bartke, Rolf
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US06/127,462
• Time in Patent Office: 685 Days
• Field of Search: 356/407, 356/419, 356/448, 250/238
• US Class Current: 356/407
• CPC Class Codes: G01N 21/314 with comparison of measurements at specific and non-specific wavelengths dual wavelength spectrometry G01J3/427

Abstract

Apparatus for determining the reflectivity of the surface of a measured object, and, in particular, for determining properties of the measured object which are connected with its reflectivity. A light source emits light along a light path so that a wide-band light beam impinges on the surface of the measured object. The light reflected by the surface of the measured object goes through a pair of narrowband light filters which pass, respectively, light beams of different narrow bands of wave-lengths effective for evaluation by a photo-detection device. The photo-detection device comprises two separate photo-detectors each covered by one of the narrow-band filters. The filters are fixed in their positions relative to the photo-detectors and transmit their different wave-lengths of light to their respective photo-detectors.

Claims

1. Apparatus for determining the reflectivity of the surface of a measured object, in particular for determining properties of the measured object which are connected with its reflectivity, comprising

light source means for emitting light along a light path onto the surface of the measured object so that a wide-band light beam impinges onto said surface and is reflected therefrom,

photo-detection means for evaluation,

a concave mirror in the path of the light reflected from the surface of the measured object and focused on the measured object for collecting the reflected light and conveying it to and concentrating it on said photo-detection means,

a pair of narrow-band light filters which pass, respectively, light beams of different narrow bands of wavelengths effective for evaluation by the photo-detection means,

said photo-detection means comprising two separate photo-detectors immediately adjacent each other, side by side, each covered by one of said narrow-band filters, said filters being immediately adjacent each other, side by side, and directly over their respective photo-detectors fixed in their positions relative to said photo-detectors and transmitting their different wavelengths of light to their respective photo-detectors, and

cooling means connected to the photo-detectors and also to said narrow-band filters.

2. Apparatus in accordance with claim 1 having light-reflecting carrier means for supporting solid or liquid measured objects through which light can penetrate.

3. Apparatus in accordance with claim 1 or 2 having an electronic analysis means connected to the outputs of the two photo-detectors for comparing the output signals of the two photo-detectors, and supplying corresponding output signals.

4. Apparatus in accordance with claim 1 having a passive reflector as part of said light path from the light source to the surface of the measured object.

5. The apparatus of claim 1 wherein

said photo-detectors are disposed directly on said cooling means,

said photo-detectors, filters, and cooling device constituting said photo-detection means being an assembly covering only a small area adjacent to and including the focal point of said concave mirror,

whereby the full amount of reflected light can be utilized and the photo-detection device can be quite small and compact.