High reflectivity coated mirror producing 90 degree phase shift

• US 4,312,570 A
• Filed: 09/14/1979
• Issued: 01/26/1982
• Est. Priority Date: 09/14/1979
• Status: Expired due to Term

• Current Assignee: Rockwell International Corporation
• Original Assignee: Rockwell International Corporation
• Inventors: Southwell, William H.
• Primary Examiner(s): Lee, John D.
• Application Number:
  US06/075,431
• Time in Patent Office: 865 Days
• Field of Search: 350/164, 350/166, 350/288, 350/320, 350/152, 350/394, 350/395
• US Class Current: 359/485.03
• CPC Class Codes: G02B 27/288 Filters employing polarising elements, e.g. Lyot or Solc filters G02B5/3016 takes precedence
• CPC Class Codes: G02B 5/0858 the reflecting layers comprising a single metallic layer with one or more dielectric layers

Abstract

A high reflectivity mirror produces a substantially 90° phase shift between p and s plane polarization components of the reflected light by applying a plurality of super-imposed transparent layers on the reflective surface of a substrate. Adjacent layers are made of materials of substantially different indices of refraction. The thickness of substantially all of the layers is less than a quarter wavelength at the center frequency of the incident light and the thickness of the layers differ from each other in a predetermined manner to control and produce exactly 90° phase shift between the s and p polarization components while providing maximum reflectivity over a wide frequency band.

Claims

1. A high reflectivity mirror producing a substantially 90°

relative phase shift between the s and p plane polarization components of the reflected light, comprising;

a substrate; and

a plurality of superimposed transparent layers on the substrate, adjacent layers being made of materials of substantially different indices of refraction, the thicknesses of the layers differing from each other in a predetermined manner to produce a substantially 90°

phase shift in the s and p components of the reflected light for a broadband range of wavelenghts, wherein the physical thickness of each layer may be determined from the following equation;

##EQU2## where λ

_o is the wavelength in vacuum of the incident light, n_i is the index of refraction of the layer material, θ

_o is the angle of incidence, and f_i is the fraction of the nominal quarterwave thickness which is optimized to provide maximum reflectivity with the desired 90°

phase shift.

2. Apparatus of claim 1 wherein the thickness of substantially all of the layers is less than a quarter wavelength of the incident light.

3. Apparatus of claim 1 wherein the substrate is a metal and the layers are dielectric.

4. Apparatus of claim 1 wherein the number of layers is at least four.

5. An optical phase retarding device for providing relative phase shift between the polarized components of light for a broadband range of wavelengths, comprising:

a substrate; and

a number of superimposed layers of dielectric materials of alternately high and low index of refraction on said substrate, the layers having different thicknesses from each other, wherein the physical thickness (t_i) of each layer may be determined from the following equation;

##EQU3## where λ

_o is the wavelength in vacuum of the incident light, n_i is the index of refraction of the layer material, θ

_o is the angle of incidence, and f_i is the fraction of the nominal quarterwave thickness which is optimized to provide maximum reflectivity with the desired 90°

phase shift.

6. Apparatus of claim 5 wherein the substrate is silver and the materials in each pair of layers are ZnS and Ge.

7. Apparatus of claim 5 wherein the substrate is silver and the materials in each pair of layers are ZnS and ThF₄.