Capacitance probe for high resistance materials

• US 4,314,478 A
• Filed: 11/16/1979
• Issued: 02/09/1982
• Est. Priority Date: 11/16/1979
• Status: Expired due to Term

• Current Assignee: Robertshaw Controls Company (Schneider Electric SE)
• Original Assignee: Robertshaw Controls Company (Schneider Electric SE)
• Inventors: Beaman, Norman V.
• Primary Examiner(s): Yasich, Daniel M.
• Application Number:
  US06/094,869
• Time in Patent Office: 816 Days
• Field of Search: 73/304 C, 361/278, 324/61 P
• US Class Current: 73/304.00C
• CPC Class Codes: G01F 23/268 mounting arrangements of probes

Abstract

There is disclosed a capacitance probe for determining the level of high electrical resistance material in a vessel. The probe comprises at least two parallel, large surface area blades which are supported from a mounting plate and spaced apart to define a capacitance path. One blade is attached to an insulator body which is attached to the mounting plate while the other blade is directly attached to the mounting plate in electrical continuity therewith. The insulator body is a ceramic sleeve having a length sufficient to prevent shunting of the capacitance path. The probe is particularly intended for detection of level of fly ash and the like in a receiver vessel.

Claims

1. A capacitance probe for location in a vessel in the path of falling, substantially electrically non-conductive particulate matter to detect collection of such particulate matter to a predetermined level in the vessel, said probe comprising:

an electrically conductive mounting member;

at least one elongated, flat sided capacitor blade, said blade being electrically grounded and cantilever mounted at one end to said member;

an elongated, flat sided capacitor sensor element arranged in parallel, confronting, spaced apart relation to said blade;

means cantilever mounting one end of said sensor element in electrically insulative relationship to said member; and

mounting means operative to mount said member to said vessel and horizontally project said blade and said sensor element within said vessel at a predetermined level, with the flat sides thereof vertically oriented whereby said particulate matter can fall freely past said blade and said sensor element without collecting therebetween.

2. A capacitance probe according to claim 1 and including a second said blade located oppositely of the first recited blade and in parallel, confronting, spaced apart relation to said sensor element.

3. A capacitance probe according to claim 1 and including tensioning means coupled to said sensor element and operative to axially urge said sensor element toward said member thereby to strengthen said cantilever mounting.

4. A capacitance probe according to claim 1 wherein all of said sensor element located outwardly of said non-conductive path is free of connection to said blade.

5. A capacitance probe according to claim 1 wherein the confronting portions of said sensor element and said blade located outwardly of said non-conductive path are coextensive and rectangularly configured.

6. A capacitance probe according to claim 1 wherein all of the confronting portions of said sensor element and said blade located outwardly of said non-conductive path are electrically conductive.