Interferometer apparatus for the direct measurement of wavelength and frequency

• US 4,319,843 A
• Filed: 02/25/1980
• Issued: 03/16/1982
• Est. Priority Date: 02/25/1980
• Status: Expired due to Term

• Current Assignee: Burleigh Instruments, Inc. (11172239 Canada, Inc.)
• Original Assignee: Burleigh Instruments, Inc. (11172239 Canada, Inc.)
• Inventors: Gornall, William S.
• Primary Examiner(s): Evans, F. L.
• Application Number:
  US06/124,481
• Time in Patent Office: 750 Days
• Field of Search: 356/346, 356/349, 356/363
• US Class Current: 356/455
• CPC Class Codes: G01J 9/0246 Measuring optical wavelength

Abstract

A dual beam interferometer in which the motion of a mirror produces optical path variation resulting in fringes at photodetectors provides direct, selectable measurement of wavelength and frequency of an input laser beam with high accuracy and over a large frequency and wavelength range without the need for correction due to differences in the index of refraction over the range.

Claims

1. Apparatus for making interferometic measurements of an input laser beam through the use of a reference laser beam which comprises a dual beam moving mirror interferometer having an entrance, a beamsplitter, a reference beam detector, an input beam detector, a pair of conjointly reciprocally movable folded mirrors and a pair of stationary mirrors which define first and second parallel paths through said beamsplitter along which said reference beam passes in opposite directions through said entrance to provide a tracer beam for alignment of said input beam to pass through said entrance into said interferometer along said second path in the opposite direction to said reference beam, said beamsplitter and said movable folded mirrors also defining third and fourth paths of varying lengths along which said reference beam passes to said reference beam detector and along which said input beam passes to said input beam detector respectively, means connected to said reference beam detector and to said input beam detector for respectively providing first and second trains of pulses when interference fringes are produced at said detectors while said folded mirrors reciprocate, and means for translating the numbers of pulses in said first and second trains into an output directly representing the wavelength or frequency of said input beam.

2. The apparatus as set forth in claim 1 further comprising a vacuum chamber, said interferometer being disposed in said chamber.

3. The apparatus as set forth in claim 2 wherein said beamsplitter and said stationary mirrors define three arms of said third and fourth paths terminating at said beamsplitter and said stationary mirrors, first and second of said three arms which terminate at said beamsplitter being perpendicular to each other, the third of said three arms between said stationary mirrors being disposed at internal angles of 45°

to said first and second arms at the opposite ends thereof.

4. The apparatus as set forth in claim 3 further comprising a carriage reciprocally movable linearly along said third arm, said folded mirrors each being a corner reflector and being mounted on said carriage with the reflecting surfaces thereof facing in opposite directions toward different ones of said stationary mirrors.

5. The apparatus as set forth in claim 1 wherein said translating means comprises first and second counters, means for presetting said counters to count a number of said pulses which correspond to the wavelength of said reference beam, means for applying said second pulse trains to the first counter and, until said preset number of pulses is counted therein, for applying said first pulse train to said second counter to obtain a count in second counter directly correspondent to the wavelength of said input beam.

6. The apparatus as set forth in claim 1 wherein in said translating means comprising first and second counters, means for presetting the first of said counters to count the number of pulses which correspond to the frequency of said reference beam, means for applying said first pulse train to said first counter and, until said preset number of pulses is counted therein, for applying said second pulse train to said second counter to obtain a count directly corresponding to the frequency of said input beam in said second counter.

7. The apparatus as set forth in claims 5 or 6 wherein said number to which said first counter is set is equal to the product of said wavelength or frequency of said reference beam, or a multiple or submultiple thereof, and a power of 10.

8. The apparatus as set forth in claims 5 or 6 further comprising means for displaying the count registered in said second counter.