LSI Circuit logic structure including data compression circuitry

• US 4,320,509 A
• Filed: 10/19/1979
• Issued: 03/16/1982
• Est. Priority Date: 10/19/1979
• Status: Expired due to Term

• Current Assignee: Bell Telephone Laboratories, Inc. (Nokia Corporation)
• Original Assignee: Bell Telephone Laboratories, Inc. (Nokia Corporation)
• Inventors: Davidson, Robert P.
• Primary Examiner(s): Malzahn, David H.
• Application Number:
  US06/086,299
• Time in Patent Office: 879 Days
• Field of Search: 371/25, 371/15, 371/16, 371/18
• US Class Current: 714/732
• CPC Class Codes: G06F 11/27 Built-in tests

Abstract

A logic structure for an LSI digital circuit includes data compression circuitry for deriving a signature word from the data on a multiplicity of internal nodes which are not directly accessible from the terminals of the circuit. The signature word provides error information concerning the data on the internal nodes which are not otherwise available for testing purposes. The addition of data compression circuitry facilitates the testing of LSI digital circuits and can be complemented with minimal overhead chip area.

Claims

1. An LSI circuit logic structure for improved testability comprising a plurality of terminals (104), a plurality of functional parts (101, 105, 106, 108, 109, 110, 111) interconnected at a multiplicity of internal nodes (113, 114, 115, 116, 117, 118) and clock generating circuit means (108) for providing a sequence of clock pulses;

characterized in that there are included spatial data compression means comprising combinational parity generating circuit means (201, 501, 601, 602,

     603) coupled to selected ones of the internal nodes and responsive to signals on the selected ones of the internal nodes for deriving a parity signal, temporal data compression means comprising sequential signature generating circuit means (204, 503,

     608) responsive to the sequence of clock pulses for sampling the parity signal over a fixed interval of time and for generating and storing a signature word of a predetermined length, and output means (211, 505,

     609) for transferring the signature word from the signature generating circuit means to selected ones of the terminals.

2. An LSI circuit logic structure as recited in claim 1 further characterized in that the sequential signature generating circuit means comprise a flip-flop (206) providing an output signal, a modulo-2 adder (205) connected to receive the output signal from the flip-flop and the parity signal and to provide a sum signal to the flip-flop, the flip-flop having a clock input (208) connected to receive the sequence of clock pulses.

3. An LSI circuit logic structure as recited in claim 2 further characterized in that the combinational parity generating circuit means comprise an EXCLUSIVE-OR tree circuit (300) and the modulo-2 adder comprise an EXCLUSIVE-OR gate (205).

4. An LSI circuit logic structure as recited in claim 1 further characterized in that the sequential signature generating circuit means comprise a shift register circuit (400, 503, 608) having a predetermined number of stages including a first (401) and a last (405) stage, each stage providing an output signal, a modulo-2 adder (406) connected to receive the output signals from selected ones of the stages and the parity signal and to provide a sum signal to the first stage, the shift register circuit having a clock input (412) connected to receive the sequence of clock pulses.

5. An LSI circuit logic structure as recited in claim 4 further characterized in that the selection of the stages of the shift register circuit which are connected to the modulo-2 adder provides a circuit which generates a sequence of maximum length.

6. An LSI circuit logic structure for improved testability comprising a plurality of terminals (104), a plurality of functional parts (101, 105, 106, 108, 109, 110, 111) interconnected at a multiplicity of internal nodes (113, 114, 115, 116, 117, 118) not directly connected to any of the terminals, clock generating means (108) for providing a sequence of clock pulses;

characterized in that there are included spatial data compression means comprising two or more combinational parity generating circuits (601, 602,

     603) each coupled to respective ones of the internal nodes and each responsive to signals on the respective ones of the internal nodes for deriving a parity signal;

temporal data compression means comprising a shift register circuit (608) having a number of stages including a first (610) and a last (613) stage, the number of stages being greater than the number of parity generating circuits, the shift register circuit having a clock input for receiving the sequence of clock pulses and being responsive thereto for sampling each parity signal over a fixed interval of time and for generating and storing a signature word having a length equal to the number of stages; and

output means (609) for transferring the signature word from the shift register circuit to selected ones of the terminals.

7. An LSI circuit logic structure as recited in claim 6 further characterized in that each stage of the shift register circuit provides an output signal and there are included a first modulo-2 adder (614) connected to receive the output signals from selected ones of the stages and to provide a sum signal to the first stage, two or more additional modulo-2 adders (615, 616, 617) each associated with a respective one of the stages except the last stage and connected to receive the output signal from the associated stage and the parity signal from a respective one of the parity generating circuits and to provide a summation signal to a stage immediately following the associated stage.

8. An LSI circuit logic structure as recited in claim 7 further characterized in that the selection of the stages of the shift register circuit which are connected to the first modulo-2 adder provides a circuit which generates a sequence of maximum length.

9. An LSI circuit logic structure as recited in claim 8 further characterized in that the combinational parity generating circuits comprise EXCLUSIVE-OR tree circuits and the first and additional modulo-2 adders in the shift register circuit comprise EXCLUSIVE-OR gates.

10. A microprocessor logic structure for improved testability comprising a plurality of terminals;

a plurality of functional parts including an instruction-register (105) for receiving and storing at least a portion of an instruction, control logic circuitry (106) for decoding the contents of the instruction register and for generating a sequence of control signal patterns on a plurality of control lines (107), the control signal patterns for governing the function of each functional part in the execution of a processor operation specified by the instruction;

an internal data bus (102) for carrying instructions, addresses and data;

I/O circuitry (101) for controlling the bidirectional transfer of instructions, addresses and data between the internal data bus and particular ones of the terminals (104);

ALU circuitry (110) for performing arithmetic and logic operations; and

clock generating circuitry (108) for providing one or more sequences of clock pulses for controlling the timing of the sequence of control signals,

characterized in that there are included spatial data compression means comprising combinational parity generating circuit means (201, 501, 601, 602,

     603) coupled to at least the plurality of control lines and responsive to the sequence of control signal patterns for deriving one or more corresponding sequences of parity signals, temporal data compression means comprising sequential signature generating circuit means (204, 503,

     608) responsive to a specific one of the one or more sequences of clock pulses for sampling the one or more sequences of parity signals over a fixed interval of time and for generating and storing a signature word of a predetermined length, and output means (211, 505,

     609) for transferring the signature word from the sequential signature generating circuit means to selected ones of the terminals.