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Chemically sensitive JFET transducer devices utilizing a blocking interface

  • US 4,322,680 A
  • Filed: 03/03/1980
  • Issued: 03/30/1982
  • Est. Priority Date: 03/03/1980
  • Status: Expired due to Term
First Claim
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1. A chemical sensitive junction field-effect transistor transducer for detecting chemical properties of substances to which said transducer is exposed comprising:

  • (a) a substrate material;

    (b) a semiconductor layer having a doping polarity located at an upper surface of said substrate material, said doping polarity enabling an electrical current to flow through said layer;

    (c) means for electrically connecting spaced apart regions of said semiconductor layer to an external voltage source, thereby allowing an electrical current to flow from said voltage source to a first of said spaced apart regions through a first of said electrical connecting means, through said semiconductor layer to a second of said spaced apart regions, and from said second spaced apart region through a second of said electrical connecting means back to said external voltage source;

    (d) a blocking interface overlying that portion of said semiconductor layer that lies between said spaced apart regions and through which said electrical current flows, said blocking interface being adapted to interact with said substance so as to generate an electrical potential at said interface whose strength is a measure of selected chemical properties of said substance, said blocking interface having no insulating layer as a part thereof;

    (e) a reference electrode connected in circuit relationship with said semiconductor layer through a second external voltage source such that a potential is created and added to the electric potential generated at said blocking interface, thus creating a resultant electric field that affects the conductivity of said semiconductor layer as a measure of the chemical properties of said substances by modulating the thickness of a depletion layer in the upper surface of said semiconductor layer which is void of free charge carriers, said depletion layer having a thickness related to said resultant electric field.

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