Display device for non-destructive testing apparatus

• US 4,333,346 A
• Filed: 10/21/1980
• Issued: 06/08/1982
• Est. Priority Date: 11/09/1979
• Status: Expired due to Term

• Current Assignee: Krautkramer-Branson Incorporated
• Original Assignee: Krautkramer-Branson Incorporated
• Inventors: Renzel, Peter
• Primary Examiner(s): Ciarlante, Anthony V.
• Application Number:
  US06/199,246
• Time in Patent Office: 595 Days
• Field of Search: 73/606, 73/607, 73/611, 73/620, 328/185, 340/748
• US Class Current: 73/606
• CPC Class Codes: G01N 29/0609 Display arrangements, e.g. colour displays indicating or recording in connection with measuring in general G01D
• CPC Class Codes: G01N 29/0627 Cathode-ray tube displays in general G01R13/20
• CPC Class Codes: G01S 7/52004 Means for monitoring or calibrating short-range imaging G01S7/5205
• CPC Class Codes: H03K 4/50 in which a sawtooth voltage is produced across a capacitor

Abstract

Echo related signals, commensurate with the results of the non-destructive testing of an object with a beam of ultrasonic energy, are presented along with or alternately with textual information on the screen of a cathode ray tube. The textual information is derived from data permanently stored in a memory of a computer and combined with variable data also stored in a memory of the computer.

Claims

1. Apparatus for use in the display of the results of nondestructive testing with a beam of ultrasonic energy comprising:

a cathode ray tube;

means for applying signals commensurate with echoes received from within a workpiece to a first pair of deflection plates of said cathode ray tube;

adjustable sweep voltage generator means, said sweep voltage generator means providing an output voltage having a sawtooth wave form for the time-dependent deflection of the electron beam of said cathode ray tube, said sawtooth voltage having a defined amplitude range and a variable slope;

means for applying said sweep voltage output voltage to the second pair of deflection plates of said cathode ray tube;

3. The apparatus of claim 1 wherein said writing circuit means comprises:

a first intermediate memory for storing line height information derived from said microprocessor;

a digital to analog convertor connected to said first intermediate memory and providing a deflection voltage commensurate with the contents of said first intermediate memory;

a second intermediate memory for storing electron beam intensity information derived from said microprocessor;

a shift register connected to receive output signals commensurate with the information in said second intermediate memory;

means connected to the output of said shift register for generating a pair of beam intensity signal levels in response to an output provided by said shift register;

means for applying said clock pulses to said shift register whereby the content of said shift register will be serially applied to said intensity control generating means.

5. The apparatus of claim 3 wherein said applying means alternately connects said writing circuit means generated deflection signals and said sweep voltage generator produced sawtooth voltage to said cathode ray tube second deflection plates and synchronously connects said writing circuit means intensity signals and a preselected constant intensity control signal to said cathode ray tube intensity control whereby the echo related signals and information entered by said data entry device may be selectively displayed.

7. The apparatus of claim 5, wherein the keys on said data entry means keyboard are arranged in groups as follows:

(a) a first group including a key each of the functions presentation of the echo related signal;

presentation of text;

a simultaneous display of echo related signals and text;

(b) a second group including a key for each of the functions presenting data related to examination region;

presenting data related to the parameters of the testing head;

presenting data related to the parameters of the material comprising the test object;

presenting data related to the zone of interest within the examination region; and

(c) a third group for numerical data entry.

9. The apparatus of claim 7 including additional keys for positioning a cursor in a desired place on the cathode ray tube screen to thereby select the data to be displayed or changed.

2. data entry means for serially generating signals commensurate with a desired imaging region in the test object and with those parameters of the ultrasound beam generator and test object which effect the transmission time of the ultrasound beam from the ultrasound transducer to the onset of the imaging region;

microprocessor means, said microprocessor means including memory means for storing the information entered by means of said data entry means, said microprocessor means further comprising a computing circuit for computing a desired sawtooth voltage waveform slope commensurate with the desired imaging region and a trigger delay time commensurate with the travel time between emission of the ultrasonic signal and said signal arriving at the onset of the desired imaging region, said microprocessor means further storing information commensurate with messages corresponding to computed information and information provided from said data entry means;

writing circuit means connected to said microprocessor means memory means, said writing circuit means providing a first output signal commensurate with deflection and a second output signal commensurate with cathode ray tube electron beam intensity, said first and second output signals being commensurate with alpha-numeric information stored in said microprocessor means memory information stored in said microprocessor means memory means; and

means for selectively and simultaneously applying said writing circuit means intensity related signals to said cathode ray tube to gate the electron beam and for applying said deflection related signals to said cathode ray tube first deflection plates, whereby alpha-numeric information may be displayed in addition to said echo related signals.

4. The apparatus of claim 2 wherein said writing circuit means further comprises:

decoder means, said decoder means controlling the transfer of information from said microprocessor means memory means into said first and second intermediate memories in response to control signals received from said microprocessor means.

6. Ultrasonic test apparatus comprising:

a cathode ray tube;

a testing head for radiating an ultrasonic signal into a test object and for receiving echo signals reflected from inhomogenities within the test object, said testing head including an ultrasound transducer which converts said echo signals into electrical signals;

means for applying said echo signals to the vertical deflection plates of said cathode ray tube;

sweep voltage generator means for producing a sawtooth voltage for application to the horizontal deflection plates of said cathode ray tube, said sawtooth voltage causing the time-dependent deflection of the electron beam in said cathode ray tube, said sawtooth voltage having a defined amplitude range and a slope which defines the examination region within the test object;

data entry means, said data entry means including a keyboard having a plurality of keys arranged in functional groups for the input of binary coded data commensurate with a desired examination region within the test object and those parameters of the testing head and test object which affect the transmission time of the ultrasonic signal produced in said testing head;

microprocessor means, said microprocessor means including memory means for storing the data entered via said data entry means, said microprocessor means further comprising computing means for computing the desired sawtooth voltage slope and a trigger delay time commensurate with the time required for the generated ultrasonic signal to travel to the beginning of the examination region, said microprocessor further computing the onset time and width of a zone of interest within the examination region, said computed values being stored in said memory means; and

writing circuit means for generating output signals commensurate with the vertical deflection and electron beam intensity of said cathode ray tube commensurate with the display of the parameter values inputted by said data entry means and stored in said microprocessor means memory means; and

means for selectively applying either the output signals from said writing circuit means or the echo related signals and sweep voltage generator means produced voltage to said cathode ray tube.

8. The apparatus of claim 6 wherein the text presentation permanently comprises a message stored in said microprocessor means memory means and changeable data inputted by said data entry means.